Method and apparatus for determining spectral similarity
원문보기
IPC분류정보
국가/구분 |
United States(US) Patent
등록
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국제특허분류(IPC7판) |
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출원번호 |
US-0664701
(2000-09-19)
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발명자
/ 주소 |
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출원인 / 주소 |
- BAE Systems Mission Solutions, Inc.
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대리인 / 주소 |
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인용정보 |
피인용 횟수 :
10 인용 특허 :
9 |
초록
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A method is disclosed herein for measuring similarity between a first vector and a second vector wherein (i) each element of the first vector represents a first reflectance associated with a respective one of a plurality of spectral bands, and (ii) each element of the second vector represents a seco
A method is disclosed herein for measuring similarity between a first vector and a second vector wherein (i) each element of the first vector represents a first reflectance associated with a respective one of a plurality of spectral bands, and (ii) each element of the second vector represents a second reflectance associated with a respective one of such plurality of spectral bands. The method contemplates determining a magnitude difference and a shape difference between the first vector and the second vector. A similarity between the first vector and the second vector is computed on the basis of the magnitude difference and the shape difference. Further, an image processing method is disclosed herein in which a first input pixel is extracted from a received spectral image or other data source. The first input pixel is converted into a first vector, wherein each element in the first vector represents a reflectance of a respective one of a plurality of spectral bands. A magnitude and a shape difference are determined between the first vector and a second vector from a received spectral image or other data source. A similarity between the first vector and the second vector is determined on the basis of the magnitude difference and the shape difference.
대표청구항
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1. A method for measuring similarity between a first vector and a second vector, each element of said first vector representing a first measured characteristic associated with a respective one of a plurality of spectral bands and each element of said second vector representing a second measured char
1. A method for measuring similarity between a first vector and a second vector, each element of said first vector representing a first measured characteristic associated with a respective one of a plurality of spectral bands and each element of said second vector representing a second measured characteristic associated with a respective one of said plurality of spectral bands, said method comprising:determining a magnitude difference between said first vector and said second vector based upon a plurality of element values defining said first vector and a corresponding plurality of element values defining said second vector;determining a shape difference between said first vector and said second vector based upon said plurality of element values and said corresponding plurality of element values; andcomputing a similarity between said first vector and said second vector based on said magnitude difference and said shape difference. 2. The method of claim 1 wherein said determining a magnitude difference includes computing a normalized Euclidean Distance between said first vector and said second vector. 3. The method of claim 1 wherein said first and second measured characteristics correspond to first and second reflectances, respectively, and wherein said determining a magnitude difference includes:computing a squared differential reflectance magnitude between said first vector and said second vector with respect to a number (N) of said spectral bands;summing said squared differential reflectance magnitudes; anddividing the sum of said squared differential reflectance magnitudes by N. 4. The method of claim 1 wherein said determining a magnitude difference includes evaluating the following expression over a number (Nb) of said spectral bands:wherein d e represents said magnitude difference, x i represents the value of the first vector in the i th of said spectral bands, and wherein y i represents the value of the second vector in the i th of said spectral bands. 5. The method of claim 1 wherein said determining a shape difference includes:computing a first differential magnitude difference between an element of said first vector and a mean value of said first vector with respect to each of a number (N) of said spectral bands;computing a differential magnitude difference between an element of said second vector and a mean value of said second vector with respect to each said N of said spectral bands; anddetermining a product of said first differential magnitude difference and said second differential magnitude difference with respect to each said N of said spectral bands. 6. The method of claim 5 wherein said determining a shape difference includes:summing said products of said first differential magnitude difference and said second differential magnitude difference;dividing the sum of said products by (N−1); andfurther dividing the sum of said products by the product of the standard deviation of said first vector and the standard deviation of said second vector. 7. The method of claim 1 wherein said determining a shape difference includes evaluating the following expression over a number (Nb) of said spectral bands:wherein r 2 is representative of said shape difference, x i represents the value of the first vector in the i th of said spectral bands, y i represents the value of the second vector in the i th of said spectral bands, μ x represents the means value of the first vector, and μ y represents the means value of the second vector, and wherein σ x represents the standard deviation of first vector and wherein σ y represents the standard deviation of second vector. 8. A method for measuring similarity between a first vector and a second vector, said first vector being derived from the results of a first set of spectral measurements and said second vector being derived from a second set of spectral measurements, said method comprising:determining a normalized distance between said first vector and said second vector based upon a plurality of element values defining said first vector and a corresponding plurality of element values defining said second vector;deriving a normalized shape of said first vector and a normalized shape of said second vector;determining a shape difference between said normalized shape of said first vector and said normalized shape of said second vector based upon said plurality of element values and said corresponding plurality of element values; andcomputing a similarity between said first vector and said second vector on the basis of said normalized distance and said shape difference. 9. The method of claim 8 wherein said determining a normalized distance includes:computing a differential magnitude difference between said first vector and said second vector with respect to each of a number (N) of spectral bands comprising said predetermined spectrum;summing said differential magnitude differences; anddividing the sum of said differential magnitude differences by N. 10. The method of claim 8 wherein said determining a shape difference includes:computing a first differential magnitude difference between an element of said first vector and a mean value of said first vector with respect to each of a number (N) of spectral bands included within said predetermined spectrum;computing a differential magnitude difference between an element of said second vector and a mean value of said second vector with respect to each said N of said spectral bands; anddetermining a product of said first differential magnitude difference and said second differential magnitude difference with respect to each said N of said spectral bands. 