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Quantifying a difference between nodal voltages 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-023/14
출원번호 US-0078945 (2002-02-19)
발명자 / 주소
  • Gauthier, Claude
  • Amick, Brian
  • Gold, Spencer
  • Liu, Dean
  • Zarrineh, Kamran
  • Trivedi, Pradeep
출원인 / 주소
  • Sun Microsystems, Inc.
대리인 / 주소
    Osha & May L.L.P.
인용정보 피인용 횟수 : 17  인용 특허 : 42

초록

A method and apparatus that uses the difference between two nodal voltages, such as a temperature-independent voltage and a temperature-dependent voltage, to determine the actual temperature at a point on an integrated circuit is provided. Further, a method and apparatus that converts a difference b

대표청구항

1. An apparatus for quantifying a difference in voltage between a first node and a second node, comprising:a voltage generator arranged to concurrently generate a temperature-independent voltage on the first node and a temperature-dependent voltage on the second node;a first oscillator that inputs t

이 특허에 인용된 특허 (42)

  1. Cornelius George (Milford MA), Apparatus and method for detecting small changes in attached mass of piezoelectric devices used as sensors.
  2. Nobutaka Nishigaki JP, Apparatus for controlling internal heat generating circuit.
  3. Akita Sigeyuki (Nukata JPX) Wakamatsu Hisato (Toyota JPX), Apparatus for measuring temperature.
  4. Sawtell Carl K. (San Jose CA) Dagan Marc E. (Mountain View CA) Bandy Frederic S. (Milpitas CA), Compact programmable temperature detector apparatus.
  5. Meador Richard B. ; Hansen Kenneth A. ; Kehler Walter H. ; Kurtzman Gary A. ; Zele Rajesh H., Configuration single chip receiver integrated circuit architecture.
  6. Woodman ; Jr. Gilbert R., Digital phase-lock loop control system.
  7. Fujikawa Toyoharu,JPX ; Ichikawa Shingo,JPX, Electronic clinical thermometer.
  8. Ishikawa, Takehiro; Yamazawa, Akira; Kusumoto, Yasuo, Electronic clinical thermometer.
  9. Murase, Masakazu, Electronic clinical thermometer.
  10. Iwama Nobuyuki (Tokyo JPX), Electronic clinical thermometer with power shut-off at maximum temperature.
  11. Iinuma Kazuhiro (Yokohama JPX) Abe Yukito (Yokohama JPX), Electronic digital thermometer.
  12. Bellet Jean-Marie (Geneva CHX), Electronic thermometer.
  13. Fujikawa Toyoharu (Saitama JPX) Gordon Tim H. (Rivervale NJ) Marcelina Louis A. (Ridgewood NJ), Electronic thermometer with audible temperature rise indicator.
  14. Shvartsman Vladimir A. (Louisville KY), Fundamental and harmonic pulse-width discriminator.
  15. Mahalingaiah Rupaka (Austin TX) Hulett Terry (Austin TX), Heuristic clock speed optimizing mechanism and computer system employing the same.
  16. Bertoluzzi Renitia J. (Saratoga CA) Jackson Robert T. (Boynton Beach FL) Weitzel Stephen D. (Boca Raton FL), Integrated dynamic power dissipation control system for very large scale integrated (VLSI) chips.
  17. Hetherington Ricky C. ; Panwar Ramesh, Method and apparatus for moderating current demand in an integrated circuit processor.
  18. Borys S. Senyk, Method and apparatus for monitoring the temperature of a processor.
  19. Pippin Jack D., Method and apparatus for programmable thermal sensor for an integrated circuit.
  20. McMinn Brian S., Method and apparatus for tracking power of an integrated circuit.
  21. Binder Yehuda,ILX, Method and system for calibrating a crystal oscillator.
  22. Nguyen Van Minh, Method for generating test pattern sets during a functional simulation and apparatus.
  23. Yamauchi Tsuneo,JPX, Method of thermometry and apparatus for the thermometry.
  24. Ristic Ljubisa (Phoenix AZ) Dunn William C. (Mesa AZ) Cambou Bertrand F. (Mesa AZ) Terry Lewis E. (Phoenix AZ) Roop Raymond M. (Scottsdale AZ), Microprocessor having environmental sensing capability.
  25. Lipp Robert J. (15881 Rose Ave. Los Gatos CA 95030), Monolithic CMOS digital temperature measurement circuit.
  26. Pricer Wilbur D. ; Noble Wendell P. ; Fifield John A. ; Gersbach John E., On-chip thermometry for control of chip operating temperature.
  27. Medin David L. (940 Saint Joseph Ave. Los Altos CA 94024), Perishable good integrity indicator.
  28. Watanabe Takamoto (Nagoya JPX) Ohtsuka Yoshinori (Okazaki JPX) Hattori Tadashi (Okazaki JPX) Hoshino Kouichi (Obu JPX), Physical quantity detection device for converting a physical quantity into a corresponding time interval.
  29. Arikawa Yasuo (Suwa JPX) Miyazawa Eiichi (Suwa JPX), Pressure measuring device and method using quartz resonators.
  30. Hui Titkwan ; Mounger Robert W., Programmable delay line.
  31. Bell Robert L. (Agoura Hills CA) Renger Herman L. (Calabasa CA), System for obtaining digital outputs from multiple transducers.
  32. Steven Fry, Temperature compensating circuit for a crystal oscillator.
  33. Satou Kiyoshi (Tokyo JPX) Hara Takaaki (Tokyo JPX), Temperature detector and a temperature compensated oscillator using the temperature detector.
  34. Douglass James M. (Dallas TX) Zanders Gary V. (Plano TX) Dias Donald R. (Carrollton TX) Lee Robert D. (Denton TX), Temperature detector systems and methods.
  35. Douglass James Michael ; Zanders Gary V. ; Dias Donald R. ; Lee Robert D., Temperature detector systems and methods.
  36. Bolton ; Jr. Jerry T. ; Martin Frederick L., Temperature sensing apparatus.
  37. Ang Michael Anthony, Thermostat controls dsp's temperature by effectuating the dsp switching between tasks of different compute-intensity.
  38. Frerking Marvin E. (Cedar Rapids IA), Time compensated clock oscillator.
  39. Darmawaskita Hartono ; Nolan James B., Time-based temperature sensor system and method therefor.
  40. Hodate Masato (Higashiyamato JPX), Tire-interior monitoring apparatus.
  41. Fukukita Hiroshi (Tokyo JPX) Ueno Shinichirou (Machida JPX), Ultrasonic pulse temperature determination method and apparatus.
  42. Holmdahl Todd E. (Bothell WA), Variable power supply with predetermined temperature coefficient.

