Apparatus and method for ion production enhancement
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01J-049/04
H01J-049/26
H01J-049/40
H01J-049/42
출원번호
US-0080879
(2002-02-22)
발명자
/ 주소
Truche, Jean-Luc
Bai, Jian
출원인 / 주소
Agilent Technologies, Inc.
대리인 / 주소
Joyce Timothy H.
인용정보
피인용 횟수 :
9인용 특허 :
23
초록▼
An apparatus and method for use with a mass spectrometer, in which an ion enhancement system directs a heated gas to heat ions produced by a matrix based ion source and detected by a detector of the mass spectrometer. The ion enhancement system is interposed between the ion source and the detector o
An apparatus and method for use with a mass spectrometer, in which an ion enhancement system directs a heated gas to heat ions produced by a matrix based ion source and detected by a detector of the mass spectrometer. The ion enhancement system is interposed between the ion source and the detector of the mass spectrometer. The analyte ions that contact the heated gas are enhanced to increase the number and/or intensity of ions detected by the detector of the mass spectrometer. The method includes producing analyte ions from a matrix based ion source, enhancing the analyte ions with an ion enhancement system and detecting the analyte ions with the detector of the mass spectrometer.
대표청구항▼
1. A conduit for providing a heated gas flow to enhance analyte ions produced by a matrix based ion source and discharged to an ion region adjacent to a collecting capillary. 2. A conduit as recited in claim 1, wherein said ion source is a matrix assisted laser desorption ionization (MALDI) ion sour
1. A conduit for providing a heated gas flow to enhance analyte ions produced by a matrix based ion source and discharged to an ion region adjacent to a collecting capillary. 2. A conduit as recited in claim 1, wherein said ion source is a matrix assisted laser desorption ionization (MALDI) ion source. 3. A conduit as recited in claim 1, wherein said ion source is a fast atom bombardment (FAB) ion source. 4. A conduit as recited in claim 1, wherein said ion source is an atmospheric pressure matrix assisted laser desorption ionization (AP-MALDI) ion source. 5. A conduit as recited in claim 1, wherein said ion source is at atmospheric pressure. 6. A conduit as recited in claim 1, wherein said ion source is below atmospheric pressure. 7. As conduit as recited in claim 1, wherein said ion source is above atmospheric pressure. 8. A conduit as recited in claim 3, wherein said ion source is at atmospheric pressure. 9. A conduit as recited in claim 3, wherein said ion source is below atmospheric pressure. 10. As conduit as recited in claim 3, wherein said ion source is above atmospheric pressure. 11. A mass spectrometer comprising:(a) a matrix based ion source for producing and discharging analyte ions to an ion region;(b) a collecting capillary downstream from both said matrix based ion source and said ion region for receiving said analyte ions produced and discharged from said ion source to said ion region;(c) a gas source for providing a gas;(d) a conduit for conducting said gas from said gas source toward said ion region and providing ion enhancement to said analyte ions located in said ion region before said analyte ions enter said collecting capillary, and(e) a detector downstream from said collecting capillary for detecting said analyte ions enhanced and received by said collecting capillary, wherein the detector includes or is coupled to a mass analyzer. 12. A mass spectrometer as recited in claim 11, wherein said ion source is a matrix assisted laser desorption ionization (MALDI) source. 13. A mass spectrometer as recited in claim 11, wherein said ion source is a fast atom bombardment (FAB) ion source. 14. A mass spectrometer as recited in claim 11, wherein said ion source is an atmospheric pressure matrix assisted laser desorption ionization (AP-MALDI). 15. A mass spectrometer as recited in claim 11, wherein said ion source is at atmospheric pressure. 16. A mass spectrometer as recited in claim 11, wherein said ion source is below atmospheric pressure. 17. A mass spectrometer as recited in claim 11, wherein said ion source is above atmospheric pressure. 18. A mass spectrometer as recited in claim 13, wherein said ion source is at atmospheric pressure. 19. A mass spectrometer as recited in claim 12 or 13, wherein said ion source is below atmospheric pressure. 20. A mass spectrometer as recited in claim 12 or 13, wherein said ion source is above atmospheric pressure. 21. The mass spectrometer of claim 11, wherein said conduit is selected from the group consisting of a sleeve, transport device, dispenser, nozzle, hose, pipe, port, connector, tube, coupling, container and a housing. 22. The mass spectrometer of claim 11, wherein said gas provided by said gas source is heated. 23. The mass spectrometer of claim 11, wherein said conduit encloses at least a portion of said collecting capillary. 24. The mass spectrometer of claim 23, wherein said conduit enclosing said portion of said collecting capillary defines an annular space for conducting gas flow between said collecting capillary and said conduit. 25. The mass spectrometer of claim 11, wherein said conduit is adjacent to said collecting capillary. 26. The mass spectrometer of claim 11, wherein said gas carried from said gas source to said ionization region is from 60-150 degrees Celsius. 27. The mass spectrometer of claim 11, wherein said gas is selected from the group consisting of nitrogen, fluorine, air, carbon dioxide, argon, xenon and helium. 28. The mass spectrometer o f claim 11, wherein the volume of said ion region is from 1-5 mm 3 . 