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The present invention relates to an apparatus and method for use with a mass spectrometer. The ion production and enhancement system of the present invention is used to enhance analyte ions for ease of detection in a mass spectrometer. The method of the invention comprises producing and enhancing an

The present invention relates to an apparatus and method for use with a mass spectrometer. The ion production and enhancement system of the present invention is used to enhance analyte ions for ease of detection in a mass spectrometer. The method of the invention comprises producing and enhancing analyte ions with an ion production and enhancement system and detecting the enhanced analyte ions with a detector.

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1. A matrix based ion source having a target support for providing heat to enhance analyte ions in an ionization region adjacent to a collecting capillary.2. A matrix based ion source as recited in claim 1, wherein said ion source is a matrix-assisted laser desorption ionization (MALDI) ion source.3

1. A matrix based ion source having a target support for providing heat to enhance analyte ions in an ionization region adjacent to a collecting capillary.2. A matrix based ion source as recited in claim 1, wherein said ion source is a matrix-assisted laser desorption ionization (MALDI) ion source.3. An ion source as recited in claim 1, wherein said ion source is a fast atom bombardment (FAB) ion source.4. An ion source as recited in claim 1, wherein said ion source is an atmospheric pressure matrix assisted laser desorption ionization (AP-MALDI) ion source.5. An ion source as recited in claim 1, wherein said ion source is at about atmospheric pressure.6. An ion source as recited in claim 1, wherein said ion source is above atmospheric pressure.7. An ion source as recited in claim 1, wherein said ion source is below atmospheric pressure.8. A mass spectrometer, comprising:(a) a matrix based ion source having a target support designed for heating a target deposited on said target support and producing enhanced analyte ions; (b) a collecting capillary downstream from said matrix based ion source for receiving said enhanced analyte ions produced from said ion source; and (c) a detector downstream from said collecting capillary for detecting said analyte ions enhanced and received by said collecting capillary. 9. A mass spectrometer as recited in claim 8, wherein said ion source is a matrix assisted laser desorption ionization (MALDI) source.10. A mass spectrometer as recited in claim 8, wherein said ion source is a fast atom bombardment (FAB) ion source.11. A mass spectrometer as recited in claim 8, wherein said ion source is an atmospheric pressure matrix assisted laser desorption ionization (AP-MALDI).12. A mass spectrometer as recited in claim 8, wherein said ion source is at about atmospheric pressure.13. A mass spectrometer as recited in claim 8, wherein said ion source is below atmospheric pressure.14. A mass spectrometer as recited in claim 8, wherein said ion source is above atmospheric pressure.15. A mass spectrometer, comprising:(a) a matrix based ion source having a heated target support for producing and discharging analyte ions to a region; (b) a collecting capillary downstream from both said matrix based ion source and said region for receiving said analyte ions produced and discharged from said ion source to said region; (c) a gas source for providing a gas; (d) a conduit for conducting gas from said gas source toward said region and providing ion enhancement to said analyte ions located in said region before said analyte ions enter said collecting capillary; and (e) a detector downstream from said collecting capillary for detecting said analyte ions enhanced and received by said collecting capillary. 16. A mass spectrometer as recited in claim 15, wherein said ion source is a matrix assisted laser desorption ionization (MALDI) source.17. A mass spectrometer as recited in claim 15, wherein said ion source is a fast atom bombardment (FAB) ion source.18. A mass spectrometer as recited in claim 15, wherein said ion source is an atmospheric pressure matrix assisted laser desorption ionization (AP-MALDI).19. A mass spectrometer as recited in claim 15, wherein said ion source is at about atmospheric pressure.20. A mass spectrometer as recited in claim 15, wherein said ion source is below atmospheric pressure.21. A mass spectrometer as recited in claim 15, wherein said ion source is above atmospheric pressure.22. A mass spectrometer as recited in claim 16 or 17, wherein said ion source is below atmospheric pressure.23. A mass spectrometer as recited in claim 16 or 17, wherein said ion source is above atmospheric pressure.24. The mass spectrometer of claim 15, wherein said conduit is selected from the group consisting of a sleeves, transport device, dispenser, nozzle, hose, pipe, port, connector, tube, coupling, container and a housing.25. The mass spectrometer of claim 15, wherein said gas provided by said gas source is heated.26. The mass spectrometer of claim 15, wherein said conduit encloses at least a portion of said collecting capillary.27. The mass spectrometer of claim 26, wherein said conduit enclosing said portion of said collecting capillary defines an annular space for conducting gas flow between said collecting capillary and said conduit.28. The mass spectrometer of claim 15, wherein said conduit is adjacent to said collecting capillary.29. The mass spectrometer of claim 15, wherein said gas carried from said gas source to said region is from 60-150 degrees Celsius.30. The mass spectrometer of claim 16, wherein said gas is selected from the group consisting of nitrogen, fluorine, air, carbon dioxide, argon, xenon and helium.31. The mass spectrometer of claim 16, wherein the volume of said region is from 1-5 mm3.32. The mass spectrometer of claim 16, wherein said gas comprises a monatomic molecule.33. The mass