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Software system and method for graphically building customized recipe flowcharts 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-009/45
출원번호 US-0394388 (1999-09-10)
발명자 / 주소
  • Hardikar, Manoj
  • Zhou, Steve
  • Shiflett, Richard
  • Kulkarni, Ashok
출원인 / 주소
  • KLA-Tencor Corporation
대리인 / 주소
    Carr & Ferrell LLP
인용정보 피인용 횟수 : 25  인용 특허 : 60

초록

A software system and method is disclosed for creating analytical graphics such as bar charts and the like with greater flexibility in an object-oriented Window® environment. The software is particularly applicable to analyzing production data in semiconductor quality control. The user customiz

대표청구항

1. A software method for analyzing production data on a computer, comprising the steps of:selecting one or more production variables from dialog boxes;selecting one or more production functions from said dialog boxes;recording said one or more production variables and said one or more production fun

이 특허에 인용된 특허 (60)

  1. Klimasauskas Casimir C., Analyzer for modeling and optimizing maintenance operations.
  2. Oshelski Anastasia L. (Austin TX) Ackmann Paul (Buda TX) Brown Stu (Austin TX) Edwards Richard (Austin TX), Automated data management system for analysis and control of photolithography stepper performance.
  3. Brecher Virginia H. (West Cornwall CT) Chou Paul B.-L ; (Montvale NJ) Hall Robert W. (Jericho VT) Parisi Debra M. (Carmel NY) Rao Ravishankar (White Plains NY) Riley Stuart L. (Colchester VT) Sturzen, Automated defect classification system.
  4. Murray L. Craig (Walnut CA), Composite random sampling.
  5. Janovski Joseph ; Offutt Pamela Y. ; Manthey Bruce E. ; Huff Wayne L. ; Biggs Philip A., Computer implemented process and computer architecture for performance analysis.
  6. Gerald P. Sang'udi ; Ross A. Bott ; Joel D. Tesler ; John R. Hawkes ; Rebecca W. Xiong ; Mario Schkolnick, Computer-related method, system, and program product for controlling data visualization in external dimension(s).
  7. Sheppard Colin P.,GBX, Data analysis system and method.
  8. Baker Michael K. (Los Gatos CA) Lane Leslie A. (Sunnyvale CA) Perloff David S. (Sunnyvale CA) Freedland Alexander (Campbell CA), Data analysis system and method for industrial process control systems.
  9. Ashida Hitoshi,JPX ; Maki Hideyuki,JPX ; Ayukawa Erika,JPX ; Maeda Akira,JPX ; Ito Yukiyasu,JPX, Data extracting system based on characteristic quantities of data distribution.
  10. La Tho Le ; Shiau Ying, Defect management system for productivity and yield improvement.
  11. Kahn Michael G. (St. Louis MO) Huang Dijia (Granger IN) Bussmann Stephen A. (Granger IN) Cousins Steve B. (St. Louis MO) Abrams Charlene A. (St. Louis MO) Beard James C. (University City MO), Diabetes data analysis and interpretation method.
  12. Kamayashi Toru (Yokohama JPX), Distribution generation system, and optimization system that adopts distribution generation system.
  13. Szabo Andrew J., Graphic user interface for database system.
  14. Laskoski Gary M. (Goshen NY), Hierarchical graph analysis method and apparatus.
  15. Barker John C. (Oakington GB2) Cruttwell Ian A. (Great Chishall ; Nr. Royston GB2), Image inspection system for defect detection.
  16. Christine M. Ditmer ; Randall W. King ; W. Russell Kennington ; Patrick W. Pirtle ; Diane J. Wells, Integrated proxy interface for web based broadband telecommunications management.
  17. Scott Edward W. (Anaheim Hills CA) Sagey Richard (Laguna Niguel CA) Fukui Toshiharu (Kanagawa-ken JPX) Akasheh Hussein F. (Costa Mesa CA) Zaveri Kunjan (Arcadia CA) Booth Marc (La Habra CA), Interactive applications generator for an interactive presentation environment.
  18. Williams James Benjamin ; Lyness Stanley W. ; Gadenne Francois G. ; Fox William J., Interactive color confidence indicators for statistical data.
  19. Selfridge Peter Gilman ; Srivastava Divesh, Interactive data exploration apparatus and methods.
  20. Altschuler Martin D. (Wallingford PA) Whittington Richard (Media PA), Interactive statistical system and method for predicting expert decisions.
  21. Amado Carlos Armando (444 Brickell Avenue #51-111 Miami FL 33131-2400), Method and apparatus for applying if-then-else rules to data sets in a relational data base and generating from the resu.
  22. Carlson Jeffrey D. (Sunnyvale CA) Fernandes Jorge M. (Newark CA), Method and apparatus for constructing an iconic sequence to operate external devices.
  23. Lee Shih-Jong J. ; Kuan Chih-Chau L., Method and apparatus for incremental concurrent learning in automatic semiconductor wafer and liquid crystal display defect classification.
  24. Peng Yeng-Kaung ; Ho Siu-May ; Shiau Ying, Method and apparatus for pattern recognition of wafer test bins.
  25. McKaskle Greg (Austin TX) Kodosky Jeffrey L. (Austin TX), Method and apparatus for providing attribute nodes in a graphical data flow environment.
  26. Jasuja Amit ; Taranto Roger, Method and apparatus for reducing the memory required to store bind variable descriptors in a database.
