초록 ▼

A system and method for analyzing a design using predetermined analysis models are presented. The method may be carried out on an automated design system including an integration server in communication with a plurality of subprocess servers each configured for conducting a subprocess analysis using

A system and method for analyzing a design using predetermined analysis models are presented. The method may be carried out on an automated design system including an integration server in communication with a plurality of subprocess servers each configured for conducting a subprocess analysis using one of the analysis models. The method comprises receiving at the integration server an analysis request including a set of desired performance parameters and constructing a set of design characteristics for meeting the desired performance parameters. The method further includes determining a set of design performance results associated with the set of design characteristics using the analysis models of the subprocess servers. The step of determining may include passing input information from the integration server to the plurality of subprocess servers, at least a portion of the input information being respectively processed to a format usable in the analysis model of each of the plurality of subprocess servers, passing output information from each of the plurality of subprocess servers to the integration server and using the output information to determine the design performance results.

대표청구항 ▼

A system and method for analyzing a design using predetermined analysis models are presented. The method may be carried out on an automated design system including an integration server in communication with a plurality of subprocess servers each configured for conducting a subprocess analysis using

A system and method for analyzing a design using predetermined analysis models are presented. The method may be carried out on an automated design system including an integration server in communication with a plurality of subprocess servers each configured for conducting a subprocess analysis using one of the analysis models. The method comprises receiving at the integration server an analysis request including a set of desired performance parameters and constructing a set of design characteristics for meeting the desired performance parameters. The method further includes determining a set of design performance results associated with the set of design characteristics using the analysis models of the subprocess servers. The step of determining may include passing input information from the integration server to the plurality of subprocess servers, at least a portion of the input information being respectively processed to a format usable in the analysis model of each of the plurality of subprocess servers, passing output information from each of the plurality of subprocess servers to the integration server and using the output information to determine the design performance results. tandardized design rule information distributing means, wherein said system further comprises an evaluation information storage means for storing measurement data extraction circuit design information indicating design conditions of a measurement data extraction circuit for extracting measurement data of actual operating characteristics from said semiconductor device and evaluation data calculation method information indicating a method of calculation of evaluation data containing tabulated extracted measurement data, said production process standardization apparatus further has an evaluation information distributing means for distributing said measurement data extraction circuit design information stored in said evaluation information storage means and said evaluation data calculation method information, and said system further comprises a manufacturer terminal having an evaluation information receiving means for receiving said measurement data extraction circuit design information and said evaluation data calculation method information distributed by said evaluation information distributing means and an evaluation data calculating means for calculating said evaluation data from said measurement data of said semiconductor device extracted by said measurement data extraction circuit indicated in said received measurement data extraction circuit design information following said evaluation data calculation method information received by said evaluation information receiving means and, wherein said measurement data extraction circuit extracts said measurement data containing of the characteristics of the semiconductor device converted to numerical values for each item of evaluation of characteristics and said measurement data extraction circuit converts the characteristics of said semiconductor device to numerical values by replacing the characteristics of said semiconductor device by counter values. 2. A production process standardization system as set forth in claim 1, wherein said measurement data extraction circuit comprises a circuit standardized in accordance with said standardized design rules, and said method of calculation of said evaluation data comprises a method of calculation tabulating said measurement data in a standardized format. 3. A production process standardization system as set forth in claim 1, wherein said system further comprises a standard value data storage means for commonly managing and storing standard value data of said evaluation data, said production process standardization apparatus further has a standard value data distributing means for distributing said standard value data stored in said standard value data storage means, said manufacturer terminal further has a standard value data receiving means for receiving said standard value data distributed by said standard value distributing means, and said evaluation data calculation method comprises a method of calculating a statistical average of said measurement data and using the calculated statistical average and said standard value data received by said standard value data receiving means to calculate a deviation value of said measurement data as said evaluation data. 4. A production process standardization system as set forth in claim 1, wherein said manufacturer terminal further has an evaluation data transmitting means for transmitting said evaluation data calculated by said evaluation data calculating means, said production process standardization apparatus further has an evaluation data receiving means for receiving said evaluation data transmitted by said evaluation data transmitting means, and said system further has an evaluation data storage means for storing said evaluation data received by said evaluation data receiving means. 5. A production process standardization system as set forth in claim 4, wherein said production process standardization apparatus further has an evaluation data distributin g means for distributing said evaluation data stored in said evaluation data storage means, and said designer terminal further has an evaluation data receiving means for receiving said evaluation data distributed by said evaluation data distributing means. 6. A production process standardization system as set forth in claim 1, wherein said standardized design rule information has two-dimensional design rule information indicating a circuit layout of said semiconductor device and circuit characteristic parameter information indicating a model of characteristics of said circuit.7. A production process standardization system as set forth in claim 1, wherein said system further has a design asset data storage means for storing as design asset data the design data of said semiconductor device designed in accordance with said standardized design rules, said production process standardization apparatus further has a design asset data distributing means for distributing said design asset data stored in said design asset data storage means, and said designer terminal further has a design asset data receiving means for receiving said design asset data distributed by said design asset data distributing means. 8. A production process standardization system as set forth in claim 7, wherein said designer terminal further has a design asset data inputting means for inputting said design asset data and design asset data transmitting means for transmitting said design asset data input by said design asset data inputting means, said production process standardization apparatus further has a design asset data tabulating means for receiving said design asset data transmitted by said design asset data transmitting means, and said design asset data storage means stores said design asset data received by said design asset data tabulating means. 9. A production process standardization method for standardizing the production process of a semiconductor device comprising the steps of: commonly managing standardized design rules including standardized design conditions of said semiconductor device; having a plurality of designers design said semiconductor device following said commonly managed standardized design rules; commonly managing design conditions of a measurement data extraction circuit for extracting measurement data of actual operating characteristics from said semiconductor device and a method of calculation of evaluation data containing tabulated extracted measurement data; and having a plurality of manufacturers use said measurement data extraction circuit formed in accordance with said commonly managed design conditions of said measurement data extraction circuit to extract said measurement data of said semiconductor device and calculate said evaluation data from said extracted measurement data following the commonly managed method of calculation of said evaluation data. 10. A production process standardization method as set forth in claim 9, wherein said method further comprises a step of commonly managing standard value data of said evaluation data and said evaluation data calculation method comprises a method for calculating a statistical average of said measurement data and using the calculated statistical average and said standard value data of said commonly managed evaluation data to calculate a deviation value of said measurement data as said evaluation data. 11. A production process standardization method as set forth in claim 9, wherein said measurement data calculated by said plurality of manufacturers is commonly managed, and said commonly managed evaluation data can be referred to by said designer. 12. A production process standardization method as set forth in claim 9, wherein said measurement data extraction circuit extracts measurement data containing characteristics of said semiconductor device converted to numerical values for each item of evaluation of characteristics.13. A produc