spectrometer of claim 16, wherein said gas comprises a diatomic molecule.34. The mass spectrometer of claim 16, wherein said gas comprises a triatomic molecule.35. The mass spectrometer of claim 16, wherein said gas comprises a polyatomic molecule.36. The mass spectrometer of claim 16, further comprising a main capillary and a coupling, said coupling for joining together said collecting capillary, said conduit, and said main capillary.37. The mass spectrometer of claim 36, wherein said coupling further comprises a housing, a capillary cap and a spacer.38. The mass spectrometer of claim 37, wherein said capillary cap and spacer are disposed in said housing.39. An apparatus, comprising:(a) a matrix based ion source having a heated target support for producing enhanced analyte ions; (b) an ion detector downstream from said ion source for detecting enhanced analyte ions; (c) an ion enhancement system interposed between said matrix based ion source and said ion detector for also enhancing said analyte ions; and (d) an ion transport system adjacent to said ion enhancement system for transporting said enhanced analyte ions from said ion enhancement system to said detector. 40. An apparatus as recited in claim 39, wherein said ion detector comprises a mass analyzer.41. An apparatus as recited in claim 39, wherein said ion enhancement system comprises a portion of said ion transport system.42. An apparatus as recited in claim 39, wherein said ion enhancement system encloses a portion of said ion transport system.43. An apparatus as recited in claim 39, wherein said ion enhancement system comprises a portion of said ion source.44. An apparatus as recited in claim 39, wherein said ion enhancement system comprises at least one conduit.45. An apparatus as recited in claim 39, wherein said ion enhancement system comprises at least one gas source.46. An apparatus as recited in claim 39, wherein said ion transport system comprises at least one collecting capillary.47. A mass spectrometer, comprising:(a) a matrix based ion source having a heated target support for producing analyte ions; (b) an ion detector downstream from said ion source for detecting enhanced analyte ions; (c) an ion enhancement system spaced from and interposed between said matrix based ion source and said ion detector for enhancing said analyte ions; and (d) an ion transport system adjacent to said ion enhancement system for transporting said enhanced analyte ions from said ion enhancement system to said detector detection. 48. A mass spectrometer as recited in claim 47, wherein said ion detector comprises a mass analyzer.49. A mass spectrometer as recited in claim 47, wherein said ion enhancement system comprises a conduit.50. A mass spectrometer as recited in claim 47, wherein said ion enhancement system comprises a gas source.51. A mass spectrometer as recited in claim 47, wherein said ion transport system comprises a collecting capillary.52. A method for producing ions for detection in a mass spectrometer, comprising:(a) heating analyte ions produced from a matrix based ion source with a heated target support and a directed gas to produce enhanced analyte ions; and (b) detecting said enhanced analyte ions. 53. The method of claim 52, further comprising collecting said enhanced analyte ions in a collecting capillary before said enhanced analyte ions are detected.54. A method for producing enhanced analyte ions for detection in a mass spectrometer, comprising heating a target support and the ions present in an ionization region adjacent to a collecting capillary to enhance analyte ions located in the ionization region.55. An apparatus, comprising:(a) an ion production and enhancement system designed for producing and enhancing analyte ions, comprising a heated target support; (b) an ion transport system adjacent to said ion production and enhancement system for transporting said enhanced analyte ions from said ion production and enhancement system; and (c) an ion detector downstream from said ion transport system for detecting analyte ions produced and enhanced by said ion production and enhancement system and transported by said ion transport system. 56. An apparatus as recited in claim 55, wherein said ion production and enhancement system comprises an ion source having a target support designed for beating a target deposited on said support and an ionization region adjacent to said support.57. An apparatus as recited in claim 55, wherein said ion detector is a mass analyzer.58. An apparatus as recited in claim 55, wherein said ion production and enhancement system comprises a portion of said ion transport system.59. An apparatus as recited in claim 55, wherein said ion enhancement system comprises a portion of said ion source.60. A mass spectrometer, comprising:(a) a matrix based ion source having a heated target support; (b) an ion detector downstream from said ion source for detecting analyte ions; (c) an ion enhancement system spaced from and interposed between said matrix based ion source and said ion detector for enhancing said analyte ions; and 6(d) an ion transport system adjacent to said ion enhancement system for transporting said analyte ions from said ion enhancement system to said detector. 61. A mass spectrometer as recited in claim 60, wherein said ion detector comprises a mass analyzer.62. A method for producing ions with a matrix based ion source, comprising:(a) producing analyte ions in an ionization region within said matrix based ion source; (b) enhancing said analyte ions using a heated target support; and (c) detecting said analyte ions with a detector. 63. A method as recited in claim 62, wherein said analyte ions are further enhanced by applying a heated gas to contact said analyte ions.64. A method for producing and enhancing analyte ions in a mass spectrometer, comprising:(a) producing and enhancing said analyte ions with an ion production and enhancement system having a heated target support; and (b) detecting said analyte ions with a detector.