High-speed, precision, laser-based method and system for processing material of one or more targets within a field
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
B23K-026/06
B23K-026/38
B23K-026/00
출원번호
US-0903120
(2004-07-30)
발명자
/ 주소
Ehrmann,Jonathan S.
Cordingley,James J.
Smart,Donald V.
Svetkoff,Donald J.
출원인 / 주소
GSI Group Corporation
대리인 / 주소
Brooks Kushman P.C.
인용정보
피인용 횟수 :
27인용 특허 :
28
초록▼
A precision, laser-based method and system for high-speed, sequential processing of material of targets within a field are disclosed that control the irradiation distribution pattern of imaged spots. For each spot, a laser beam is incident on a first anamorphic optical device and a second anamorphic
A precision, laser-based method and system for high-speed, sequential processing of material of targets within a field are disclosed that control the irradiation distribution pattern of imaged spots. For each spot, a laser beam is incident on a first anamorphic optical device and a second anamorphic optical device so that the beam is controllably modified into an elliptical irradiance pattern. The modified beam is propagated through a scanning optical system with an objective lens to image a controlled elliptical spot on the target. In one embodiment, the relative orientations of the devices along an optical axis are controlled to modify the beam irradiance pattern to obtain an elliptical shape while the absolute orientation of the devices controls the orientation of the elliptical spot.
대표청구항▼
What is claimed is: 1. A method of trimming at least one device within a field to a desired value by dynamically controlling the amount of material removed from the device based on a comparison with a measured electric parameter while controlling bite size or kerf width, the method comprising: gene
What is claimed is: 1. A method of trimming at least one device within a field to a desired value by dynamically controlling the amount of material removed from the device based on a comparison with a measured electric parameter while controlling bite size or kerf width, the method comprising: generating a laser beam along a propagation path; controllably modifying the laser beam to obtain a modified laser beam; and sequentially and relatively positioning the modified laser beam into at least one well-focused spot on a device within the field to remove material from the device wherein the at least one well-focused spot has a set of desired spatial characteristics including an adjustable aspect ratio which are obtained by the step of controllably modifying. 2. The method as claimed in claim 1, wherein the device includes a resistor. 3. The method as claimed in claim 1, wherein the electric parameter is resistance. 4. The method as claimed in claim 1, wherein the aspect ratio is greater than 1.2. 5. The method as claimed in claim 4, wherein the aspect ratio is greater than 1.5. 6. The method as claimed in claim 1, wherein controlling bite size increases trim speed. 7. The method as claimed in claim 1, wherein controlling kerf width increases trim speed. 8. The method as claimed in claim 1, wherein the device is at least part of an array of devices. 9. The method as claimed in claim 1, wherein the step of sequentially and relatively positioning delivers and focuses the modified beam into a plurality of well-focused spots extending along a multi-segment line and wherein an axis of at least one of the spots is aligned with the multi-segment line. 10. The method as claimed in claim 1, wherein the step of sequentially and relatively positioning delivers and focuses the modified beam into a plurality of well-focused spots extending along a curvilinear line and wherein an axis of at least one of the spots is aligned with the curvilinear line. 11. The method as claimed in claim 1, wherein the step of generating is performed with a narrow pulse laser system and wherein a precisely controlled ablation threshold allows for selective material removal at the at least one well-focused spot. 12. An efficient method of machining a concave radius feature substantially free of scalloping defects in a material by controlling maximum radius of curvature of an elliptical spot positioned along a curvilinear path, the method comprising: generating a laser beam along a propagation path; controllably modifying the laser beam to obtain an elliptical, modified laser beam; sequentially and relatively positioning the modified laser beam into a first well-focused spot on a curvilinear path to machine the feature wherein the maximum radius of curvature of the first well-focused spot is set to substantially coincide with a local radius of the feature; and repeating the steps of controllably modifying and sequentially and relatively positioning the laser beam into at least one other well-focused spot to further machine the feature wherein the first well-focused spot has a set of desired spatial characteristics including an adjustable aspect ratio and orientation which are obtained by the step of controllably modifying. 13. The method as claimed in claim 12, wherein the concave radius is a segment of a circle. 14. The method as claimed in claim 13, wherein the segment is concentric with at least one other radius of curvature of at least one other well-focused spot. 15. The method as claimed in claim 12, wherein the concave radius is a segment of a hole. 16. The method as claimed in claim 12, wherein the step of generating is performed with a narrow pulse laser system and wherein a precisely controlled ablation threshold allows for selective material removal at the at least one well-focused spot. 17. The method as claimed in claim 12, wherein the feature is a hole drilled by removing material. 