11. An image processing method, comprising:receiving a first spectral image;extracting a first input pixel from the first spectral image;converting the first input pixel into a first vector, each element in the first vector representing a first reflectance of a respective one of a plurality of spectral bands;determining a magnitude difference between said first vector and a second vector based upon a plurality of element values defining said first vector and a corresponding plurality of element values defining said second vector, said second vector being representative of a measured characteristic of a second spectral image;determining a shape difference between said first vector and said second vector based upon said plurality of element values and said corresponding plurality of element values; andcomputing a similarity between said first vector and said second vector on the basis of said magnitude difference and said shape difference. 12. The image processing method of claim 11 further comprising:receiving a second spectral image;extracting a second input pixel from the second spectral image; andconverting the second input pixel into said second vector, each element in the second vector representing a second reflectance of a respective one of said plurality of spectral bands. 13. An image processing method, comprising:receiving a spectral image;organizing pixels from the spectral image into a plurality of classes;determining a first mean reflectance vector for a first of said plurality of classes and a second mean reflectance vector for a second of said plurality of classes; andcomputing a similarity between said first mean reflectance vector and said second mean reflectance vector based upon a magnitude difference and a shape difference therebetween. 14. The method of claim 13 wherein said computing further includes:computing a differential magnitude difference between said first means reflectance vector and said second mean reflectance vector with respect to each of a number (N) of spectral bands;summing said squared differential magnitude differences; anddividing the sum of said squared differential magnitude differences by N and utilizing the result to determine said magnitude difference. 15. An article of manufacture for use with a data processing system, com prising a storage medium having stored therein a spectral similarity stored program for measuring similarity between a first vector and a second vector, each element of said first vector representing a first reflectance associated with a respective one of a plurality of spectral bands and each element of said second vector representing a second reflectance associated with a respective one of said plurality of spectral bands, said data processing system being configured by said spectral similarity stored program when executed by said data processing system to:determine a magnitude difference between said first vector and said second vector based upon a plurality of element values defining said first vector and a corresponding plurality of element values defining said second vector;determine a shape difference between said first vector and said second vector based upon said plurality of element values and said corresponding plurality of element values; andcompute a similarity between said first vector and said second vector on the basis of said magnitude difference and said shape difference. 16. An image processing system comprising:an input interface through which is received a spectral image;a storage medium having stored therein a spectral similarity stored program; anda processor operative to execute said spectral similarity stored program and thereby:(i) organize pixels from the spectral image into a plurality of classes,(ii) determine a first mean reflectance vector for a first of said plurality of classes and a second mean reflectance vector for a second of said plurality of classes, and(iii) compute a similarity between said first mean reflectance vector and said second mean reflectance vector based upon a magnitude difference and a shape difference therebetween. 17. The system of claim 16 wherein said processor is further operative to:compute a differential magnitude difference between said first means reflectance vector and said second mean reflectance vector with respect to each of a number (N) of spectral bands;sum said differential magnitude differences; anddivide the sum of said differential magnitude differences by N and utilizing the result to determine said magnitude difference. 18. An image processing system comprising:an input interface through which is received a first spectral image;a storage medium having stored therein a spectral similarity stored program; anda processor operative to execute said spectral similarity stored program and thereby:(i) extract a first input pixel from the first spectral image,(ii) converting the first input pixel into a first vector, each element in the first vector representing a first reflectance of a respective one of a plurality of spectral bands,(iii) determine a magnitude difference between said first vector and a second vector based upon a plurality of element values defining said first vector and a corresponding plurality of element values defining said second vector,(iv) determining a shape difference between said first vector and said second vector based upon said plurality of element values and said corresponding plurality of element values, and(v) compute a similarity between said first vector and said second vector based on said magnitude difference and said shape difference. 19. The image processing system of claim 18 wherein said processor is further operative to:extract a second input pixel from a second spectral image received through said input interface; andconvert the second input pixel into said second vector, each element in the second vector representing a second reflectance of a respective one of said plurality of spectral bands. 20. A method for measuring similarity between a first mean spectral vector and a second mean spectral vector, said method comprising:deriving said first mean spectral vector from a first set of spectral vectors, and deriving said second mean spectral vector from a second set of spectral vectors;determining a magnitude difference between said first mean spectral vector and said second mean spectral vector;determining a shape difference between said first mean spectral vector and said second mean spectral vector; andcomputing a similarity between said first mean spectral vector and said second mean spectral vector on the basis of said magnitude difference and said shape difference. 21. The method of claim 20 wherein said determining a magnitude difference includes computing a normalized Euclidean Distance between said first mean spectral vector and said second mean spectral vector. 22. The method of claim 20 wherein said first mean spectral vector corresponds to a first mean measured reflectance and wherein said mean spectral vector corresponds to a second mean measured reflectance, respectively, and wherein said determining a magnitude difference includes:computing a squared differential reflectance magnitude between said first mean spectral vector and said second mean spectral vector with respect to a number (N) of said spectral bands;summing said squared differential reflectance magnitudes; anddividing the sum of said squared differential reflectance magnitudes by N. 23. The method of claim 20 wherein said determining a shape difference includes determining a first mean value of said first mean spectral vector and a second mean value of said second mean spectral vector. 24. The method of claim 23 wherein said determining a shape difference further includes computing a first difference between an element of said first mean spectral vector and said first mean value and computing a second difference between an element of said second mean spectral vector and said second mean value. 25. The method of claim 24 wherein said determining a shape difference further includes determining a product of said first difference and said second difference. 26. The method of claim 25 wherein said determining a shape difference further includes determining a product of a standard deviation of said first mean spectral vector and a standard deviation of said second mean spectral vector.
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