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A method comprising introducing an interconnect structure in an opening through a dielectric over a contact point, and introducing a conductive shunt material through a chemically-induced oxidation-reduction reaction. A method comprising introducing an interconnect structure in an opening through a

A method comprising introducing an interconnect structure in an opening through a dielectric over a contact point, and introducing a conductive shunt material through a chemically-induced oxidation-reduction reaction. A method comprising introducing an interconnect structure in an opening through a dielectric over a contact point, introducing a conductive shunt material having an oxidation number over an exposed surface of the interconnect structure, and reducing the oxidation number of the shunt. An apparatus comprising a substrate comprising a device having contact point, a dielectric layer overlying the device with an opening to the contact point, and an interconnect structure disposed in the opening comprising an interconnect material and a different conductive shunt material.

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1. A method comprising:introducing a barrier material in an opening through a dielectric over a contact point; introducing a conductive shunt material on the barrier material through a chemically-induced oxidation-reduction reaction; forming an interconnect structure in the opening over the conducti

1. A method comprising:introducing a barrier material in an opening through a dielectric over a contact point; introducing a conductive shunt material on the barrier material through a chemically-induced oxidation-reduction reaction; forming an interconnect structure in the opening over the conductive shunt material; and forming a conductive shunt structure over an exposed portion of the interconnect structure through a chemically-induced oxidation-reduction reaction. 2. The method of claim 1, wherein forming the shunt structure comprises introducing a shunt material precursor in the presence of an alkaline metal-free reducing agent in the presence of a non-metallic chelating agent.3. The method of claim 1, further comprising:forming the shunt structure in an alkaline environment with a pH adjusted by an alkaline metal-free pH adjuster. 4. The method of claim 1, further comprising:prior to forming the shunt structure, modifying the exposed surface of the interconnect structure. 5. The method of claim 4, wherein modifying the surface of the interconnect structure comprises one of stripping with a stripping agent and doping with a dopant.6. The method of claim 1, wherein forming the interconnect structure comprises:introducing a seed material on the conductive shunt material; and introducing interconnect material on the seed material. 7. The method of claim 6, wherein forming the interconnect structure further includes introducing a seed material following the introduction of the barrier material.8. The method of claim 6, wherein the opening through the dielectric material comprises a via having a cross-sectional area and a volume, and a trench to the via having a cross-sectional area greater than the cross-sectional area of the via, and introducing the shunt material precursor comprises introducing the shunt material precursor in an amount such that the shunt structure thus formed substantially fills the volume of the via.9. The method of claim 1, wherein forming the shunt structure comprises:placing a substrate comprising the interconnect structure in a bath comprising the shunt material precursor. 10. The method of claim 9, further comprising, prior to placing the substrate in the bath, protecting a portion of the substrate to exposure to the components of the bath.11. The method of claim 1, wherein forming the shunt structure comprises:dispensing the shunt material precursor onto the interconnect structure. 12. The method of claim 1, wherein forming the shunt structure comprises:placing a substrate comprising the interconnect structure in a wafer scrubber; and while in the wafer scrubber exposing the interconnect structure to the shunt material precursor. 13. A method comprising:introducing a conductive shunt material in an opening through a dielectric to a contact point, wherein the opening defines a via having a cross-sectional area and a volume, and a trench to the via having a cross-sectional area greater than the cross-sectional area of the via; introducing an interconnect structure material on the conductive shunt material; introducing a conductive shunt material precursor having an oxidation number on an exposed surface of the interconnect structure; and reducing the oxidation number of the shunt material precursor. 14. The method of claim 13, further comprising prior to reducing the oxidation number of the shunt material precursor, introducing a reducing agent.15. The method of claim 14, wherein the reducing agent comprises an alkaline metal-free material.16. The method of claim 13, further comprising:reducing the oxidation number of the shunt material precursor in the presence of a non-metallic chelating agent. 17. The method of claim 13, further comprising:reducing the oxidation number of the shunt material precursor in an alkaline environment. 18. The method of claim 13, further comprising:prior to introducing the shunt material precursor, modifying the exposed surface of the interconnect structure. 19. The method of claim 18, wherein modifying the surface of the interconnect comprises one of stripping with a stripping agent and doping with a dopant.20. The method of claim 13, wherein introducing the interconnect structure comprises introducing a barrier material and an interconnect material.21. The method of claim 20, wherein introducing the interconnect structure material further includes introducing a seed material following the introduction of the barrier material.22. The method of claim 20, wherein introducing the shunt material comprises introducing the shunt material to substantially fill the volume of the via.23. A method, comprising:forming a via in a dielectric material to expose a contact point; forming a trench in a portion of the dielectric material over the via; introducing a conductive shunt material precursor in the via in an amount to substantially fill a volume of the via through a chemically induced oxidation-reduction reaction; and forming an interconnect structure in the trench and on the conductive material over the via. 24. The method of claim 23, further comprising:forming a conductive shunt structure on an exposed portion of the interconnect structure through a chemically-induced oxidation-reduction reaction. 25. The method of claim 23, wherein forming the interconnect structure comprises:introducing a barrier material along sidewalls and a base of the trench overlying the via; and introducing an interconnect material on the barrier material to substantially fill a volume of the trench. 26. The method of claim 23, wherein forming the interconnect structure comprises:introducing a barrier material along sidewalls and a base of the trench overlying the via; introducing a conductive shunt material on the barrier material through a chemically induced oxidation-reduction reaction; introducing a seed material on the conductive shunt material; and introducing an interconnect material over the seed material to substantially fill a volume of the trench.