초록 ▼

A voltage reference is dynamically and digitally controlled by a digital function. The digital function may be implemented as a digital calculation or look up table. Inputs to the function include a modifiable trim value stored in a trim register, and a substrate temperature value. The preset value

A voltage reference is dynamically and digitally controlled by a digital function. The digital function may be implemented as a digital calculation or look up table. Inputs to the function include a modifiable trim value stored in a trim register, and a substrate temperature value. The preset value of the trim register is a trim preset value generated by cutting fuses and/or leaving fuses uncut. The cutting may be performed using laser trimming-devices. The output of the digital function is a corrected reference trim value that controls the gain of a voltage reference amplifier whose input is a band gap based voltage reference, and whose output is a derived voltage reference. The substrate temperature value is provided by a monolithic temperature monitor whose sensor may be on the same die as the derived voltage reference. The derived voltage reference provides a stable reference voltage that is dynamically and digitally controllable, to a host system that requires a voltage reference.

대표청구항 ▼

1. A method for digitally controlling a voltage reference, the method comprising:obtaining an original voltage reference; generating a trim preset value by performing an initial trimming of the original voltage reference; generating an intermediate trim value based on the preset trim value; generati

1. A method for digitally controlling a voltage reference, the method comprising:obtaining an original voltage reference; generating a trim preset value by performing an initial trimming of the original voltage reference; generating an intermediate trim value based on the preset trim value; generating a corrected reference trim value, based on the intermediate trim value and a substrate temperature value; and setting a gain for a voltage reference amplifier, based on the corrected reference trim value; wherein said generating the corrected reference trim value is a digitally implemented function; wherein an input of the voltage reference amplifier is the original voltage reference; and wherein an output of the voltage reference amplifier is a derived voltage reference. 2. The method of claim 1 further comprising deriving the original voltage reference from a band gap reference.3. The method of claim 1, wherein said performing the initial trimming of the original voltage reference comprises one of:cutting one or more of a plurality of fuses; and cutting none of the plurality of fuses. 4. The method of claim 3, wherein said cutting of one or more of the plurality of fuses is accomplished with the use of a laser trimming-device.5. The method of claim 3 further comprising the plurality of fuses controlling a preset value of a storage element.6. The method of claim 5, wherein the storage element is a register.7. The method of claim 5, wherein the storage element is a non-volatile memory.8. The method of claim 5, wherein the preset value of the storage element is set to the trim preset value.9. The method of claim 5 further comprising the storage element being read from and written to by one or more of:a host system; and a tester. 10. The method of claim 5 further comprising:storing the intermediate trim value in the storage element; and providing the intermediate trim value as an output of the storage element. 11. The method of claim 1, wherein said generating the trim preset value is performed to a default temperature value.12. The method of claim 1, wherein said generating the intermediate trim value is performed to an operating temperature range.13. The method of claim 1 further comprising:a monolithic temperature-monitor measuring the substrate temperature value; and the monolithic temperature-monitor providing the substrate temperature value as an input to the digital function. 14. The method of claim 13, wherein a sensor of the monolithic temperature-monitor is on the same die as the derived voltage reference.15. A digitally adjusted voltage reference system, the system comprising:an original voltage reference; a storage element; a digital function block; and a voltage reference amplifier; wherein the storage element is operable to store an intermediate trim value; wherein the digital function block is operable to receive the intermediate trim value; wherein an input of the voltage reference amplifier is the original voltage reference; wherein the digital function block generates one or more control signals to control a gain of the voltage reference amplifier; and wherein an output of the voltage reference amplifier is a derived voltage reference. 16. The system of claim 15, wherein the original voltage reference is derived from a band gap reference.17. The system of claim 15 further comprising a plurality of fuses;wherein each fuse of the plurality of fuses is coupled to a respective preset and/or reset input of the storage element; wherein a trim preset value is generated by performing one of: cutting one or more of the plurality of fuses; and cutting none of the plurality of fuses; and wherein the storage element is operable to receive the trim preset value as an initial value. 18. The system of claim 17, wherein said cutting one or more of the plurality of fuses is accomplished with the use of a laser trimming-device.19. The system of claim 15 further comprising a monolithic temperature-monitor;wherein the monolithic temperature-monitor is operable to measure the substrate temperature value; and wherein the monolithic temperature-monitor is operable to provide the substrate temperature value as an input to the digital function block. 20. The system of claim 19, wherein a sensor of the monolithic temperature-monitor is on the same die as the derived voltage reference.21. The system of claim 15, wherein the storage element is operable to be read from and written to by one or more of:a host system; and a tester. 22. The system of claim 15, wherein the digital function block comprises one or more algorithms implemented in hardware.23. The system of claim 15, wherein the digital function block obtains its output values from one or more lookup tables.24. The system of claim 15, wherein the digital function block is user programmable.25. The system of claim 15, wherein the storage element comprises one or more D flip-flops.26. The system of claim 15, wherein the storage element comprises non-volatile memory.