IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0878051
(2001-06-07)
|
발명자
/ 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
55 |
초록
▼
Rendering a three-dimensional model includes obtaining a characteristic of the three-dimensional model, determining a three-dimensional dither pattern based on the characteristic, and rendering the three-dimensional model using the three-dimensional dither pattern. Determining the three-dimensional
Rendering a three-dimensional model includes obtaining a characteristic of the three-dimensional model, determining a three-dimensional dither pattern based on the characteristic, and rendering the three-dimensional model using the three-dimensional dither pattern. Determining the three-dimensional dither pattern may include selecting a number of points to make up the dither pattern and a location of the points on the three-dimensional model.
대표청구항
▼
1. A method of rendering a three-dimensional model comprised of volumetric three-dimensional data, comprising:obtaining a characteristic of a region of the three-dimensional model; determining a three-dimensional dither pattern for the region based on the characteristic, the three-dimensional dither
1. A method of rendering a three-dimensional model comprised of volumetric three-dimensional data, comprising:obtaining a characteristic of a region of the three-dimensional model; determining a three-dimensional dither pattern for the region based on the characteristic, the three-dimensional dither pattern comprising points in a volumetric region, the points being assigned values to make the dither pattern correspond to the characteristic; and rendering a dithered version of the three-dimensional model using the three-dimensional dither pattern, wherein the dithered version of the three-dimensional model comprises plural three-dimensional dither patterns, and wherein each of the plural three-dimensional dither patterns corresponds to a non-overlapping region of the three-dimensional model. 2. The method of claim 1, wherein determining comprises selecting a number of points to make up the three-dimensional dither pattern and a location of the points on the three-dimensional model.3. The method of claim 1, wherein characteristics are obtained for different regions of the three-dimensional model, the plural three-dimensional dither patterns are determined for the different regions based on characteristics for the different regions, and the three-dimensional model is rendered using the plural three-dimensional dither patterns.4. The method of claim 1, wherein the three-dimensional dither pattern comprises data specifying pixels to illuminate when rendering the three-dimensional model.5. The method of claim 4, wherein the pixels define individual points in the three-dimensional dither pattern.6. The method of claim 1, wherein the characteristic comprises a density of the three-dimensional model.7. The method of claim 6, wherein the density is obtained for a three-dimensional region of the three-dimensional model by averaging densities of sub-regions within the three-dimensional region.8. The method of claim 1, wherein the characteristic comprises one of a color of the three-dimensional model, a field strength in the three-dimensional model, a temperature in the three-dimensional model, and a pollution concentration in the three-dimensional model.9. The method of claim 1, wherein determining the three-dimensional dither pattern comprises selecting the three-dimensional dither pattern from a number of three-dimensional dither patterns stored in memory.10. An article comprising a machine-readable medium that stores executable instructions for rendering a three-dimensional model comprised of volumetric three-dimensional data, the instructions causing a machine to:obtain a characteristic of a region of the three-dimensional model; determine a three-dimensional dither pattern based for the region on the characteristic, the three-dimensional dither pattern comprising points in a volumetric region, the points being assigned values to make the dither pattern correspond to the characteristic; and render a dithered version of the three-dimensional model using the three-dimensional dither pattern, wherein the dithered version of the three-dimensional model comprises plural three-dimensional dither patterns, and wherein each of the plural three-dimensional dither patterns corresponds to a non-overlapping region of the three-dimensional model. 11. The article of claim 10, wherein determining comprises selecting a number of points to make up the three-dimensional dither pattern and a location of the points on the three-dimensional model.12. The article of claim 10, wherein characteristics are obtained for different regions of the three-dimensional model, the plural three-dimensional dither patterns are determined for the different regions based on characteristics for the different regions, and the three-dimensional model is rendered using the plural three-dimensional dither patterns.13. The article of claim 10, wherein the three-dimensional dither pattern comprises data specifying pixels to illuminate when rendering the three-dimensional model.14. The article of claim 13, wherein the pixels define individual points in the three-dimensional dither pattern.15. The article of claim 10, wherein the characteristic comprises a density of the three-dimensional model.16. The article of claim 15, wherein the density is obtained for a three-dimensional region of the three-dimensional model by averaging densities of sub-regions within the three-dimensional region.17. The article of claim 10, wherein the characteristic comprises one of a color of the three-dimensional model, a field strength in the three-dimensional model, a temperature in the three-dimensional model, and a pollution concentration in the three-dimensional model.18. The article of claim 10, wherein determining the three-dimensional dither pattern comprises selecting the three-dimensional dither pattern from a number of three-dimensional dither patterns stored in memory.19. An apparatus for rendering a three-dimensional model comprised of three-dimensional volumetric data, comprising:a memory that-stores executable instructions; and a processor that executes the instructions to: obtain a characteristic of a region of the three-dimensional model; determine a three-dimensional dither pattern for the region based on the characteristic, the three-dimensional dither pattern comprising points in a volumetric region, the points being assigned values to make the dither pattern correspond to the characteristic; and render a dithered version of the three-dimensional model using the three-dimensional dither pattern, wherein the dithered version of the three-dimensional model comprises plural three-dimensional dither patterns, and wherein each of the plural three-dimensional dither patterns corresponds to a non-overlapping region of the three-dimensional model. 20. The apparatus of claim 19, wherein determining comprises selecting a number of points to make up the three-dimensional dither pattern and a location of the points on the three-dimensional model.21. The apparatus of claim 19, wherein characteristics are obtained for different regions of the three-dimensional model, the plural three-dimensional dither patterns are determined for the different regions based on the characteristics for the different regions, and the three-dimensional model is rendered using the plural three-dimensional dither patterns.22. The apparatus of claim 19, wherein the three-dimensional dither pattern comprises data specifying pixels to illuminate when rendering the three-dimensional model.23. The apparatus of claim 22, wherein the pixels define individual points in the three-dimensional dither pattern.24. The apparatus of claim 19, wherein the characteristic comprises a density of the three-dimensional model.25. The apparatus of claim 24, wherein the density is obtained for a three-dimensional region of the three-dimensional model by averaging densities of sub-regions within the three-dimensional region.26. The apparatus of claim 19, wherein the characteristic comprises one of a color of the three-dimensional model, a field strength in the three-dimensional model, a temperature in the three-dimensional model, and a pollution concentration in the three-dimensional model.27. The apparatus of claim 19, wherein determining the three-dimensional dither pattern comprises, selecting the three-dimensional dither pattern from a number of three-dimensional dither patterns stored in memory.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.