IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0118863
(2002-04-09)
|
발명자
/ 주소 |
- Glenn, W. Benjamin
- Verplancken, Donald J.
|
출원인 / 주소 |
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
53 인용 특허 :
158 |
초록
▼
A method for simultaneous deposition of multiple compounds on a substrate is provided. In one aspect, a gas stream is introduced into a processing chamber and flows across a substrate surface disposed therein. The gas stream includes at least one dose of a first compound and at least one dose of a s
A method for simultaneous deposition of multiple compounds on a substrate is provided. In one aspect, a gas stream is introduced into a processing chamber and flows across a substrate surface disposed therein. The gas stream includes at least one dose of a first compound and at least one dose of a second compound. The doses of the first and second compounds are separated by a time delay, and the at least one dose of the first compound and the at least one dose of the second compound are simultaneously in fluid communication with the substrate surface.
대표청구항
▼
1. A method for simultaneous deposition of multiple compounds on a substrate, comprising:flowing a gas stream into a processing chamber and across a substrate surface disposed therein, the gas stream comprising: at least one dose of a first compound; and at least one dose of a second compound, where
1. A method for simultaneous deposition of multiple compounds on a substrate, comprising:flowing a gas stream into a processing chamber and across a substrate surface disposed therein, the gas stream comprising: at least one dose of a first compound; and at least one dose of a second compound, wherein the doses of the first and second compounds are separated by a time delay, and wherein the at least one dose of the first compound and the at least one dose of the second compound are simultaneously in fluid communication with the substrate surface; and depositing the compounds on the substrate surface. 2. The method of claim 1, wherein the gas stream comprises a plurality of doses of a first compound arid a plurality of doses of a second compound.3. The method of claim 1, wherein at least one dose of the first compound and at least one dose of the second compound are simultaneously contained within a volume of the chamber adjacent the substrate surface.4. The method of claim 3, wherein the gas stream propagates radially over the substrate surface.5. The method of claim 1, wherein the first compound adsorbs onto at least a first portion of the substrate surface while the second compound simultaneously adsorbs onto a second portion of the substrate surface.6. The method of claim 1, wherein the first compound contacts a periphery of the substrate surface at the same time as the second compound contacts a central portion of the substrate surface.7. The method of claim 4, wherein the first compound contacts a periphery of the substrate surface simultaneous to the second compound passing a diaphragm of a dosing valve providing the second compound to the substrate surface.8. The method of claim 1, wherein the gas stream further comprises at least one pulse of a non-reactive gas between each pulse of the first and second compounds.9. The method of claim 8, wherein the gas stream forms a repeatable chain of doses of the first compound, the non-reactive gas, the second compound, and the non-reactive gas.10. The method of claim 1, wherein the gas stream further comprises a continuous flow of a non-reactive gas.11. The method of claim 1, wherein the first compound comprises one or more compounds selected from a group consisting of titanium tetrachloride (TiCl4), tungsten hexafluoride (WF8), tantalum pentachloride (TaCl5), titanium iodide (TiI4), titanium bromide (TiBr4)tetrakis (dimethylamido) titanium (TDMAT), pentakis (dimethyl amido) tantalum (PDMAT), tetrakis (diethylamido) titanium (TDEAT), tungsten hexacarbonyl (W(CO)5), tungsten hexachloride (WCl6), tetrakis(diethylamido) titanium (TDEAT), pentakis (ethyl methyl amido) tantalum (PEMAT), and pentakis(diethylamido)tantalum (PDEAT).12. The method of claim 1, wherein the second compound comprises one or more compounds selected from a group consisting of ammonia (NH3), hydrazine (N2H4), monomethyl hydrazine (CH3N2H3), dimethyl hydrazine (C2H6N2H2), t-butylhydrazine (C4H9N2H3), phenylhydrazine (C6H5N2H3), 2,2′-azoisobutane ((CH3)6C2N2), ethylazide (C2H5N3), and nitrogen (N2).13. The method of claim 8, wherein the non-reactive gas comprises hydrogen, nitrogen, argon, helium, and mixtures thereof.14. The method of claim 1, wherein the first compound comprises tungsten hexafluoride (WF6) and the second compound comprises ammonia.15. The method of claim 1, wherein the gas stream further comprises a third compound comprising one or more compounds selected from a group consisting of titanium tetrachloride (TiCl4), tungsten hexafluoride (WF6), tantalum pentachloride (TaCl5), titanium iodide (TiI4), titanium bromide (TiBr4), tetrakis(dimethylamido)titanium (TDMAT), pentakis(dimethyl amido) tantalum (PDMAT), tetrakis(diethylamido)titanium (TDEAT), tungsten hexacarbonyl (W(CO)6), tungsten hexachloride (WCl8), tetrakis(diethylamido) titanium (TDEAT), pentakis (ethyl methyl amido) tantalum (PEMAT), pentakis(diethylamido)tantalum (PDEAT), ammonia (NH3), hydrazine (N2H4), monomethyl hydrazine (CH3N2H3), dimethyl hydrazine (C2H6N2H2), t-butylhydrazine (C4H9N2H3), phenylhydrazine (C6H5N2H3), 2,2′-azoisobutane ((CH3)6C2N2), ethylazide (C2H5N3), and nitrogen (N2).16. A method for simultaneous deposition of multiple compounds on a substrate, comprising:flowing a gas stream into a processing chamber and across a surface substrate disposed therein, the gas stream comprising: at least one dose of a first compound; and at least one dose of a second compound, wherein the doses of the first and second compounds are separated by a time delay, and wherein the first compound adsorbs onto at least a first portion of the substrate surface while the second compound simultaneously adsorbs onto a second portion of the substrate surface. 