이 특허를 인용한 특허 (17)

  1. Burchell, Jonathan; Myers, Therese E.; Kaye, Stanton; Pope, Gary W., Apparatus and method for monitoring and communicating data associated with a product.
  2. Burchell, Jonathan; Myers, Therese E.; Kaye, Stanton; Pope, Gary W.; Eversley, Fred; Patterson, Michael; Ono, Kenji, Apparatus and method for monitoring and communicating data associated with a product.
  3. Burchell, Jonathan; Myers, Therese E.; Kaye, Stanton; Pope, Gary W.; Eversley, Fred; Patterson, Michael; Ono, Kenji, Apparatus and method for monitoring and communicating data associated with a product.
  4. Liu, Jonathan H.; Kang, Wonjae L., Body bias compensation for aged transistors.
  5. Kondo, Takayuki; Todorokihara, Masayoshi, Frequency measuring device and odor sensor and electronic equipment which are provided with the frequency measuring device.
  6. Kaye, Stanton, Inference electronic shelf life dating system for perishables.
  7. Muniandy,Ravisangar; Taylor,Gregory F.; Aminzadeh,Payman, On-chip frequency degradation compensation.
  8. Muniandy,Ravisangar; Taylor,Gregory F.; Aminzadeh,Payman, On-chip frequency degradation compensation.
  9. Muniandy,Ravisangar; Taylor,Gregory F.; Aminzadeh,Payman, On-chip frequency degradation compensation.
  10. Chen, Hsi-Wen, Process monitoring circuit and method.
  11. Lee,Hsin Chou; Chen,Wu Shin, Radio frequency temperature sensor and method of calibrating temperature therefor.
  12. Arisaka, Naoya; Minami, Masataka; Miki, Takahiro, Semiconductor device.
  13. Arisaka, Naoya; Minami, Masataka; Miki, Takahiro, Semiconductor device.
  14. Pope,Gary; Myers,Therese E.; Kaye,Stanton; Burchell,Jonathan, Shelf-life monitoring sensor-transponder system.
  15. Williams, Peter Andrew Rees, Thermally stable low power chip clocking.
  16. Moon, Byong-mo, Voltage detection device and semiconductor device including the same.
  17. Belandia, Aritz Ubarretxena; Berenguer—Pérez, Roc; Antón, César Matinez; López, Daniel Egurrola; Hernández de Miguel, Javier, Wireless temperature sensor.
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