  27. Mangrulkar Suresh M. (Farmington Hills MI) Spoto Thomas A. (Birmingham MI) Rankin ; II James S. (Farmington Hills MI), Method and system for real-time statistical process monitoring.
  28. Berry Richard E. (Georgetown TX) Tate Bruce A. (Austin TX), Method and system for specifying method parameters in a visual programming system.
  29. Yoshida Toru (Yomato JPX) Sakaguchi Suguru (Chigasaki JPX) Kaneda Aizo (Shimodate JPX) Serizawa Kooji (Fujisawa JPX) Kishimoto Munehisa (Kamakura JPX) Mutoh Masaaki (Yokohama JPX) Matsumoto Kunio (Yo, Method for manufacturing a semiconductor device including wafer aging, probe inspection, and feeding back the results of.
  30. Krivokapic Zoran (Santa Clara CA) Heavlin William D. (San Francisco CA) Kyser David F. (San Jose CA), Method for setting and adjusting process parameters to maintain acceptable critical dimensions across each die of mass-p.
  31. Frey Rolf (Winterbach DEX), Method for the determination of optimum parameters for a casting process, particularly on die-casting machines.
  32. Mizuno Fumio,JPX, Method of and apparatus for pattern inspection.
  33. Rathmann Peter K. ; Haber Eben M., Method, system, and computer program product for computing histogram aggregations.
  34. Tesler Joel D., Method, system, and computer program product for mapping between an overview and a partial hierarchy.
  35. Kohavi Ron ; Tesler Joel D., Method, system, and computer program product for visualizing a decision-tree classifier.
  36. McCown Patricia M. (Creskill NJ) Conway Timothy J. (Highland Park NJ), Methods and apparatus for performing system fault diagnosis.
  37. Angell David (Poughkeepsie NY) Chou Paul Bao-Luo (Montvale NJ) Lee Antonio Rogelio (White Plains NY) Sturzenbecker Martin Clarence (Carmel NY), Monitoring and controlling plasma processes via optical emission using principal component analysis.
  38. Heck Howard L. (Endicott NY) Kresge John S. (Binghamton NY), Monte carlo simulation design methodology.
  39. Mozumder Purnendu K. (Plano TX) Saxena Sharad (Dallas TX) Pu William W. (Plano TX), Multi-variable statistical process controller for discrete manufacturing.
  40. Menon Murali M. (Woburn MA) Boudreau Eric R. (Leominster MA), Pattern recognition system with statistical classification.
  41. Nakata Kazuki (Kadoma JPX), Prediction control method and a prediction control device.
  42. Fisher Gary (Mineral Ridge OH) Clark ; II Mark (Hermitage PA), Process control method for improving manufacturing operations.
  43. Cadot Michel (Saint-Maur FRX), Process for systems analysis.
  44. Li Hung-Yeh,TWX, Process monitoring system for real time statistical process control.
  45. Singhal Subhash C. (Marlboro NJ), Quality control using multi-process performance analysis.
  46. Fox Edward P. (Austin TX) Kappuswamy Chandru (Austin TX), Real time control of plasma etch utilizing multivariate statistical analysis.
  47. Layden John E. (Indianapolis IN) Layden David J. (Indianapolis IN) Pearson Thomas H. (Fishers IN), Real-time statistical process monitoring system.
  48. Leshem Eran,ILX ; Weinberg Amir,ILX, Software system and associated methods for facilitating the analysis and management of web sites.
  49. Hardikar Manoj ; Zhou Steve ; Shiflett Richard ; Kulkarni Ashok, Software system and method for graphically building customized recipe flowcharts.
  50. Cambray John E. (Pelham NH) Scharmer Andrew J. (Tewksbury MA), Supervisory management center with parameter testing and alerts.
  51. Chen James N. (Austin TX) Christiansen Niels (Austin TX) Ross Joseph C. (Georgetown TX) Rowan Albert T. (Austin TX), System and method for concurrent recording and displaying of system performance data.
  52. Baisuck Allen (San Jose CA) Fairbank Richard L. (Schenectady NY) Gowen ; III Walter K. (Troy NY) Henriksen Jon R. (Latham NY) Hoover ; III William W. (Ballston Lake NY) Huckabay Judith A. (Union City, System and method for model-based verification of local design rules.
  53. Anand Tejwansh S. ; Wikle Glenn K. ; Lindsay Marshall P. ; Schubert Richard N. ; Lettington Drew T. ; Ludwig Jeffrey P., System and method for performing intelligent analysis of a computer database.
  54. Eran Leshem IL; Amir Weinberg IL, System and methods for facilitating the viewing and analysis of web site usage data.
  55. Davoust Paul (Mountain View CA), System and methods for intelligent analytical graphing.
  56. Davoust Paul (Mountain View CA), System and methods for intelligent analytical graphing.
  57. Chen Vincent Ming Chun, System for monitoring and analyzing manufacturing processes using statistical simulation with single step feedback.
  58. Sandhu Gurtej S. ; Doan Trung Tri, System for real-time control of semiconductor wafer polishing.
  59. Weinberg Amir,ILX ; Pogrebisky Michael,ILX, Visualization of web sites and hierarchical data structures.
  60. Chen Susan Hsuching ; Shiau Ying ; Lee Chern-Jiann, Watchdog system having data differentiating means for use in monitoring of semiconductor wafer testing line.

