[특허]Bio electron microscope and observation method of specimen

Hitachi, Ltd.; Hitachi High-Technologies Corporation

검색어에 아래의 연산자를 사용하시면 더 정확한 검색결과를 얻을 수 있습니다.
검색연산자

검색도움말
검색연산자	기능	검색시 예
()	우선순위가 가장 높은 연산자	예1) (나노 (기계 \| machine))
공백	두 개의 검색어(식)을 모두 포함하고 있는 문서 검색	예1) (나노 기계) 예2) 나노 장영실
\|	두 개의 검색어(식) 중 하나 이상 포함하고 있는 문서 검색	예1) (줄기세포 \| 면역) 예2) 줄기세포 \| 장영실
!	NOT 이후에 있는 검색어가 포함된 문서는 제외	예1) (황금 !백금) 예2) !image
*	검색어의 *란에 0개 이상의 임의의 문자가 포함된 문서 검색	예) semi*
""	따옴표 내의 구문과 완전히 일치하는 문서만 검색	예) "Transform and Quantization"

과학기술 지식인프라 ScienceON

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

특허 상세정보

MyON담기

내보내기 페이스북 공유 트위터 공유 카카오톡 공유

Bio electron microscope and observation method of specimen

특허상세정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	H01J-049/44
미국특허분류(USC)	250/311; 250/305
출원번호	US-0621444 (2003-07-18)
우선권정보	JP-0002724 (2003-01-09)
발명자 / 주소	Kakibayashi, Hiroshi Hosoki, Shigeyuki Takagi, Yuji Miyake, Ryo Nakamura, Kuniyasu Sato, Mitsugu Kobayashi, Hiroyuki
출원인 / 주소	Hitachi, Ltd. Hitachi High-Technologies Corporation
대리인 / 주소	Antonelli, Terry, Stout &
인용정보	피인용 횟수 : 51 인용 특허 : 3

초록
▼

A bio electron microscope and an observation method which can observe a bio specimen by low damage and high contrast to perform high-accuracy image analysis, and conduct high-throughput specimen preparation. 1) A specimen is observed at an accelerating voltage 1.2 to 4.2 times a critical electron accelerating voltage possible to transmit a specimen obtained under predetermined conditions. 2) An electron energy filter of small and simplified construction is provided between the specimen and an electron detector for imaging by the electron beam in a specified energy region of the electron beams transmitting the specimen. 3) Similarity between an observed image such as virus or protein in the specimen and a reference image such as known virus or protein is subjected to quantitative analysis by image processing. 4) A preparation protocol of the bio specimen is made into a chip using an MEMS technique, which is then mounted on a specimen stage part of an electron microscope to conduct specimen introduction, preparation and transfer onto a specimen holder.

