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Method and apparatus for scheduling based on state estimation uncertainties 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-019/00
  • G05B-013/04
출원번호 US-0210753 (2002-07-31)
발명자 / 주소
  • Pasadyn, Alexander J.
출원인 / 주소
  • Advances Micro Devices, Inc.
대리인 / 주소
    Williams, Morgan & Amerson
인용정보 피인용 횟수 : 59  인용 특허 : 14

초록

A method for scheduling activities in a manufacturing system includes defining a plurality of observed states associated with the manufacturing system. State estimates are generated for the observed states. Uncertainty values for the state estimates are generated. A plurality of candidate schedules

대표청구항

A method for scheduling activities in a manufacturing system includes defining a plurality of observed states associated with the manufacturing system. State estimates are generated for the observed states. Uncertainty values for the state estimates are generated. A plurality of candidate schedules

이 특허에 인용된 특허 (14)

  1. Clark Steven J. ; Parunak H. Van Dyke, Density-based emergent scheduling system.
  2. Schleiss, Trevor D.; Nixon, Mark; Blevins, Terrence Lynn; Brase, Todd B.; Ganesamoorthi, Suresh, Diagnostic expert in a process control system.
  3. Bartusiak Raymond Donald (Houston TX) Fontaine Robert William (Houston TX), Feedback method for controlling non-linear processes.
  4. Yueh William, In-situ endpoint control apparatus for semiconductor wafer polishing process.
  5. Puthenpura Sarat C. (Jackson NJ) Sinha Lakshman P. (East Brunswick NJ), Kalman filter-based optimizer and method and optimizing.
  6. Gough ; Jr. William Albert Gordon (Aldergrove CAX), Method and apparatus for adaptive control.
  7. Uhlmann Jeffrey K., Method and apparatus for fusing mean and covariance estimates.
  8. Jevtic, Dusan; Pool, Mark; Sunkara, Raja, Method and apparatus for managing scheduling in a multiple cluster tool.
  9. Hayner David A., Method and control system for changing the state of a plant.
  10. Patel, Nital S.; Jenkins, Steven T., Method and system for dispatching semiconductor lots to manufacturing equipment for fabrication.
  11. Lange Antti Aarne (Liisankatu 15 A 10 Helsinki 17 FIX 00170 ), Method for fast Kalman filtering in large dynamic system.
  12. Shah Sunil C. ; Pandey Pradeep, Method for real-time nonlinear system state estimation and control.
  13. Tsutsui Hiroaki,JPX ; Kurosaki Atsushi,JPX ; Kamimura Kazuyuki,JPX ; Matsuba Tadahiko,JPX, State estimating apparatus.
  14. Tarumi Hiroyuki,JPX, Workflow system for rearrangement of a workflow according to the progress of a work and its workflow management method.

이 특허를 인용한 특허 (59)