17. The method of claim 16, wherein the first compound contacts a periphery of the substrate surface at the same time as the second compound contacts a central portion of the substrate surface.18. The method of claim 16, wherein at least one dose of the first compound and at least one dose of the second compound are simultaneously contained within a volume of the chamber adjacent the substrate surface.19. The method of claim 16, wherein the first compound contacts a periphery of the substrate surface simultaneous to the second compound passing a diaphragm of a dosing valve providing the second compound to the substrate surface.20. The method of claim 16, wherein the gas stream further comprises at least one pulse of a non-reactive gas between each pulse of the first and second compounds.21. The method of claim 20, wherein the gas stream forms a repeatable chain of doses of the first compound, the non-reactive gas, the second compound, and the non-reactive gas.22. The method of claim 16, wherein the gas stream further comprises a continuous flow of a non-reactive gas.23. A method for simultaneous deposition of multiple compounds on a substrate, comprising:flowing a gas stream into a processing chamber and across a surface of a substrate disposed therein, the gas stream comprising: at least one dose of a first compound; and at least one dose of a second compound, whereby the doses of the first and second compounds are separated by a time delay; wherein the first compound and the second compound form a repeatable chain of compounds simultaneously contained within a reaction zone of the processing chamber, the reaction zone comprising a volume between each dosing valve providing the compounds and the substrate that is in fluid communication with the substrate surface; and depositing the compounds on the substrate surface. 24. The method of claim 23, wherein the reaction zone includes a volume adjacent a diaphragm of each dosing valve.25. The method of claim 24, wherein the first compound contacts a periphery of the substrate surface simultaneous to the second compound passing the diaphragm of the dosing valve providing the second compound to the substrate surface.26. The method of claim 23, wherein the gas stream further comprises at least one pulse of a non-reactive gas between each pulse of the first and second compounds.27. The method of claim 26, wherein the gas stream forms a repeatable chain of doses of the first compound, the non-reactive gas, the second compound, and the non-reactive gas.28. The method of claim 23, wherein the gas stream further comprises a continuous flow of a non-reactive gas.29. A method for simultaneous deposition of multiple compounds on a substrate, comprising:flowing a gas stream into a processing chamber and across an exposed face of a substrate supported therein for processing, the gas stream comprising: at least one dose of a first compound or precursor thereof; and at least one dose of a second compound or precursor thereof, said doses of first and second compounds being separated by a time delay; wherein the respective durations of said first and second compound doses and said time delay being are such that said first compound and said second compound are adsorbed simultaneously at respective different locations on the face of the substrate. 30. The method of claim 29, wherein at least one dose of said first compound and at least one dose of the second compound are simultaneously contained within a volume of the chamber adjacent the substrate face.31. The method of claim 29, wherein the gas stream further includes a nonreactive gas.32. The method of claim 31, wherein the nonreactive gas component is continuously flowed.33. The method of claim 31, wherein the gas steam includes at least one dose of a nonreactive gas between respective doses of said first and second compounds.34. The method of claim 29, wherein said gas stream propagates radially over the exposed face of the substrate.35. The method of claim 34, wherein the gas stream propagates over the exposed face of the substrate in a direction parallel to one of the diameters of the substrate.36. The method of claim 1, wherein the doses of the first compound and the second compound at least partially overlap to co-react the compounds.37. The method of claim 16, wherein the doses of the first compound and the second compound at least partially overlap to co-react the compounds.38. The method of claim 23, wherein the doses of the first compound and the second compound at least partially overlap to co-react the compounds.39. The method of claim 29, wherein the doses of the first compound and the second compound at least partially overlap to co-react the compounds.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.