[특허]Electronic measuring device

Magna International Inc.

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특허 상세정보

MyON담기

내보내기 페이스북 공유 트위터 공유 카카오톡 공유

Electronic measuring device

특허상세정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01B-003/18 G08B-021/00
미국특허분류(USC)	033/558; 033/820; 340/686.5; 340/686.1
출원번호	US-0324081 (2002-12-20)
발명자 / 주소	Gass, Bruno W. Avelar, Manuel L.
출원인 / 주소	Magna International Inc.
대리인 / 주소	Pillsbury Winthrop LLP
인용정보	피인용 횟수 : 2 인용 특허 : 19

초록
▼

An embodiment of an electronic measuring device includes a housing having an exterior surface configured and arranged to be removably secured within a support member. An electrically conductive probe is coupled to the housing and is movable between a position in contact with a workpiece and a position out of contact with the workpiece. A circuit electrically couples an indicator and a power source to the probe such that when the probe is out of contact with the workpiece, the circuit is open and no power is supplied from the power source to the indicator...

대표
청구항
▼

1. An electronic measuring device, comprising:a housing having an exterior surface configured and arranged to be removably secured within a support member such that said housing can be removably replaced in the support member;an electrically conductive probe coupled to said housing configured and arranged to extend through the support member and move between a position in contact with a workpiece and a position out of contact with the workpiece;an indicator and a power source, both disposed within said housing; anda circuit electrically coupling said probe to said indicator and to said power source such that when said probe is out of contact with the workpiece, said circuit is open and no power is supplied from said power source to said indicator and such that when said probe contacts the workpiece, said circuit closes to supply power from said power source to said indicator to send a signal to the operator that said probe is in contact with the workpiece. 2. An electronic measuring device according to claim 1, wherein said housing includes an adapter mounted on a micrometer assembly, said micrometer assembly including a sleeve portion and a probe movably mounted in the sleeve. 3. An electronic measuring device according to claim 1, wherein said housing is constructed of an electrically conductive material. 4. An electronic measuring device according to claim 1, wherein said indicator is a light source. 5. An electronic measuring device according to claim 4, wherein said light source is a light bulb. 6. An electronic measuring device according to claim 1, wherein said power source is a battery. 7. An electronic measuring device according to claim 1, wherein said housing includes an outer portion and an inner portion, said inner portion being movably coupled to said outer portion, said probe being affixed to said inner portion and said indicator and power source being disposed in said inner portion. 8. An electronic measuring device according to claim 7, wherein said inner portion and said outer portion of the housing are each constructed of an electrically conductive material and are electrically connected to one another, and wherein said probe is electrically insulated from said inner portion of said housing. 9. An electronic measuring device according to claim 1, wherein said indicator and said power source are electrically connected between said probe and said exterior surface of said housing. 10. An electronic measuring device according to claim 1, wherein said housing forms part of a micrometer having a sleeve with measuring indicia and a thimble with measuring indicia and configured such that the thimble is rotatable about the sleeve. 11. A measuring assembly, comprising:a fixture for removably holding a workpiece to be measured;a support member positioned a predetermined distance from said fixture;an electronic measuring device includinga housing having an exterior surface configured and arranged to be removably secured within said support member such that said measuring device can be removably replaced in said support member,an electrically conductive probe coupled to said housing to move between a position in contact with said workpiece and a position out of contact with said workpiece, andan indicator and a power source, both disposed in said housing; anda circuit electrically connecting said probe to said indicator and to said power source such that when said probe is out of contact with said workpiece, said circuit is open and said power source does not provide power to said indicator and when said probe contacts said workpiece, said circuit closes such that power is provided to said indicator to activate said indicator to send a signal to the operator of said measuring device that said probe is in contact with said workpiece. 12. A measuring assembly according to claim 11, wherein said housing includes an adapter mounted on a micrometer assembly, said micrometer assembly including a sleeve portion and a probe mov ably mounted in said sleeve. 13. A measuring assembly according to claim 12, wherein said housing and said workpiece are each constructed of an electrically conductive material, wherein said housing is electrically connected to said workpiece and is electrically insulated from said probe, said indicator and said power source being electrically connected between said housing and said probe so that said power source supplies power to said indicator when said probe contacts said workpiece and does not supply power to said indicator when said probe is out of contact with said workpiece. 