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A combination includes a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding the high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back. The feedthrough element inclu

A combination includes a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding the high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back. The feedthrough element includes at least one guiding element (6), into which the electric high-frequency signal is to be fed at an inlet point (10), and which transmits at an outlet point (17) the electric high-frequency signal to a probe (7) adapted to guide the high-frequency signal, a one-part or multipart mechanical carrier element (1), and a one-part or multipart insulation (11, 12) present between the carrier element (1) and the guiding element (6). In the combination the impedance of the feedthrough element and the impedance of the probe (7) following the outlet point (17) are substantially matched to each other at the outlet point (17).

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1. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to a surface of a filling product to be measured and back, the probe having a first impedance, wherein the f

1. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to a surface of a filling product to be measured and back, the probe having a first impedance, wherein the feedthrough element comprises: a guiding element having an inlet point for receiving the electric high-frequency signal and an outlet point at which the electric high-frequency signal is transmitted to the probe, a one-part or multipart mechanical carrier element, a one-pail or multipart insulation present between the carrier element and the guiding element, an attenuating element adapted to attenuate an electromagnetic wave, the attenuating element being present in a zone of the outlet point and being adapted such that the impedance of the feedthrough element and the first impedance of the probe following the outlet point are substantially matched to each other at said outlet point. 2. The combination of claim 1, wherein the impedance at the outlet point for being matched to the impedance of the probe following the outlet point, is substantially higher than the impedance at the inlet point.3. The combination of claim 1, wherein the guiding element is coaxially arranged to the carrier element.4. The combination of claim 1, wherein the impedance continuously changes from the inlet point to the outlet point.5. The combination of claim 1, wherein the impedance changes from the inlet point to the outlet point in a stepped manner.6. The combination of claim 4 or5, wherein the inner diameter of the carrier element changes from the inlet point to the outlet point.7. The combination of claim 4 or5, wherein the outer diameter of the guiding element decreases from the inlet point to the outlet point.8. The combination of claim 7, wherein the guiding element has at least section-wise a tapered shape.9. The combination of claim 1, wherein the carrier element has at least section-wise a conical inner contour.10. The combination of claim 1, wherein the dielectric constant of the insulation changes from the inlet point to the outlet point.11. The combination of claim 1, wherein the attenuating element adapted to attenuate an electromagnetic wave is present between the carrier element and the guiding element.12. The combination of claim 11, wherein the attenuating element contacts the outlet point.13. The combination of claim 11, wherein the attenuating element comprises mostly a tapered shape.14. The combination of claim 11, wherein the attenuating element comprises a substantially cylindrical shape.15. The combination of claim 1, wherein at least one additional guiding element is present and completely within the feedthrough element.16. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at said outlet point, wherein an element adapted to attenuate an electromagnetic wave is present in a zone of the outlet point between the carrier element and the guiding element, wherein the wave-attenuating element is a material including a mixture of conductive pigments embedded in an insulating filler material. 17. The combination of claim 16, wher ein the wave-attenuating material fills the interspace between the guiding element and the carrier element at least in part.18. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a first guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insuiation present between the carrier element and the first guiding element, wherein the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at said outlet point, wherein at least one additional guiding element is present and adjacent the first guiding element, wherein the spacing and/or the diameter ratio of the two guiding elements change at least on a partial length of the feedthrough element. 19. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a first guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the first guiding element, wherein the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at said outlet point, wherein at least one additional guiding element is present and adjacent the first guiding element, wherein the additional guiding element at its end is connected with the carrier element through a resistor. 20. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surfacc of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein a discrete ohmic resistor is present, which is selected so that the resulting impedance from the parallel connection of the probe impedance and tile resistor is substantially matched at the outlet point to the impedance of the coaxial line fonned by the guiding element and the carrier element. 21. The combination of claim 20, wherein the ohmic resistor is present in a zone of the outlet point between the carrier element and the guiding element.22. The combination of claim 20, wherein the ohmic resistor is embedded in a casting material.23. The combination of claim 20, wherein an element adapted to attenuate an electromagnetic wave is present in the zone of the outlet point between the carrier element and the guiding element.24. The combination of claim 23, wherein the attenuating element is arranged in proximity to the outlet point.25. The combination of claim 23, wherein the wave -attenuating element comprises a substantially cylindrical shape.26. The combination of claim 23, wherein the wave-attenuating element comprises mostly a tapered shape.27. The combination of claim 23, wherein at least one additional guiding element is adjacent the first guiding element and completely within the feedthrough element.28. The combination of claim 27, wherein the additional guiding element at its end is connected with the carrier element.29. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein a discrete ohmic resistor is present, which is selected so that the resulting impedance from the parallel connection of the probe impedance and the resistor is substantially matched at the outlet point to the impedance of the coaxial line formed by the guiding element and the carrier element, wherein an attenuating element adapted to attenuate an electromagnetic wave is present in the zone of the outlet point between the carrier element and the guiding element, wherein the attenuating element is arranged in proximity to the outlet point, and wherein the wave-attenuating element is a material including a mixture of conductive pigments embedded in an insulating filler material. 30. The combination of claim 29, wherein the wave-attenuating material fills the interspace between the guiding element and the carrier element at least in part.31. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a first guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the first guiding element, wherein a discrete ohmic resistor is present, which is selected so that the resulting impedance from the parallel connection of the probe impedance and the resistor is substantially matched at the outlet point to the impedance of the coaxial line formed by the guiding element and the carrier element, wherein at least one additional guiding element is present restricted to the feedthrough element, wherein the spacing and/or the diameter ratio of the two guiding elements change at least on a partial length of the feedthrough. 