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Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01R-012/00
출원번호 US-0684094 (2003-10-10)
발명자 / 주소
  • Dozier, II, Thomas H.
  • Eldridge, Benjamin N.
  • Grube, Gary W.
  • Khandros, Igor Y.
  • Mathieu, Gaetan L.
출원인 / 주소
  • FormFactor, Inc.
인용정보 피인용 횟수 : 95  인용 특허 : 84

초록

Surface-mount, solder-down sockets are described which permit electronic components such as semiconductor packages to be releasably mounted to a circuit board. Generally, the socket includes resilient contact structures extending from a top surface of a support substrate, and solder-ball (or other s

대표청구항

1. A socket for receiving a first electronic component, said socket comprising:a support substrate; a plurality of elongate, resilient first contact structures extending from a first side of said support substrate and disposed to contact said first electronic component; a plurality of second contact

이 특허에 인용된 특허 (84)

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  59. Geib James F. (Smithfield RI), Minimum insertion force self-cleaning anti-overstress PLCC receiving socket.
  60. Hopkins John R. (Cambridge MD) Ritchie Leon T. (Clearwater FL), Multi terminal low insertion force connector.
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  62. Pai Deepak K. (Burnsville MN) Krinke Terrance A. (Roseville MN), Plated compliant lead.
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  81. Mizukoshi Masataka (Kawasaki JPX), Three-dimensional multi-chip module.
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  83. Loo Mike C. (San Jose CA) Conte Alfred S. (Hollister CA), Upgradable multi-chip module.
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이 특허를 인용한 특허 (95)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
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  5. Pendse, Rajendra D., Bump-on-lead flip chip interconnection.
  6. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  7. Owen, Peter; Zeglin, Conrad; Roman, Barclay; Meister, Mark, Carrier for mounting a piezoelectric device on a circuit board and method for mounting a piezoelectric device on a circuit board.
  8. Hejase, Jose A.; Becker, Wiren D.; Dreps, Daniel; Chun, Sungjun; Beaman, Brian, Connector having a body with a conductive layer common to top and bottom surfaces of the body as well as to wall surfaces of a plurality of holes in the body.
  9. Takai,Daisuke, Contact structure and manufacturing method thereof, and electronic member to which the contact structure is attached and manufacturing method thereof.
  10. Canella,Robert L., Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate.
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  22. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
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  26. Schamberger,Florian; Sommer,Michael Bernhard; Baenisch,Andreas, Means of mounting for electronic components, arrangement and procedure.
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  29. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  30. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
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  38. Gleason,K. Reed; Smith,Kenneth R.; Bayne,Mike, Membrane probing system with local contact scrub.
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  95. Campbell, Richard, Wideband active-passive differential signal probe.
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