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Ion beam scanner system and operating method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G21K-001/00
  • G21K-001/02
  • G21K-001/04
  • H01J-029/46
  • H01J-005/18
출원번호 US-0890897 (2000-02-11)
우선권정보 DE-0007098 (1999-02-19)
국제출원번호 PCT/EP00/01149 (2001-11-02)
§371/§102 date 20011102 (20011102)
국제공개번호 WO00/49624 (2000-08-24)
발명자 / 주소
  • Kraft, Gerhard
  • Weber, Ulrich
출원인 / 주소
  • Gesellschaft fuer Schwerionenforschung mbH
대리인 / 주소
    Frommer Lawrence &
인용정보 피인용 횟수 : 164  인용 특허 : 15

초록

The invention relates to an ion beam scanning system having an ion source device, an ion acceleration system and an ion beam guidance system comprising an ion beam outlet window for a converging centered ion beam, and a mechanical alignment system for the target volume to be scanned. For that purpos

대표청구항

1. An ion beam scanning system having an ion source device, an ion accelerator system that can be set to an acceleration of ions required to obtain a maximum depth of penetration, and an ion beam guidance system (1) comprising an ion beam outlet window (2) for a converging centred ion beam (3), and

이 특허에 인용된 특허 (15)

  1. Britton Barrie G. (Riverside CA) Lesyna David A. (Redlands CA) Slater Jon W. (Redlands CA), Beamline control and security system for a radiation treatment facility.
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