32. A combination of a feedthrough element for an electric high frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein a high-frequency transformer is present electrically connecting the carrier element and the guiding element with each other in a zone adjacent the outlet point, and substantially matching the impedances to each other; and wherein the probe is connected to the transformer so that impedances of the probe and the guiding element substantially match. 33. The combination of claim 32, wherein the high-frequency transformer is embedded in an insulating and protecting casting material.34. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein at least one second guiding element is present restricted to the feedthrough zone, and whereby the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at the outlet point. 35. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal front the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein at least one second guiding element is present restricted to the feedthrough zone, wherein the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at the outlet point, and wherein the spacing and/or the diameter ratio of the two guiding elements change at least on a partial length of the feedthrough. 36. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein at least one second guiding element is present restricted to the feedthrough zone, wherein the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at the outlet point, and wherein the additional guiding element at its end is connected with the carrier element through a resistor. 37. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein at least one second guiding element is present restricted to the feedthrough zone, wherein the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at the outlet point, and wherein the spacing and the diameter ratio of the two guiding elements continuously change at least on a partial length of the feedthrough. 38. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to a surface of a filling product to be measured and back, wherein the feedthrough element comprises: a guiding element having an inlet point for receiving the electric high-frequency signal from a signal source and an outlet point at which the electric high-frequency signal is transmitted to the probe, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, and wherein, in a zone of the outlet point between the carrier element and the guiding element, an element is present attenuating the electromagnetic wave so that the impedance at the outlet point of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other. 39. The combination of claim 38, wherein the attenuating element is connected at the outlet point.40. The combination of claim 38, wherein the wave-attenuating element has a substantially cylindrical shape.41. The combination of claim 38, wherein the wave-attenuating element has mostly a conical shape.42. The combination of claim 38, wherein the guiding element is coaxially arranged to the carrier element.43. The combination of claim 38, wherein the impedance continuously changes from the inlet point to the outlet point.44. The combination of claim 38, wherein the impedance changes from the inlet point to the outlet point in a stepped manner.45. The combination of claim 38, wherein the inner diameter of the carrier element changes from the inlet point to the outlet point.46. The combination of claim 38, wherein the outer diameter of the guiding element decreases from the inlet point to the outlet point.47. The combination of claim 46, wherein the guiding element has at least section-wise a tapered shape.48. The combination of claim 38, wherein the carrier element has at least section-wise a conical inner contour.49. The combination of claim 38, wherein the dielectric constant or the insolation changes from the inlet point to the outlet point.50. The combination of claim 38, wherein at least one additional guiding element is present restricted to the feedthrough zone.51. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein in the zone of the outlet point between the carrier element and the guiding element, an element is present attenuating the electromagnetic wave so that the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at the outlet point, and wherein the wave-attenuating element is a material including a mixture of conductive pigments embedded in an insulating filler material. 52. The combination of claim 51, wherein the wave-attenuating material fills the interspace between the guiding element and the carrier element at least in part.53. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein in a zone of the outlet point between the carrier element and the guiding element, an element is present attenuating the electromagnetic wave so that the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially marched to each other at the outlet point. wherein at least one additional guiding element is present within the carrier element, and wherein the spacing and/or the diameter ratio of the two guiding elements change at least on a partial length of the feedthrough element. 54. A combination of a feedthrough element for an electric high-frequency signal in a TDR level metering device, and a probe for guiding said high-frequency signal from the feedthrough element to the filling product surface of a filling product to be measured and back, wherein the feedthrough element comprises a guiding element having an inlet point for feeding the electric high-frequency signal into the feedthrough element, and an outlet point at which the electric high-frequency signal is transmitted to the probe meant for guiding said high-frequency signal, a one-part or multipart mechanical carrier element, and a one-part or multipart insulation present between the carrier element and the guiding element, wherein in the zone of the outlet point between the carrier element and the guiding element, an element is present attenuating the electromagnetic wave so that the impedance of the feedthrough element and the impedance of the probe following the outlet point are substantially matched to each other at the outlet point, wherein at least one additional guiding element is present restricted to the carrier element, and wherein the additional guiding element at its end is connected with the carrier element through a resistor. 55. A level metering device for measuring the filling level through the propagation time measurement of a guided electromagnetic wave in the form of a high-frequency signal, comprising: an electronic unit for generating said electromagnetic wave and for evaluating received echo signals, the electronic unit having a first impedance, connected with said electronic unit, a high-frequency feedthrough element for the electric high-frequency signal, a probe for guiding said high-frequency signal from the feedthrough element to a filling product surface of a filling product to be measured and back, the probe having a second impedance different than the first impedance, wherein the feedthrough element comprises a guiding element having an inlet point for receiving the electric high-frequency signal from the electronic unit, and an outlet point at which the electric high-frequency signal is transmitted to the pro be, the inlet point having a third impedance, the outlet point having a fourth impedance, a one-part or multipart mechanical carrier element, a one-part or multipart insulation present between the carrier element and the guiding element, wherein the fourth impedance and the second impedance of the probe following the outlet point are substantially matched to each other at the outlet point, and wherein the third impedance substantially matches the first impedance.