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Optical observation device and method for observing articles at elevated temperatures 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/30
출원번호 US-0630479 (2000-08-02)
발명자 / 주소
  • Chang, Tzyy-Shuh
출원인 / 주소
  • OG Technologies, Inc.
대리인 / 주소
    Dykema Gossett PLLC
인용정보 피인용 횟수 : 8  인용 특허 : 34

초록

An optical system for viewing hot objects is disclosed. The system projects electromagnetic radiation to the part surface and detects the reflected portion. Based on wavelength and/or modulation of the applied illumination, the surface characteristics of the part can be observed without interference

대표청구항

1. An optical system for producing an image of the surface of an object, said object having a characteristic, temperature-dependent, dominant, self-emitted EMR spectrum, comprising:an EMR source for projecting electromagnetic radiation toward said object; an EMR detector for selectively detecting a

이 특허에 인용된 특허 (34)

  1. Fishman Oleg (Dresher PA) Pflug William R. (Mt. Laurel NJ) Sheie Thomas E. (Willingboro NJ), Apparatus and method for controlling the pour of molten metal into molds.
  2. Adams Mark J. (Kennesaw GA) Crisman ; Jr. Elton M. (St. Cloud FL) Khan Asrar A. (Marietta GA), Apparatus and system for thermographic identification of parts.
  3. Ichijima ; Isamu ; Watanabe ; Seiichi ; Miyagawa ; Kazuo, Apparatus for detecting a surface flaw of a material at high temperature.
  4. Gaudin Jean P. (Chassieu FRX), Apparatus for the televisual monitoring of an arc welding operation.
  5. Burkhardt ; Jr. James H. (Knoxville TN) Henry J. James (Oak Ridge TN) Davenport Clyde M. (Knoxville TN), Beam/seam alignment control for electron beam welding.
  6. Lesniak Jon R., Coating tolerant thermography.
  7. Cielo Paolo G. (Montral CAX) Maldague Xavier (Ste-Foy CAX) Krapez Jean C. (Longueuil CAX), Device for subsurface flaw detection in reflective materials by thermal transfer imaging.
  8. Bolstad Jon O. (Idaho Falls ID), Electronic imaging system and technique.
  9. King John D. ; Schuler Frederick J., Fire detection method and apparatus using overlapping spectral bands.
  10. Kremers Jan H. (Boulder Creek CA) Brain Alfred E. (Santa Cruz CA), Image acquisition apparatus and process.
  11. Narita Masaru (Uji JPX), Infrared detector.
  12. Kaneko Akira (Tokyo JPX) Fumoto Teruo (Kanagawa JPX) Nishida Jun (Tokyo JPX), Infrared image pickup image.
  13. Schlagheck Jerry G. (West Chester OH), Infrared inspection system and method employing emissivity indications.
  14. Ashida Eiji (Hitachi JPX) Nihei Masayasu (Hitachi JPX) Wachi Hiroshi (Hitachi JPX) Sato Akira (Takahagi JPX) Kokura Satoshi (Hitachiota JPX), Method and apparatus for automatically controlling arc welding.
  15. Yamane Hirosato (Kurashiki JPX) Hanafusa Hideyuki (Takamatsu JPX), Method and apparatus for detection of surface defects of hot metal body.
  16. Shepard Steven M. (Southfield MI), Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids.
  17. Kychakoff George (Maple Valley WA) Anderson Stephen R. (Kent WA) Acheson Alazel A. (Tacoma WA), Method and apparatus for profiling the bed of a furnace.
  18. Ohno Jiro (Kawasaki JPX) Yashiro Hirokatsu (Kawasaki JPX), Method of and apparatus for imaging surface of object at high temperature.
  19. Baldasarri Giuseppe (Carrollton GA), Method of and apparatus for radiation pyrometric temperature measurement of a continuous cast metal bar.
  20. Nonaka Katsunobu,JPX ; Tanaka Makoto,JPX ; Sekine Kazuyoshi,JPX, Method of detecting defects in materials using infrared thermography.
  21. Corby ; Jr. Nelson R. (Scotia NY) Godwin Stanley J. (Schenectady NY), Method of enhancing weld pool boundary definition.
  22. Yamamoto Tomio (Takamatsu JPX) Hanafusa Hideyuki (Takamatsu JPX) Seno Kouji (Takamatsu JPX) Mihara Toshiro (Tokyo JPX) Ishida Isoshiro (Machida JPX), Method of examining the surface of a continuously cast metal strip for detection of scarfs appearing thereon and apparat.
  23. Hovland Heljar (Asker NOX) Nilsen Jan (Lillesand NOX) Strom Yngve (Osto NOX), Method of flaw detection in billets.
  24. Grow Robert J. ; Grow Richard W. ; Benner Robert E., Non-contact shape meter for flatness measurements.
  25. Zinkosky Alexander J. (Dearborn MI), Non-destructive method for detecting defects in a workpiece.
  26. Ringermacher Harry I. ; Archacki ; Jr. Raymond J. ; Veronesi William A., Nondestructive testing: transient depth thermography.
  27. Richardson Richard W. (Columbus OH), Optical image control for automated arc welding system vision system.
  28. Linger Claude J. A. (Paris FRX) Locicero Gisle C. (Evry FRX), Process for inspecting objects showing patterns with dimensional tolerances and reject criteria varying with the locatio.
  29. Korda Peter B. (Los Angeles CA), Recovery of normally illegible, magnetically recorded information.
  30. Kimura Nobuo (Kobe JPX) Nakai Yasuhide (Amagasaki JPX) Nishimoto Yoshiro (Higashiosaka JPX), Surface inspection system for hot radiant material.
  31. Burgoon Charles E. (Kenosha WI), System and process for video monitoring a welding operation.
  32. Thompson Gary J. (Saugus CA), System and process for video monitoring a welding operation.
  33. Crisman ; Jr. Elton M. (Saint Cloud FL), Thermographic evaluation technique.
  34. Ivancic William A. (Columbus OH) Barnes Russell H. (Columbus OH) Grieser Daniel R. (Columbus OH) Callahan Patrick J. (Lancaster OH), Video fluorescence monitor for determination of spill outlines.

이 특허를 인용한 특허 (8)

  1. Pauly, Gerald W.; Keller, III, Walter J., Advance manufacturing monitoring and diagnostic tool.
  2. Bubb, Stephen K.; Zamierowski, David S., Externally-applied patient interface system and method.
  3. Badawy, Wael; Rahman, Ashiq; Rogers, Shane; Du, Shan, Leak detection.
  4. Vaidya, Nitin M., Method and system for automatic detection of a class of objects.
  5. Vaidya, Nitin M., Method and system for automatic detection of a class of objects.
  6. Lamy,Francis; Pascal,Ghislain; Voisin,Yvon; Diou,Alain, Method for measurement of three-dimensional objects by single-view backlit shadowgraphy.
  7. Choi, Se Ho; Bae, Ho Mun; Hwang, Hwa Won; Park, Chang Hyun, Method for optically detecting surface defect of round wire rod.
  8. Moroli, Valerio, Method for the surface inspection of long products and apparatus suitable for carrying out such a method.
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