IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0365692
(2003-02-13)
|
우선권정보 |
DE-0006162 (2002-02-14) |
발명자
/ 주소 |
|
출원인 / 주소 |
- Pruftechnik Dieter Busch AG
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
25 인용 특허 :
8 |
초록
▼
A arrangement for determining the alignment of marked axes ( 22, 28, 36, 38, 48, 50 ) of a first ( 20, 30, 40 ) and a second body ( 26, 32, 42 ) relative to one another, which is provided with a first and a second measurement device ( 10, 12 ) which can be attached to the first body or to the second
A arrangement for determining the alignment of marked axes ( 22, 28, 36, 38, 48, 50 ) of a first ( 20, 30, 40 ) and a second body ( 26, 32, 42 ) relative to one another, which is provided with a first and a second measurement device ( 10, 12 ) which can be attached to the first body or to the second body in a fixed spatial relation to the respective marked axis, the first measurement device ( 10 ) having a first source (L 2 ) for delivering a light beam and a second (D 1 ) and a third optoelectronic sensor (D 3 ), and the second measurement device ( 12 ) having a second (L 1 ) and a third source (L 3 ) for a light beam and a first optoelectronic sensor (D 2 ), the optoelectronic sensors being made such that they can determine the impact point of a light beam on the sensor, and the first light source being assigned to the first sensor and the second and the third light source being assigned to the second and third sensor.
대표청구항
▼
1. Arrangement for determining the alignment of marked axes of a first and a second body relative to one another, comprising:a first and a second measurement means which are attachable to a respective one of the first and second bodies in a fixed spatial relation to the respective marked axis,wherei
1. Arrangement for determining the alignment of marked axes of a first and a second body relative to one another, comprising:a first and a second measurement means which are attachable to a respective one of the first and second bodies in a fixed spatial relation to the respective marked axis,wherein the first measurement means has a first light source for delivering a light beam, and a second and a third optoelectronic sensor,wherein the second measurement means has a second and a third source for a light beam and a first optoelectronic sensor,wherein the optoelectronic sensors being adapted to determine an impact point of a light beam thereon, andwherein the first light source is assigned to the first sensor and the second and the third light sources are assigned to the second and third sensors. 2. Arrangement as claimed in claim 1, wherein the first light source is located between the second and the third sensors, and wherein the first sensor is located between the second and third light sources. 3. Arrangement as claimed in claim 2, wherein the second and third light sources are arranged to deliver light beams that are parallel to one another. 4. Arrangement as claimed in claim 2, wherein the first, second and third light sources are arranged to produce parallel light beams when the marked axes are in parallel alignment. 5. Arrangement as claimed in claim 4, wherein the sensors have planar sensor surfaces, planes of the sensor surfaces of the second and third sensors being perpendicular to the light beam produced by the first light source, and the plane of the sensor surface of the first sensor being perpendicular to the light beam produced by the second and third light sources. 6. Arrangement as claimed in claim 2, wherein the second and the third sensors have sensor surfaces that are located on a straight line with the first light source, and wherein the first sensor has a sensor surface that is located on a straight line with the second and third light source. 7. Arrangement as claimed in claim 1, wherein the light sources are laser light sources. 8. Arrangement as claimed in claim 1, wherein each of the measurement means has means for mounting thereof on an outer peripheral surface of a respective cylindrical body such that light beams from the light sources thereof are delivered perpendicular to the respective outer peripheral surface. 9. Arrangement as claimed in claim 1, wherein each of the measurement means has means for mounting thereof on an outer peripheral surface of a respective cylindrical body such that light beams from the light sources thereof are delivered parallel to the respective outer peripheral surface. 10. Arrangement as claimed in claim 1, wherein each of the measurement means has means for mounting thereof on an outer peripheral surface of a pulley. 11. Arrangement as claimed in claim 1, wherein the second and third light source are arranged in a manner for producing light beams that are divergent to one another to enable determination of the distance between the measurement means. 12. Process for determining the alignment of marked axes of a first and a second body relative to one another, comprising the steps of:attaching a first and a second measurement means to the first body and to the second body, respectively, in a fixed relation to the respective marked axis,producing a first light beam with a first light source of the first measurement means and delivering the first light beam to a first optoelectronic sensor provided on the second measurement means, and producing a second and a third light beam with second and third light sources of the second measurement means and delivering the second and a third light beams to a second and a third optoelectronic sensor provided on the first measurement means, anddetermining the impact point of the light beams on sensor surfaces of the optoelectronic sensors, andcomputing the relative alignment of the two measurement means from the determined impact p oints of the first, second and third light beams. 13. Process as claimed in claim 12, wherein, before determining the impact points of the light beams delivered by the second and third light sources, the measurement means are placed such that the light beam delivered by the first light source strikes a reference line or a reference point on the first sensor. 14. Process as claimed in claim 12, wherein the light beams are delivered perpendicular to the respective sensor surfaces. 15. Process as claimed in claim 12, wherein the light beams delivered by the second and third light sources are divergent with respect to one another, the distance between the measurement means being computed from the determined impact points of the first, second and third light beams.
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