18. The method as claimed in claim 12, wherein the concave radius is a segment of a trim cut. 19. The method as claimed in claim 12, wherein the concave radius is a segment of a mark. 20. The method as claimed in claim 12, wherein the aspect ratio is greater than 1.2. 21. The method as claimed in claim 20, wherein the aspect ratio is greater than 1.5. 22. A method of selectively removing material with a precisely controlled laser ablation threshold, the method comprising: generating a laser beam along a propagation path; controllably modifying the laser beam to obtain a modified laser beam; and sequentially and relatively positioning the modified laser beam into at least one well-focused spot to remove material wherein a precisely controlled ablation threshold allows for selective material removal and wherein the at least one well-focused spot has a set of desired spatial characteristics including an adjustable aspect ratio which are obtained by the step of controllably modifying. 23. The method as claimed in claim 22, wherein the method is a trimming method. 24. The method as claimed in claim 22, wherein the method is a marking method. 25. The method as claimed in claim 22, wherein the method is a drilling method. 26. The method as claimed in claim 22, wherein the method is a micro machining method. 27. The method as claimed in claim 22, wherein the step of sequentially and relatively positioning delivers and focuses the modified beam into a plurality of well-focused spots extending along a line having a curvilinear segment. 28. The method as claimed in claim 22, wherein the step of sequentially and relatively positioning delivers and focuses the modified beam into a plurality of well-focused spots extending along a line having a linear segment. 29. The method as claimed in claim 22, wherein the aspect ratio is greater than 1.2. 30. The method as claimed in claim 29, wherein the aspect ratio is greater than 1.5. 31. The method as claimed in claim 22, wherein the step of generating is performed with a narrow pulse laser system. 32. The method as claimed in claim 31, wherein the narrow pulse laser system is a picosecond laser system. 33. The method as claimed in claim 31, wherein the narrow pulse laser system is a femtosecond laser system. 34. The method as claimed in claim 22, wherein the step of sequentially and relatively positioning delivers and focuses the modified beam into a plurality of well-focused spots extending along a line and wherein an axis of at least one of the spots is aligned with the line. 35. The method as claimed in claim 22, wherein controllably modifying the beam includes switching the beam between a plurality of optical paths. 36. A system for trimming at least one device within a field to a desired value by dynamically controlling the amount of material removed from the device, based on a comparison with a measured electric parameter while controlling bite size or kerf width, the system comprising: a laser source for generating a laser beam along a propagation path; a controller for generating control signals; a subsystem for controllably modifying the laser beam in response to the control signals to obtain a modified laser beam; and a beam delivery and focusing subsystem for sequentially and relatively positioning the modified laser beam into at least one well-focused spot on a device within the field to remove material from the device wherein the at least one well-focused spot has a set of desired spatial characteristics including an adjustable aspect ratio. 37. An efficient system for machining a concave radius feature substantially free of scalloping defects in a material by controlling maximum radius of curvature of an elliptical spot positioned along a curvilinear path, the system comprising: a laser source for generating a laser beam along a propagation path; a controller for generating control signals; a subsystem for controllably modifying the laser beam in response to the control signals to obtain elliptical modified laser beams; and a beam delivery and focusing subsystem for sequentially and relatively positioning the modified laser beams into well-focused spots on a curvilinear path to machine the feature wherein at least one of the well-focused spots has a set of desired spatial characteristics including an adjustable aspect ratio and orientation and wherein the maximum radius of curvature of at least one of the well-focused spots is set to substantially coincide with a local radius of the feature. 38. A system for selectively removing material with a precisely controlled laser ablation threshold, the system comprising: a laser source for generating a laser beam along a propagation path; a controller for generating control signals; a subsystem for controllably modifying the laser beam in response to the control signals to obtain a modified laser beam; and a beam delivery and focusing subsystem for sequentially and relatively positioning the modified laser beam into at least one well-focused spot to remove material wherein a precisely controlled ablation threshold allows for selective material removal and wherein the at least one well-focused spot has a set of desired spatial characteristics including an adjustable aspect ratio.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (28)
Geyer Frederick F. (Rochester NY), Apparatus for use in correcting beam anamorphicity by vector diffraction.
Ehrmann, Jonathan S.; Cordingley, James J.; Smart, Donald V.; Svetkoff, Donald J., High-speed, precision, laser-based method and system for processing material of one or more targets within a field.
