|국가/구분||United States(US) Patent 등록|
|국제특허분류(IPC7판)||H03K-019/00 G01R-031/28 G06F-011/22|
|발명자 / 주소|
|출원인 / 주소|
|대리인 / 주소||
|인용정보||피인용 횟수 : 52 인용 특허 : 3|
A self-synchronous logic circuit includes scan test compliant registers holding data and forming stages of a pipeline, and scan test compliant self-synchronous signal control circuits corresponding to respective registers and performing handshake to transfer clocks. In accordance with the clocks transferred by the scan test compliant self-synchronous signal control circuits, data processing among the scan test compliant registers proceeds. In addition to normal data processing, the scan test compliant registers have a function of serially transferring co...
1. A self-synchronous logic circuit having a test function, comprising:registers holding data, connected in a plurality of stages for a pipeline; andself-synchronous signal control circuits provided corresponding to said registers connected in a plurality of stages, respectively; whereinsaid self-synchronous signal control circuits perform four-way handshake in which, when transfer permission to a preceding stage is applied in a first way, a transfer request from the preceding stage is received as an input together with data output from the register of t...