29. The mass spectrometer of claim 11, wherein said gas comprises a monatomic molecule. 30. The mass spectrometer of claim 11, wherein said gas comprises a diatomic molecule. 31. The mass spectrometer of claim 11, wherein said gas comprises a triatomic molecule. 32. The mass spectrometer of claim 11, wherein said gas comprises a polyatomic molecule. 33. The mass spectrometer of claim 11, further comprising a main capillary and a coupling, said coupling for joining together said collecting capillary, said conduit, and said main capillary. 34. The mass spectrometer of claim 33, wherein said coupling further comprises a housing, a capillary cap and a spacer. 35. The mass spectrometer of claim 34, wherein said capillary cap and spacer are disposed in said housing. 36. A method for detecting analyte ions in a mass spectrometer, comprising:(a) heating analyte ions produced from a matrix based ion source with a directed gas to produce enhanced analyte ions; and(b) detecting said enhanced analyte ions with a detector, wherein the detector includes or is coupled to a mass analyzer. 37. The method of claim 36, further comprising collecting said enhanced analyte ions in a collecting capillary before said enhanced analyte ions are detected. 38. A method for heating analyte ions for detection in a mass spectrometer, comprising:directing a heated gas flow through a conduit to an ion region adjacent to a collecting capillary to heat said analyte ions located in the ion region and increase at least one of an intensity and a number of said analyte ions detected by a detector, wherein the detector includes or is coupled to a mass analyzer. 39. An apparatus that produces enhanced analyte ions for detection by an ion detector, comprising:(a) a matrix based ion source for producing analyte ions;(b) an ion detector downstream from said ion source for detecting enhanced analyte;(c) an ion enhancement system interposed between said matrix based ion source and said ion detector for enhancing said analyte ions; and(d) an ion transport system adjacent to said ion enhancement system for transporting said enhanced analyte ions from said ion enhancement system to said ion detector. 40. An apparatus as recited in claim 39, wherein said ion detector includes a mass analyzer. 41. An apparatus as recited in claim 39, wherein said ion enhancement system comprises a portion of said ion transport system. 42. An apparatus as recited in claim 39, wherein said ion enhancement system encloses a portion of said ion transport system. 43. An apparatus as recited in claim 39, wherein said ion enhancement system comprises a portion of said ion source. 44. An apparatus as recited in claim 39, wherein said ion enhancement system comprises at least one conduit. 45. An apparatus as recited in claim 39, wherein said ion enhancement system comprises at least one gas source. 46. An apparatus as recited in claim 39, wherein said ion transport system comprises at least one collecting capillary. 47. A mass spectrometer comprising:(a) a matrix based ion source for producing analyte ions;(b) an ion detector downstream from said ion source for detecting enhanced analyte ions, the ion detector including or being coupled to a mass analyzer;(c) an ion enhancement system spaced from and interposed between said matrix based ion source and said ion detector for enhancing said analyte ions; and(d) an ion transport system adjacent to said ion enhancement system for transporting enhanced analyte ions from said ion enhancement system to said ion detector. 48. A mass spectrometer as recited in claim 47, wherein said ion enhancement system comprises a conduit. 49. A mass spectrometer as recited in claim 47, wherein said ion enhancement system comprises a gas source. 50. A mass spectrometer as recited in claim 47, wherein said ion transport system comprises a collecting capillary. 51. A method for detecting analyte ions by a mas s spectrometer, comprising:(a) producing analyte ions in a matrix based ion source and discharging said ions to an ion region;(b) enhancing said analyte ions discharged to said ion region with an ion enhancement system; and(c) detecting said enhanced analyte ions with a detector, wherein the detector includes or is coupled to a mass analyzer. 52. A method as recited in claim 51, wherein said analyte ions are enhanced by applying a heated gas to contact said analyte ions. 53. A method as recited in claim 51, wherein said analyte ions are enhanced by a conduit that partially encloses a collecting capillary and provides a heated gas flow. 54. A mass spectrometer as recited in claim 47, wherein said analyte ions are enhanced by applying a heated gas to contact said analyte ions. 55. A mass spectrometer as recited in claim 54, wherein said heated gas is in a temperature range of about 60 degrees Celsius to 150 degrees Celsius. 56. A mass spectrometer as recited in claim 54, wherein said heated gas has a flow rate of approximately 2 liters/minute to 15 liters/minute. 57. A mass spectrometer as recited in claim 47, wherein said ion enhancement system includes a conduit, and the conduit is positioned a distance of about 1 mm to 5 mm from the matrix based ion source. 58. A mass spectrometer as recited in claim 47, wherein:said analyte ions are enhanced by applying a heated gas to contact said analyte ions;said heated gas is in a temperature range of about 60 degrees Celsius to 150 degrees Celsius;said heated gas has a flow rate of approximately 2 liters/minute to 15 liters/minute; andsaid ion enhancement system includes a conduit, and the conduit is positioned a distance of about 1 mm to 5 mm from the matrix based ion source.
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