A method of fabricating a semiconductor structure. According to one aspect of the invention, on a first semiconductor substrate, a first compositionally graded Si1-xGex buffer is deposited where the Ge composition x is increasing from about zero to a value less than about 20%. Then a first etch-stop
A method of fabricating a semiconductor structure. According to one aspect of the invention, on a first semiconductor substrate, a first compositionally graded Si1-xGex buffer is deposited where the Ge composition x is increasing from about zero to a value less than about 20%. Then a first etch-stop Si1-yGey layer is deposited where the Ge composition y is larger than about 20% so that the layer is an effective etch-stop. A second etch-stop layer of strained Si is then grown. The deposited layer is bonded to a second substrate. After that the first substrate is removed to release said first etch-stop Si1-yGey layer. The remaining structure is then removed in another step to release the second etch-stop layer. According to another aspect of the invention, a semiconductor structure is provided. The structure has a layer in which semiconductor devices are to be formed. The semiconductor structure includes a substrate, an insulating layer, a relaxed SiGe layer where the Ge composition is larger than approximately 15%, and a device layer selected from a group consisting of, but not limited to, strained-Si, relaxed Si1-yGey layer, strained S1-zGez layer, Ge, GaAs, III-V materials, and II-VI materials, where Ge compositions y and z are values between 0 and 1.
대표청구항▼
1. A semiconductor structure that includes a monocrystalline semiconductor substrate, said semiconductor structure comprising:a first compositionally graded Si1-xGex buffer where x increases from about zero to a value less than about 0.2; a uniform Si1-yGey layer where y is larger than about 0.2; an
1. A semiconductor structure that includes a monocrystalline semiconductor substrate, said semiconductor structure comprising:a first compositionally graded Si1-xGex buffer where x increases from about zero to a value less than about 0.2; a uniform Si1-yGey layer where y is larger than about 0.2; and a second compositionally graded Si1-zGez buffer where z decreases from about 0.2 to a value less tan 0.2. 2. A semiconductor etch-stop layer structure comprising:a monocrystalline semiconductor substrate; a compositionally graded Si1-xGx buffer where x increases from about zero to a value less than about 0.2; a first etch-stop Si1-yGey layer where y is larger than about 0.2; a second etch-stop layer of strained Si; and between said first and second etch-stop layers, one or more material layers selected from the group consisting of, but not limited to, a compositionally graded Si1-zGez buffer where z increases from about 0.2 to a value substantially higher than 0.2, a second compositionally graded Si1-xGex buffer where x decreases from about 0.2 to a smaller value, a relaxed Si1-yGey layer where y is a value between 0 and 1, a strained Si1-zGez layer where z is a value between 0 and 1, a GaAs layer, a III-V material layer, and a II-VI material layer. 3. A semiconductor structure having a layer in which semiconductor devices are to be formed, said semiconductor structure comprising:a substrate; an insulating layer over the substrate; a relaxed SiGe layer having a Ge composition larger than approximately 15% over the insulating layer; and over the relaxed SiGe layer, a device layer selected from a group consisting of, but not limited to, a relaxed Si1-yGey layer where y is between 0 and 1, Ge, GaAs, III-V materials, and II-VI materials. 4. The structure of claim 3, wherein said substrate is a Si substrate.5. The structure of claim 3, wherein said insulating layer is an oxide.6. The structure of claim 2 wherein the one or more material layers comprise a compositionally graded Si1-zGez buffer where z increases from about 0.2 to a value substantially higher than 0.2.7. The structure of claim 2 wherein the one or more material layers comprise a second compositionally graded Si1-xGex buffer where z increases from about 0.2 to a value substantially higher than 0.2.8. The structure of claim 2 wherein the one or more material layers comprise a relaxed Si1-yGey layer where y is a value between 0 and 1.9. The structure of claim 2 wherein the one or more material layers comprise a GaAs layer.10. The structure of claim 2 wherein the one or more material layers comprise a III-V material layer.11. The structure of claim 2 wherein the one or more material layers comprise a II-VI material layer.12. The structure of claim 3 wherein the device layer comprises a relaxed Si1-yGey layer where y is between 0 and 1.13. The structure of claim 3 wherein the device layer comprises Ge.14. The structure of claim 3 wherein the device layer comprises GaAs.15. The structure of claim 3 wherein the device layer comprises a III-V material.16. The structure of claim 3 wherein the device layer comprises a II-VI material.
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