  1. Ydstie, Birger Erik, Apparatuses, systems, and methods utilizing adaptive control.
  2. Pannese, Patrick D., Applications of neural networks.
  3. Krabel,Markus; Kalthoff,Wolfgang; Rohloff,Frank, Central master data management.
  4. Kalthoff,Wolfgang; Vogt,Thomas; Huber,Guenter; Hoeckele,Guido; Koch,Beate, Change management.
  5. Kalthoff, Wolfgang; Huber, Guenter; Hoeckele, Guido; Vogt, Thomas; Koch, Beate, Collaborative design process.
  6. Kalthoff,Wolfgang; Rohloff,Frank; Krabel,Markus, Collaborative master data management system for identifying similar objects including identical and non-identical attributes.
  7. Rozenson, Aleksandr, Computational architecture and method for a time-varying control system.
  8. Fuxman, Adrian Matias; Pachner, Daniel, Condition-based powertrain control system.
  9. Stewart, Greg; Pekar, Jaroslav; Pachner, Daniel, Coordinated engine and emissions control system.
  10. Chong, Robert J.; Miller, Michael L.; Pasadyn, Alexander J.; Green, Eric O., Determining a next tool state based on fault detection information.
  11. Krabel, Markus; Kalthoff, Wolfgang; Rohloff, Frank, Distributing data in master data management systems.
  12. Moser, Gerd; Vogt, Thomas; Berger, Arthur; Rieken, Gregor; Steuernagel, Ralf, Dynamic access of data.
  13. Pachner, Daniel; Pekar, Jaroslav, Engine and aftertreatment optimization system.
  14. Yadav, Puneet; Bailey, III, Andrew D., Expert knowledge methods and systems for data analysis.
  15. Kemmoku,Hiromi, Exposure method and apparatus.
  16. Kalthoff, Wolfgang; Vogt, Thomas; Huber, Guenter; Hoeckele, Guido, External evaluation processes.
  17. Kalthoff, Wolfgang; Vogt, Thomas; Huber, Guenter; Hoeckele, Guido, External evaluation processes.
  18. Kalthoff,Wolfgang; Vogt,Thomas; Huber,Guenter; Hoeckele,Guido, External evaluation processes.
  19. Pachner, Daniel, Identification approach for internal combustion engine mean value models.
  20. Moser, Gerd; Vogt, Thomas; Berger, Arthur; Rieken, Gregor; Steuernagel, Ralf, Master data access.
  21. Kalthoff,Wolfgang; Rohloff,Frank, Master data quality.
  22. Good,Richard P.; Jackson,Timothy L.; Cusson,Brian K., Method and apparatus for adaptive sampling based on process covariance.
  23. Bode, Christopher A.; Lensing, Kevin R., Method and apparatus for integrating multiple sample plans.
  24. Miller, Michael L.; Bode, Christopher A., Method and apparatus for predicting device electrical parameters during fabrication.
  25. Chou, Chien-Hung; Tai, Wen-Tin, Method and machine for examining wafers.
  26. Stirton, James Broc; Holfeld, Andre, Method and system for advanced process control using a combination of weighted relative bias values.
  27. Malig, Hans-Juergen; Stirton, James Broc, Method and system for advanced process control using measurement uncertainty as control input.
  28. Brown,Peter G., Method and system for modeling a batch manufacturing facility.
  29. Stirton, James Broc; Good, Richard, Method and system for randomizing wafers in a complex process line.
  30. Brown,Peter G., Method and system for simulating and modeling a batch manufacturing facility.
  31. Patel, Nital S.; Carson, Steven L., Method for consistent updates to automated process control (APC) models with partitioning along multiple components.
  32. Khayrallah, Ali S., Method for covariance matrix update.
  33. Lefebvre,Wesley Curt; Kohn,Daniel W., Method for implementing indirect controller.
  34. Lefebvre,Wesley Curt; Kohn,Daniel W., Method for implementing indirect controller.
  35. Nishinohara, Kazumi; Nakamura, Mitsutoshi; Suguro, Kyoichi; Shirai, Koji; Taguchi, Ichiro, Method for optimizing an industrial product, system for optimizing an industrial product and method for manufacturing an industrial product.
  36. Giebels, Mark Mathieu Theodorus, Method for updating manufacturing planning data for a production process.
  37. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  38. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  39. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  40. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  41. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  42. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  43. Pannese, Patrick D.; Kavathekar, Vinaya; van der Meulen, Peter, Methods and systems for controlling a semiconductor fabrication process.
  44. Shan, Jerry Z., Methods and systems for forecasting with model-based PDF estimates.
  45. Benosman, Mouhacine; Di Cairano, Stefano, Model predictive control with uncertainties.
  46. Sun, Cheng-I; Fun, Yu Pen; Lo, Yi-Chuan; Huang, Wei-Hsuang; Lin, Hsiang-Ming, Multivariate RBR tool aging adjuster.
  47. Middlebrooks,Scott A., Observability in metrology measurements.
  48. Mos, Everhardus Cornelis; Dusa, Mircea; Finders, Jozef Maria; De Mol, Christianus Gerardus Maria; Middlebrooks, Scott Anderson; Wangli, Dongzi, Optimization method and a lithographic cell.
  49. Taylor, Mark P.; Chen, John J. J., Process control of an industrial plant.
  50. Yano, Masaru; Wang, Pin-Yao, Semiconductor device, method of manufacturing the same and generation method of unique information.
  51. van der Meulen, Peter, Semiconductor manufacturing systems.
  52. Thampy, Sajjit; Ferrante, Daniel; Awadallah, Amr, Simulated bucket testing.
  53. Mazzarone, Marco; Raviola, Alessandro; Reggio, Elena; Risso, Federico, System and method for controlling a manufacturing process.
  54. Legendre, Emmanuel; Tabanou, Jacques R.; Seydoux, Jean; Ito, Koji; Legendre, Fabienne; Kutiev, Georgi, System and method for displaying data associated with subsurface reservoirs.
  55. Mangino, Kimberley Marie; Bufi, Corey Nicholas; Dingman, Brian Nathan; Gambhir, Snehil, System and method for simulating a discrete event process using business system data.
  56. Mangino, Kimberley Marie; Bufi, Corey Nicholas; Dingman, Brian Nathan; Gambhir, Snehil, System and method for simulating a discrete event process using business system data.
  57. Wobbe, Matthias; Wobbe, Christoph; Kirchner, Uwe; Kienle, Walter G., System and method of master data management.
  58. Wobbe, Matthias; Wobbe, Christoph; Kirchner, Uwe; Kienle, Walter G., System and method of master data management using RFID technology.
  59. Markham, Thomas R., Vehicle security module system.
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