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Structure and method for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/28
  • G01R-031/26
출원번호 US-0346461 (2003-01-15)
발명자 / 주소
  • Taylor, Kurt
  • Chan, Jay
  • Zhao, Eugene
출원인 / 주소
  • Advanced Micro Devices, Inc.
대리인 / 주소
    Winstead Sechrest & Miniek P.C.
인용정보 피인용 횟수 : 41  인용 특허 : 4

초록

Aspects for increasing accuracy in predicting HCI degradation in semiconductor devices are described. The aspects include a gated ring oscillator structure utilized to perform HCI degradation testing with controlling of the gated ring oscillator structure to isolate voltage acceleration degradation

대표청구항

1. A test structure for increasing accuracy in predicting hot carrier injection (HCI) degradation in semiconductor devices, the structure comprising:a plurality of ring oscillators coupled in series; andfirst and second control logic for the plurality of ring oscillators, the first and second contro

이 특허에 인용된 특허 (4)

  1. Lee Hi Deok,KRX ; Kim Dae Mann,KRX ; Lee Sang Gi,KRX ; Jang Myoung Jun,KRX, Hot carrier measuring circuit.
  2. Snyder Eric S. (Albuquerque NM) Campbell David V. (Albuquerque NM), On-clip high frequency reliability and failure test structures.
  3. Gluseppe La Rosa ; Fernando Guarin ; Kevin Kolvenbach ; Stewart Rauch, III, Ring oscillator design for MOSFET device reliability investigations and its use for in-line monitoring.
  4. Abadeer, Wagdi William; Ellis, Wayne Frederick; Hansen, Patrick R.; McKenna, Jonathan M., System and method for measuring circuit performance degradation due to PFET negative bias temperature instability (NBTI).

이 특허를 인용한 특허 (41)

  1. Pitkethly, Scott; Masleid, Robert Paul, Advanced repeater utilizing signal distribution delay.
  2. Pitkethly, Scott, Advanced repeater with duty cycle adjustment.
  3. Pitkethly, Scott, Advanced repeater with duty cycle adjustment.
  4. Pitkethly, Scott, Advanced repeater with duty cycle adjustment.
  5. Bienek, Michael D., Built-in self timing test method and apparatus.
  6. Masleid, Robert Paul; Dholabhai, Vatsal, Circuit with enhanced mode and normal mode.
  7. Masleid, Robert Paul; Kowalczyk, Andre, Circuits and methods for detecting and assisting wire transitions.
  8. Masleid, Robert, Circuits, systems and methods relating to a dynamic dual domino ring oscillator.
  9. Masleid,Robert P., Circuits, systems and methods relating to dynamic ring oscillators.
  10. Masleid, Robert Paul, Column select multiplexer circuit for a domino random access memory array.
  11. Masleid,Robert P., Column select multiplexer circuit for a domino random access memory array.
  12. Masleid, Robert Paul, Configurable delay chain with stacked inverter delay elements.
  13. Masleid, Robert Paul, Configurable tapered delay chain with multiple sizes of delay elements.
  14. Masleid, Robert P.; Pitkethly, Scott, Cross point switch.
  15. Masleid, Robert P.; Pitkethly, Scott, Cross point switch.
  16. Masleid, Robert P.; Pitkethly, Scott, Cross point switch.
  17. Suzuki, Shingo, Device aging determination circuit.
  18. Masleid, Robert P, Dynamic ring oscillators.
  19. Masleid, Robert P, Inverting zipper repeater circuit.
  20. Masleid, Robert P., Inverting zipper repeater circuit.
  21. Masleid, Robert Paul, Inverting zipper repeater circuit.
  22. Masleid, Robert, Leakage efficient anti-glitch filter.
  23. Masleid, Robert Paul, Power efficient multiplexer.
  24. Masleid, Robert Paul, Power efficient multiplexer.
  25. Masleid, Robert Paul, Power efficient multiplexer.
  26. Masleid, Robert Paul, Power efficient multiplexer.
  27. Masleid, Robert Paul; Dholabhai, Vatsal; Klingner, Christian, Repeater circuit having different operating and reset voltage ranges, and methods thereof.
  28. Masleid, Robert Paul; Dholabhai, Vatsal, Repeater circuit with high performance repeater mode and normal repeater mode, wherein high performance repeater mode has fast reset capability.
  29. Stoiber, Steven T.; Siu, Stuart, Ring based impedance control of an output driver.
  30. Stoiber, Steven T.; Siu, Stuart, Ring based impedance control of an output driver.
  31. Masleid, Robert Paul; Sousa, Jose; Kottapalli, Venkata, Scannable dynamic circuit latch.
  32. Masleid, Robert P.; Burr, James B., Stacked inverter delay chain.
  33. Suzuki, Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  34. Suzuki, Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  35. Suzuki,Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  36. Suzuki,Shingo, System and method for measuring negative bias thermal instability with a ring oscillator.
  37. Jenkins, Keith A.; Linder, Barry P., Test circuit to isolate HCI degradation.
  38. Sul, Chinsong; Kwon, Hyukyong; Ng, Andy, Test solution for a random number generator.
  39. Sul, Chinsong; Kwon, Hyukyong; Ng, Andy, Test solution for ring oscillators.
  40. Pitkethly, Scott; Masleid, Robert P., Triple latch flip flop system and method.
  41. Pitkethly,Scott; Masleid,Robert P., Triple latch flip flop system and method.
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