|국가/구분||United States(US) Patent 등록|
|발명자 / 주소|
|인용정보||피인용 횟수 : 3 인용 특허 : 34|
A filament assembly configured for generating electrons and including nanoparticles and/or nanofilaments. The filament assembly is optionally incorporated an analytical systems such as a mass analyzer or x-ray source. The nanoparticles and/or nanofilaments are configured to produce improved electron generation, thermal stability, and/or other properties relative to the prior art. Methods of using the filament assembly are described.
1. A mass analyzer comprising an electron source, the electron source including:an electron filament coupled to an electrical supply, the electron filament including a conductive wire or conductive ribbon, the electron filament configured to generate electrons when heated and configured to generate electrons while a background pressure in the source is greater than 1.0×10?5 Torr;a plurality of nanofilaments disposed on the surface of the electron filament; anda filament body for positioning the electron filament relative to a mass filter.2. The mass anal...