초록 ▼

A probe card has probe sections with silicon probes formed on an insulated circuit board that are connected by an adhesive on the supporting structures. The supporting structures are supported by fixing structures with each of the fixing structures being fixed on the circuit board. The probe card ha

A probe card has probe sections with silicon probes formed on an insulated circuit board that are connected by an adhesive on the supporting structures. The supporting structures are supported by fixing structures with each of the fixing structures being fixed on the circuit board. The probe card has the probe section's wiring and the circuit board's wiring being electrically connected by a metallic wiring and the sub printed circuit and the pogo pin electrically connected by an anisotropic conducting film with the sub printed circuit board and the pogo pin. A metallic layer is formed by the plating of the probe in the probe section. This reduces the manufacturing costs by enabling the damaged probes during manufacturing to be discarded and the others being used continually.

대표청구항 ▼

1. A probe card structure comprising:a probe section having an insulated circuit board, a probe of silicon material formed on said insulated circuit board for contacting a pad of a device to be measured, and a conductive wiring in electrical communication with said probe and disposed on said insulat

1. A probe card structure comprising:a probe section having an insulated circuit board, a probe of silicon material formed on said insulated circuit board for contacting a pad of a device to be measured, and a conductive wiring in electrical communication with said probe and disposed on said insulated circuit board; a supporting structure for supporting said probe section; a fixing structure for fixing a plurality of said supporting structures together; a printed circuit having a conductive wiring connected to said fixing structure, said printed circuit being electrically connected to a measurement device for transmitting a measurement signal to said device being measured; a wiring connection for electrically connecting said conductive wiring of said probe and said conductive wiring in communication with said printed circuit, wherein said conductive wiring of said probe section and said conductive wiring of said printed circuit are electrically connected by a sub printed circuit, said sub printed circuit being selected from the group consisting of a flexible printed circuit, a rigid printed circuit board, and any combinations thereof; and a contact pad of said sub printed circuit and a contact pad of said insulated circuit board being electrically connected by perpendicular conductor of silicon rubber material for conducting electricity between a top surface and a bottom surface through a plurality of vertically embedded metallic wires having a diameter of 35 μm or less, wherein said plurality of vertically embedded metallic wires are positioned in an array of a 0.07 through 0.45 mm matrix.