초록

Apparatus and method for utilizing recirculated exhaust gas in semiconductor manufacturing system, in a manner substantially reducing the effluent burden on the exhaust treatment system and infrastructure of the semiconductor process facility.

대표청구항 ▼

1. A process for reducing exhaust gas load on a house exhaust system in a process facility generating a low-level contamination in a local gaseous environment in said process facility, said process comprising providing a local gas flow circuitry having coupled thereto a chemical filter including a m

1. A process for reducing exhaust gas load on a house exhaust system in a process facility generating a low-level contamination in a local gaseous environment in said process facility, said process comprising providing a local gas flow circuitry having coupled thereto a chemical filter including a material having chemisorptive affinity for the low-level contamination, flowing gas including low-level contaminants from the local gaseous environment through the local flow circuitry and chemical filter for removal of low-level contamination from said gas, and recirculating gas purified of said low level contaminants from the local flow circuitry to the process facility. 2. The process of claim 1, wherein the process facility comprises a semiconductor manufacturing plant. 3. The process of claim 2, wherein the local gaseous environment comprises a wet bench unit. 4. The process of claim 3, wherein the gas is flowed from the local gas flow circuitry into the environs of the wet bench unit. 5. The process of claim 4, wherein the gas is flowed from the local gas flow circuitry to the front of the wet bench unit. 6. The process of claim 3, wherein the wet bench unit comprises an open architecture wet bench unit. 7. The process of claim 3, wherein the wet bench unit comprises a filter fan unit with an intake, and gas is flowed from the local gas flow circuitry to said intake. 8. The process of claim 1, wherein the local gaseous environment comprises an ion implant gas box. 9. The process of claim 8, wherein the gas is flowed from the local gas flow circuitry into the gas box. 10. The process of claim 9, further comprising cooling the gas prior to flow thereof from the local gas flow circuitry into the gas box. 11. The process of claim 10, wherein said cooling comprises air cooling. 12. The process of claim 11, further comprising filtering particles from the gas after said air cooling. 13. The process of claim 12, wherein said filtering particles comprises flowing the gas through a filter unit selected from the group consisting of mechanical particle filters and electrostatic particle collectors. 14. The process of claim 10, wherein said cooling comprises recovery of heat from the gas. 15. The process of claim 1, wherein the process facility comprises an ion implantation unit. 16. The process of claim 15, wherein the ion implantation unit utilizes a sub-atmospheric pressure dopant gas source. 17. The process of claim 16, wherein the dopant gas source comprises a source reagent for a dopant species selected from the group consisting of Sb, In, B, As, and P. 18. The process of claim 16, wherein the local gas flow circuitry comprises an isolation flow circuitry including pressure sensors therein, wherein the isolation flow circuitry is arranged and constructed to isolate the sub-atmospheric pressure dopant gas source if pressure sensed by the pressure sensors is greater than 760 torr. 19. The process of claim 18, wherein the isolation flow circuitry comprises a valved manifold with said pressure sensors therein. 20. The process of claim 1, wherein said local gas flow circuitry has coupled thereto a motive driver for flowing gas therethrough. 21. The process of claim 20, wherein the motive driver comprises a blower. 22. The process of claim 21, wherein the blower comprises a dual speed blower. 23. The process of claim 21, wherein the blower comprises a multi-speed blower. 24. The process of claim 20, wherein the motive driver comprises a driver unit selected from the group consisting of blowers, fans, compressors, turbines, ejectors, eductors, and pumps. 25. The process of claim 20, wherein the motive driver is constructed and arranged for flowing gas through the local gas flow circuit at flow rate in a range of from 50 to 100 cubic feet per minute. 26. The process of claim 1, wherein the gas comprises air. 27. The process of claim 1, further comprising sensing presence of toxic gas in the local gas flow circuitry. 28. The process of claim 1, further comprising physically filtering gas flowed through the local gas flow circuitry. 29. The process of claim 1, wherein the chemical filter is constructed and arranged to reduce toxic or hazardous gas components to concentration below TLV level thereof. 30. The process of claim 1, wherein the chemical filter comprises a filter unit selected from the group consisting of in-line chemical filter canisters and chemical filter sorbent beds. 31. A method of thermally managing an ion implantation facility including an enclosure containing an implantation process chamber and an ion implantation gas source, said method comprising coupling local gas flow-circuitry with the enclosure, wherein the local gas flow circuitry has coupled thereto a chemical filter including a material having chemisorbtive affinity for low-level contamination, and a heat exchanger constructed and arranged to cool gas flowed through the local gas flow circuitry. 