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특허 상세정보

Self-synchronous logic circuit having test function and method of testing self-synchronous logic circuit

국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판) H03K-019/00    G01R-031/28    G06F-011/22   
미국특허분류(USC) 326/093; 714/744
출원번호 US-0448076 (2003-05-30)
우선권정보 JP-0157567 (2002-05-30)
발명자 / 주소
출원인 / 주소
대리인 / 주소
    Harness, Dickey & Pierce, P.L.C.
인용정보 피인용 횟수 : 52  인용 특허 : 3
초록

A self-synchronous logic circuit includes scan test compliant registers holding data and forming stages of a pipeline, and scan test compliant self-synchronous signal control circuits corresponding to respective registers and performing handshake to transfer clocks. In accordance with the clocks transferred by the scan test compliant self-synchronous signal control circuits, data processing among the scan test compliant registers proceeds. In addition to normal data processing, the scan test compliant registers have a function of serially transferring co...

대표
청구항

1. A self-synchronous logic circuit having a test function, comprising:registers holding data, connected in a plurality of stages for a pipeline; andself-synchronous signal control circuits provided corresponding to said registers connected in a plurality of stages, respectively; whereinsaid self-synchronous signal control circuits perform four-way handshake in which, when transfer permission to a preceding stage is applied in a first way, a transfer request from the preceding stage is received as an input together with data output from the register of t...

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