Ehrmann, Jonathan S.; Cordingley, James J.; Smart, Donald V.; Svetkoff, Donald J., Method and system for processing one or more microstructures of a multi-material device.
Mourou Gerard A. (Ann Arbor MI) Du Detao (Ann Arbor MI) Dutta Subrata K. (Ann Arbor MI) Elner Victor (Ann Arbor MI) Kurtz Ron (Ann Arbor MI) Lichter Paul R. (Ann Arbor MI) Liu Xinbing (Ann Arbor MI) , Method for controlling configuration of laser induced breakdown and ablation.
Uhling Thomas F. (Monument CO) Yearsley Philip J. (Colorado Springs CO) Pittock Dale L. (Colorado Springs CO) Mathews Mark E. (Colorado Springs CO), Method of trimming an electronic circuit.
Marshall John (Farnborough GB3) Raven Anthony L. (Royston GB3) Welford Walter T. (London GB3) Ness Karen M. M. (Royston GB3), Surface erosion using lasers.
Sun Yunlong (Portland OR) Hutchens Craig D. (Portland OR), System and method for selectively laser processing a target structure of one or more materials of a multimaterial, multi.
Gu,Bo; Ehrmann,Jonathan S.; Svetkoff,Donald J.; Cahill,Steven P.; Sullivan,Kevin E., Laser-based method and system for processing targeted surface material and article produced thereby.
Gu, Bo; Smart, Donald V.; Cordingley, James J.; Lee, Joohan; Svetkoff, Donald J.; Johnson, Shepard D.; Ehrmann, Jonathan S., Laser-based method and system for removing one or more target link structures.
Gu, Bo; Smart, Donald V.; Cordingley, James J.; Lee, Joohan; Svetkoff, Donald J.; Johnson, Shepard D.; Ehrmann, Jonathan S., Laser-based method and system for removing one or more target link structures.
Gu, Bo; Smart, Donald V.; Cordingley, James J.; Lee, Joohan; Svetkoff, Donald J.; Johnson, Shepard D.; Ehrmann, Jonathan S., Laser-based system for memory link processing with picosecond lasers.
Griffiths, Joseph J.; Pelsue, Kurt, Method and system for adaptively controlling a laser-based material processing process and method and system for qualifying same.
Gu, Bo; Ehrmann, Jonathan S.; Lento, Joseph V.; Couch, Bruce L.; Chu, Yun Fee; Johnson, Shepard D., Method and system for high-speed precise laser trimming and scan lens for use therein.
Gu, Bo; Ehrmann, Jonathan S.; Lento, Joseph V.; Couch, Bruce L.; Chu, Yun Fee; Johnson, Shepard D., Method and system for high-speed precise laser trimming and scan lens for use therein.
Gu,Bo; Lento,Joseph V.; Ehrmann,Jonathan S.; Couch,Bruce L.; Chu,Yun Fee; Johnson,Shepard D., Method and system for high-speed precise laser trimming, scan lens system for use therein and electrical device produced thereby.
Couch, Bruce L.; Ehrmann, Jonathan S.; Lento, Joseph V.; Johnson, Shepard D., Method and system for high-speed, precise micromachining an array of devices.
Couch, Bruce L.; Erhmann, Jonathan S.; Chu, Yun Fee; Lento, Joseph V.; Johnson, Shepard D., Method and system for high-speed, precise micromachining an array of devices.
Nemets, Christian; Woelki, Michael; Engineer, Amit V., Method and system for machine vision-based feature detection and mark verification in a workpiece or wafer marking system.
Cordingley, James J.; Ehrmann, Jonathan S.; Filgas, David M.; Johnson, Shepard D.; Lee, Joohan; Smart, Donald V.; Svetkoff, Donald J., Methods and systems for thermal-based laser processing a multi-material device.
Cordingley, James J.; Ehrmann, Jonathan S.; Filgas, David M.; Johnson, Shepard D.; Lee, Joohan; Smart, Donald V.; Svetkoff, Donald J., Methods and systems for thermal-based laser processing a multi-material device.
Cordingley,James J.; Ehrmann,Jonathan S.; Filgas,David M.; Johnson,Shepard D.; Lee,Joohan; Smart,Donald V.; Svetkoff,Donald J., Methods and systems for thermal-based laser processing a multi-material device.
Ehrmann,Jonathan S.; Kilgus,Donald B. T., Optical scanning method and system and method for correcting optical aberrations introduced into the system by a beam deflector.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.