32. An ion implantation facility including an enclosure containing an implantation process chamber and an ion implantation gas source, and local gas flow circuitry coupled with the enclosure for flow of gas from the enclosure through the local gas flow circuitry and return to the enclosure, wherein the local gas flow circuitry is coupled with a chemical filter including material having chemisorbtive affinity for low-level contamination, and a heat exchanger for cooling gas flowed through the local gas flow circuitry. 33. A gas recirculating system for use in a process facility generating a low-level contamination in a local gaseous environment in said process facility, said gas recirculating system comprising local gas flow circuitry having coupled thereto a chemical filter including a material having chemisorptive affinity for the low-level contamination, wherein the local gas flow circuitry is arranged and constructed for coupling to the local gaseous environment and flow of gas from the local gaseous environment through the chemical filter for removal of low-level contamination therefrom and recirculation thereof to the process facility. 34. The system of claim 33, wherein the process facility comprises a semiconductor manufacturing plant. 35. The system of claim 34, wherein the local gaseous environment comprises an ion implant gas box. 36. The system of claim 35, wherein the gas is flowed from the local gas flow circuitry into the gas box. 37. The system of claim 36, wherein the local gas flow circuitry is coupled to a heat exchanger arranged to cool said gas prior to flow thereof from the local gas flow circuitry into the gas box. 38. The system of claim 37, wherein the heat exchanger comprises an air cooling heat exchanger. 39. The system of claim 38, wherein the local gas flow circuitry has a particle filter coupled thereto. 40. The system of claim 39, wherein the particle filter comprises a filter unit selected from the group consisting of mechanical filters and electrostatic collectors. 41. The system of claim 37, wherein the heat exchanger is arranged for recovery of heat from the gas. 42. The system of claim 34, wherein the local gaseous environment comprises a wet bench unit. 43. The system of claim 42, wherein the gas is flowed from the local gas flow circuitry into the environs of the wet bench unit. 44. The system of claim 43, wherein the gas is flowed from the local gas flow circuitry to the front of the wet bench unit. 45. The system of claim 42, wherein the wet bench unit comprises an open architecture wet bench unit. 46. The system of claim 42, wherein the wet bench unit comprises a filter fan unit with an intake, and gas is flowed from the local gas flow circuitry to said intake. 47. The system of claim 33, wherein the process facility comprises an ion implantation unit. 48. The system of claim 47, wherein the ion implantation unit includes a sub-atmospheric pressure dopant gas source. 49. The system of claim 48, wherein the sub-atmospheric pressure dopant gas source comprise s a source reagent for a dopant species selected from the group consisting of Sb, In, B, As, and P. 50. The system of claim 48, wherein the local gas flow circuitry comprises isolation flow circuitry including pressure sensors therein and the isolation flow circuitry is arranged to isolate the sub-atmospheric pressure dopant gas source if pressure as sensed by the pressure sensors is greater than 760 torr. 51. The system of claim 50, wherein the isolation flow circuitry comprises a valved manifold with said pressure sensors therein. 52. The system of claim 33, wherein the local gas flow circuitry has coupled thereto a motive driver for flowing gas therethrough. 53. The system of claim 52, wherein the motive driver comprises a blower. 54. The system of claim 53, wherein the blower comprises a dual speed blower. 55. The system of claim 53, wherein the blower comprises a multispeed blower. 56. The system of claim 52, wherein the motive driver comprises an apparatus selected from the group consisting of blowers, fans, compressors, turbines, ejectors, eductors and pumps. 57. The system of claim 52, wherein the motive driver is arranged for flowing gas through the local gas flow circuitry at flow rate in a range of from 50 to 100 cubic feet per minute. 58. The system of claim 33, wherein the gas comprises air. 59. The system of claim 33, further comprising toxic gas sensors in the local gas flow circuitry. 60. The system of claim 33, wherein the local gas flow circuitry further has coupled thereto a physical filter. 61. The system of claim 33, wherein the chemical filter is arranged and constructed to reduce concentration of toxic or hazardous species in the gas to concentration below TLV level. 62. The system of claim 33, wherein the chemical filter comprises a filter unit selected from the group consisting of in-line canister chemical filters and chemical filter sorbent beds.