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  3. Fraley, Jessica Marie; Tomlinson, Benjamin Jeffress; Nasuti, William John; Lehman, Katherine R., Computer-implemented systems and methods for analyzing product configuration and data.
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  5. Bardolatzy,Ulrich; ?lmez,Nejmi; Flexeder,Michael, Graphical representation of setting values of printing image and machine parameters for an electrophotographic printer or copier.
  6. Kumhyr, David B.; Xue, Jue, Journaling to capture workflow and convert to workflow markup language.
  7. Look, Douglas G.; Felser, Lawrence David; Wallace, John Rogers, Method and apparatus for providing access to and working with architectural drawings on a personal digital assistant.
  8. Look, Douglas G.; Felser, Lawrence D.; Wallace, John R., Method and apparatus for providing access to and working with architectural drawings on the internet.
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  10. Zondervan, Quinton Y.; Khan, Umair A.; Harman, Gregory; Akhtar, Salman; Raza, Muhammad; Haleem Vaince, Muhammad Atau Ul; Yepishin, Dmitriy V.; Zaidi, Asad A., Method for sending an electronic message utilizing connection information and recipient information.
  11. Zondervan, Quinton Y.; Khan, Umair A.; Harman, Gregory; Akhtar, Salman; Raza, Muhammad; Vaince, Muhammad Ata Ul Haleem; Yepishin, Dmitriy V.; Zaidi, Asad A., Method for sending an electronic message utilizing connection information and recipient information.
  12. Zondervan, Quinton Y.; Khan, Umair A.; Harman, Gregory; Akhtar, Salman; Raza, Muhammad; Vainco, Muhammad Ata Ul Haleem; Yepishin, Dmitriy V.; Zaidi, Asad A., Method for sending an electronic message utilizing connection information and recipient information.
  13. Miyamoto, Atsushi; Okuda, Hirohito; Honda, Toshifumi; Takagi, Yuji; Hiroi, Takashi, Method of classifying defects using multiple inspection machines.
  14. Bartlett, Richard J.; Coniglio, Anthony P.; Steele, David A., Remote wafer flow and recipe editor for simiconductor processing control.
  15. Shimshi, Rinat, Software application to analyze event log and chart tool fail rate as function of chamber and recipe.
  16. Melet, Stone J., System and method for dynamically changing the content of an information display.
  17. Melet, Stone J., System and method for dynamically changing the content of an information display.
  18. Melet, Stone J., System and method for dynamically changing the content of an information display.
  19. Melet, Stone J., System and method for dynamically changing the content of an internet web page.
  20. Melet, Stone J., System and method for dynamically changing the content of an internet web page.
  21. Melet, Stone J., System and method for dynamically changing the content of an internet web page.
  22. Nasuti, William John; Dunbar, Connie Stout, System and method for software testing.
  23. Fisher,Jeffrey O.; Reddy,Satish B., Systems and methods for packaging files having automatic conversion across platforms.
  24. Kang, Joong Wuk; Cheong, Kwang Yung, Testing method detecting localized failure on a semiconductor wafer.
  25. Stafford, Richard; Norman, David E., Use of prediction data in monitoring actual production targets.
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