대표
청구항
▼

1. A bio electron microscope wherein in an electron microscope having an electron illumination system converging or collimating an accelerated elctron beam to irradiate it onto a specimen and an imaging system detecting an electron transmitting the specimen or a secondary electron and a reflected electron emitted from the surface of the specimen to obtain a magnified image, an electron energy filter is provided between an electron detector of the imaging system which detects an electron beam transmitting the specimen and the specimen, and wherein in an image analysis part and an image display part, an observed image of virus or protein included in the specimen and a reference image of known virus or protein are compared and subjected to quantitative analysis using image processing software, and the species of virus or protein or the species of a substance in the specimen is identified as a result of the comparison so as to display the result.2. The bio electron microscope according to claim 1, wherein to set an accelerating voltage of an electron beam irradiated onto said specimen to a desired value, at least one of an emission current of an electron gun, an exciting current of electron lenses in illumination and imaging system and an electron beam apertures position which are optimum to the accelerating voltage is held as a recipe in a controlling computer.3. A bio electron microscope wherein in an electron microscope having an electron illumination system converging or collimating an accelerated electron beam to irradiate it onto a specimen and an imaging system detecting an electron transmitting the specimen or a secondary electron and a reflected electron emitted from the surface of the specimen to obtain a magnified image, an electron energy filter is provided between an electron detector of the imaging system which detects an electron beam transmitting the specimen and the specimen, wherein chip-like specimen preparation equipment using an MEMS (Micro Electro Mechanical Systems) technique is mounted on a specimen stage part.4. The bio electron microscope according to claim 3, wherein to set an accelerating voltage of an electron beam irradiated onto said specimen to a desired value, at least one of an emission current of an electron gun, an exciting current of electron lenses in illumination and imaging system and an electron beam apertures position which are optimum to the accelerating voltage is held as a recipe in a controlling computer.5. An observation method utilizing a bio electron microscope, comprising the steps of:irradiating an accelerated electron beam to a specimen by an electron illumination system including at least an electron gun, a scanning coil, a plurality of lenses and an electron beam aperture; detecting at least one of a secondary electron, a reflected electron and a transmission electron generated by the irradiation of the electron beam to the specimen; obtaining an image in accordance with the detected electron; and controlling an accelerating voltage of the electron gun based on information of a recipe server storing at least one of recipes including a recipe of an emission current of the electron gun, a recipe of an exciting current of one of the plurality of lenses, and a recipe of a position of the electron beam aperture. 6. An observation method according to claim 5, wherein the step of irradiating includes utilizing different accelerating voltages for irradiating the accelerated electron beam to the specimen; andfurther comprising a step for determining a critical electron accelerating voltage by comparing an image obtained when the accelerating voltage of the electron beam is 30 kV and an image obtained when the accelerating voltage of the electron beam is under 30 kV; wherein the step for controlling utilizes controlling the accelerating voltage in a range of 1.2 to 2.4 times of a critical electron accelerating voltage; wherein the critical electron accelerating voltage is defined as a voltage in which at least one of a resolution power of the image is lowered to one third of a resolution power of the image obtained when an accelerating voltage is 30 kV and a contrast of the image is lowered to one twentieth of a contrast of the image obtained when an accelerating voltage is 30 kV. 7. An observation method according to claim 5, wherein the step of irradiating includes utilizing different accelerating voltages for irradiating the accelerated electron beam to the specimen;further comprising a step for determining a critical electron accelerating voltage by comparing an image obtained when the accelerating voltage of the electron beam is 30 kV and an image obtained when the accelerating voltage of the electron beam is under 30 kV; the step for controlling includes controlling the accelerating voltage to a minimum accelerating voltage; wherein the minimum accelerating voltage is defined as a voltage in which substantially a same resolution power and contrast of an image is obtainable as a resolution power and contrast of an image obtained when the accelerating voltage is 30 kV. 8. An observation method according to claim 5, further comprising the steps of:comparing an observed image and a reference image to quantitatively analyze a similarity between the observed image and the reference image; and identifying at least one of a species of virus, a species of protein and a species of a substance included in the specimen based on a result of the comparison. 9. An observation method according to claim 5, wherein chip-like specimen preparation equipment using an MEMS (Micro Electro Mechanical Systems) technique is mounted on a sample stage for holding the specimen.10. A bio electron microscope comprising:an electron illumination system including an electron gun, a scanning coil, a plurality of lenses and an electron beam aperture; a specimen holder for mounting a specimen; an imaging system for obtaining an image, including a detector for detecting at least one of secondary electron, a reflected electron and a transmission electron generated by irradiation of an electron beam to the specimen; a recipe server for storing at least one of recipes including a recipe of an emission current of said electron gun, a recipe of an exciting current of one of the plurality of lenses and a recipe of a position of the electron beam aperture; and a controlling computer for controlling an accelerating voltage of the electron gun based on information stored in the recipe server. 11. A bio electron microscope according to claim 10, further comprising:an image analyzing part that compares at least one of a resolution power of images and a contrast of images; wherein the image analyzing part determines a critical electron accelerating voltage defined as at least one of a voltage in which a resolution power of the image is lowered to one third of resolution power of the image obtained when an accelerating voltage is 30 kV and a contrast of the image is lowered to one twentieth of a contrast of the image obtained when an accelerating voltage is 30 kV; and wherein the controlling computer controls the accelerating voltage in a range of 1.2 to 2.4 times of the critical electron accelerating voltage. 12. A bio electron microscope according to claim 10, further comprising:an image analyzing part that compares at least one of a resolution power of images and a contrast of images; wherein the image analyzing part determines a minimum accelerating voltage defined as a voltage in which substantially a same resolution power and contrast of an image is obtainable as a resolution power and contrast of an image obtained when the accelerating voltage is 30 kV; and wherein the controlling computer controls the accelerating voltage to the minimum accelerating voltage. 13. A bio electron microscope according to claim 10, wherein the controlling computer includes a comparator which compare an observed image and a reference image and identifies at least one of a species of a virus, a species of protein and a species of a substance included in the specimen as a result of the comparison.14. A bio electron microscope according to claim 10, further comprising chip-like specimen preparation equipment using an MEMS (Micro Electron Mechanical Systems) technique.

이 특허에 인용된 특허 (3)

이 특허를 인용한 특허 피인용횟수: 51

IPC 상위 출원인

내보내기

상세정보
내보내기 구분	파일저장 인쇄 메일전송
구성항목	관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
메일정보	받는사람 (필수) @ 보내는사람 (선택) @ 제목 내용 KISTI 검색결과 이메일 서비스
안내	> 총 건의 자료가 검색되었습니다. > 다운받으실 자료의 인덱스를 입력하세요. (1-10,000) > 검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다. > 데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요) > 다운로드 파일은 UTF-8 형태로 저장됩니다. 파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오 > ~ > Text(ASCII format) Excel format

과학기술 지식인프라 ScienceON

ScienceON Chatbot

연합인증

특허 상세정보

Bio electron microscope and observation method of specimen

초록
▼

대표
청구항
▼

이 특허에 인용된 특허 (3)

이 특허를 인용한 특허 피인용횟수: 51

IPC 상위 출원인

과제정보

상세정보조회

원문조회

IPC 상세정보(version : 201201)

연구과제 성과물(0)

참여연구원의 다른 문헌(0)

처리중입니다.

잠시만 기다려주세요.

ScienceON Chatbot

연합인증

특허 상세정보

Bio electron microscope and observation method of specimen

초록 ▼

대표청구항 ▼

이 특허에 인용된 특허 (3)

이 특허를 인용한 특허 피인용횟수: 51

IPC 상위 출원인

과제정보

상세정보조회

원문조회

IPC 상세정보(version : 201201)

연구과제 성과물(0)

참여연구원의 다른 문헌(0)

처리중입니다.

잠시만 기다려주세요.

초록
▼

대표
청구항
▼