14. A measuring assembly according to claim 13, wherein said support member and said fixture are each constructed of an electrically conductive material, wherein said support member is electrically connected to said workpiece when said workpiece is in said fixture and wherein said housing is electrically connected to said workpiece when secured in said support member. 15. A measuring assembly according to claim 11, wherein said indicator is a light source. 16. A measuring assembly according to claim 15, wherein said light source is a light bulb. 17. A measuring assembly according to claim 11, wherein said power source is a battery. 18. A measuring assembly according to claim 11, wherein said housing includes an outer portion and an inner portion, said inner portion being movably coupled to said outer portion, said probe being affixed to said inner portion and said indicator and power source being disposed in said inner portion. 19. A measuring assembly according to claim 11, wherein said support member includes an opening, said measuring device being constructed and arranged such that when said housing is removably secured within said support member, said probe extends outwardly of said opening and such that said probe is configured and arranged to move with respect to said workpiece. 20. A measuring assembly according to claim 18, wherein the inner portion and the outer portion of the housing are each constructed of an electrically conductive material and are electrically connected to one another, and wherein the probe is electrically insulated from the inner portion of the housing. 21. A measuring assembly according to claim 11, wherein said indicator and said power source are electrically connected between said probe and said exterior surface of said housing. 22. A measuring assembly according to claim 10, wherein said workpiece, said support member and said fixture are each constructed of an electrically conductive material such that said support member is electrically connected to said workpiece when said workpiece is mounted in said fixture, and wherein said exterior surface of said housing is electrically connected to said workpiece when said outer portion of said housing is secured in said support member. 23. A measuring assembly according to claim 11, wherein said housing forms part of a micrometer having a sleeve with measuring indicia and a thimble with measuring indicia and configured such that the thimble is rotatable about the sleeve. 24. A method of measuring, comprising:providing a fixture for removably holding a first workpiece to be measured;providing a support member positioned a predetermined distance from the fixture;providing an electronic measuring device includinga housing having an exterior surface configured and arranged to be removably secured to the support member,an electrically conductive probe coupled to the housing for movement between a position in contact with the first workpiece and a position out of contact with the first workpiece, andan indicator and a power source, both disposed within said housing;providing a circuit electrically connecting the probe, the indicator and the power source such that when the probe is out of contact with the first workpiece, the circuit is open and no power is supplied from the power source to the indicator and such that when the probe contacts the first workpiece, the circuit clo ses and power is supplied from said power source to said indicator to signal the operator of the measuring device that the probe is in contact with the first workpiece;removably holding the first workpiece in the fixture;removably securing the measuring device into the support member;moving the probe into contact with the first workpiece until contact is made and the indicator sends a signal that contact with the first workpiece is achieved;removing the measuring device from the support member; andremoving the first workpiece from the fixture. 25. A method according to claim 24, wherein the removably securing the measuring device occurs after the removably holding the first workpiece. 26. A method according to claim 24, wherein the removing the measuring device occurs after removing the first workpiece. 27. A method according to claim 24, further comprising:inserting a second workpiece into the fixture for measuring. 28. A method according to claim 27, wherein the inserting a second workpiece into the fixture occurs before the removing of the measuring device from the support member. 29. A method according to claim 27, further comprising:moving the probe into contact with the second workpiece until contact is made and the indicator sends a signal that contact with the second workpiece is achieved. 30. A method according to claim 24, wherein the providing the measuring device includes providing a micrometer having a sleeve with measuring indicia and a thimble with measuring indicia, and the method including rotating the thimble about the sleeve.

이 특허에 인용된 특허 (19)

이 특허를 인용한 특허 피인용횟수: 2

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구성항목	관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
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특허 상세정보

Electronic measuring device

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이 특허에 인용된 특허 (19)

이 특허를 인용한 특허 피인용횟수: 2

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Electronic measuring device

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이 특허에 인용된 특허 (19)

이 특허를 인용한 특허 피인용횟수: 2

IPC 상위 출원인

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