초록 ▼

A method for forming a suspended microstructure is provided. The method includes providing a monocrystalline target substrate and subjecting the surface of the monocrystalline target substrate to ion implantation to form a microstructure layer at the surface of the monocrystalline target substrate.

A method for forming a suspended microstructure is provided. The method includes providing a monocrystalline target substrate and subjecting the surface of the monocrystalline target substrate to ion implantation to form a microstructure layer at the surface of the monocrystalline target substrate. An epitaxial material layer is formed overlying the microstructure layer. A handle substrate is provided and a patterned interposed material layer is provided between the epitaxial material layer and the handle substrate. The epitaxial material layer, the patterned interposed material layer and the handle substrate are affixed. The method further includes thermally treating the monocrystalline target substrate to effect separation between the microstructure layer and a remainder of the monocrystalline target substrate.

대표청구항 ▼

1. A method for forming a suspended microstructure, the method comprising:providing a monocrystalline target substrate;subjecting a surface of said monocrystalline target substrate to ion implantation to form a microstructure layer at said surface of said monocrystalline target substrate;forming an

1. A method for forming a suspended microstructure, the method comprising:providing a monocrystalline target substrate;subjecting a surface of said monocrystalline target substrate to ion implantation to form a microstructure layer at said surface of said monocrystalline target substrate;forming an epitaxial material layer overlying said microstructure layer;providing a handle substrate;providing a patterned interposed material layer between said epitaxial material layer and said handle substrate;affixing said epitaxial material layer, said patterned interposed material layer, and said handle substrate; andthermally treating said monocrystalline target substrate to effect separation between said microstructure layer and a remainder of said monocrystalline target substrate. 2. The method of claim 1, further comprising forming a screening layer overlying said monocrystalline target substrate prior to said subjecting. 3. The method of claim 2, further comprising removing said screening layer after said subjecting. 4. The method of claim 1, said subjecting comprising subjecting said surface of said monocrystalline target substrate to ion implantation at an ion dose of from about 1·1016 cm−2 to about 7·1016 cm−2. 5. The method of claim 1, said subjecting comprising subjecting said surface of said monocrystalline target substrate to ion implantation at an energy of from about 40 keV to about 80 keV. 6. The method of claim 1, said providing a patterned interposed layer comprising forming said patterned interposed material layer overlying said handle wafer. 7. The method of claim 6, said affixing comprising fusion bonding said patterned interposed material layer and said epitaxial material layer. 8. The method of claim 1, said providing a patterned interposed layer comprising forming said patterned interposed material layer overlying said epitaxial material layer. 9. The method of claim 8, said affixing comprising fusion bonding said patterned material layer and said handle substrate. 10. The method of claim 1, said thermally treating comprising subjecting said monocrystalline target substrate to a temperature in the range of about 400° C. to about 600° C.for about 15 minutes to about one hour. 11. The method of claim 1, wherein said epitaxial material layer is formed at a temperature in the range of from about 900° C. to about 1200° C. 12. A method for forming a suspended microstructure, the method comprising:providing a monocrystalline target substrate;forming a screening layer overlying said monocrystalline target substrate;subjecting a surface of said monocrystalline target substrate to ion implantation to form a microstructure layer at said surface of said monocrystalline target substrate;removing said screening layer from said monocrystalline target substrate;coupling a handle substrate to said monocrystalline target substrate;interposing a patterned material layer between said microstructure layer and said handle substrate;affixing said microstructure layer, said patterned material layer, and said handle substrate;thermally treating said monocrystalline target substrate to effect separation between said microstructure layer and a remainder of said monocrystalline target substrate; andforming an epitaxial material layer overlying said microstructure layer. 13. The method of claim 12, said subjecting comprising subjecting said surface of said monocrystalline target substrate to ion implantation at an ion dose of from about 1·1016 cm−2 to about 7·1016 cm−2. 14. The method of claim 12, said subjecting comprising subjecting said monocrystalline target substrate to ion implantation at an energy of from about 40 keV to about 80 keV. 15. The method of claim 12, said interposing comprising forming said patterned material layer overlying said handle wafer. 16. The method of claim 15, said affixing comprising fusion bonding said patterned material layer and said microstr ucture layer. 17. The method of claim 12, said interposing comprising forming said patterned material layer overlying said microstructure layer. 18. The method of claim 17, said affixing comprising fusion bonding said patterned material layer and said handle substrate. 19. The method of claim 12, said thermally treating comprising subjecting said monocrystalline target substrate to a temperature in the range of about 400° C. to about 600° C. for about 15 minutes to about one hour. 20. The method of claim 12, wherein said epitaxial material layer is formed at a temperature in the range from about 900° C. to about 1200° C.