초록 ▼

A circuit that includes a core device that is embedded within fixed interfacing logic circuitry that, in turn, is embedded in an FPGA fabric. The FPGA fabric may be configured into a test mode of operation to test either the embedded device or fixed logic devices formed within the fixed interfacing

A circuit that includes a core device that is embedded within fixed interfacing logic circuitry that, in turn, is embedded in an FPGA fabric. The FPGA fabric may be configured into a test mode of operation to test either the embedded device or fixed logic devices formed within the fixed interfacing logic. While the FPGA is configured in a test mode, test circuitry and communication paths are made present within the fixed interfacing logic circuitry to facilitate the testing. Additionally, the test circuitry comprises isolation circuitry that is formed between various modules and circuits that are to be tested to isolate the device under test and to produce test signals thereto and there from during testing operations.

대표청구항 ▼

What is claimed is: 1. A method for testing circuitry in an FPGA, comprising: configuring the FPGA for test including the FPGA forming an FPGA scan chain for simulating an external connection to a fixed logic embedded device; receiving and conducting at least one device scan chain to the embedded d

What is claimed is: 1. A method for testing circuitry in an FPGA, comprising: configuring the FPGA for test including the FPGA forming an FPGA scan chain for simulating an external connection to a fixed logic embedded device; receiving and conducting at least one device scan chain to the embedded device; wherein the at least one device scan chain is for testing the fixed logic embedded device and further wherein the at least one device scan chain is conducted into and through the FPGA to a scan chain logic circuit configured within the FPGA; and performing test. 2. The method of claim 1 further including isolating the embedded device. 3. The method of claim 1 further including transmitting at least one test signal to a multiplexer for delivery to the embedded device. 4. The method of claim 1 further including receiving at least one test output signal from a multiplexer coupled to receive at least one output from the embedded device. 5. The method of claim 4 further including storing the at least one test output signal in the FPGA scan chain. 6. The method of claim 5 further including the step of receiving at least one device scan chain from the embedded device, which at least one scan chain includes test output signals from within the embedded device. 7. The method of claim 6 further including transmitting the at least one device scan data through the FPGA fabric to an external tester for evaluation. 8. The method of claim 5 further including outputting scan data through FPGA scan chain to an external tester for evaluation. 9. A method for testing an FPGA, comprising: configuring internal logic within the FPGA to test an embedded fixed logic device within the FPGA; transmitting a test signal to a multiplexer formed within a gasket; and transmitting the test signal from the multiplexer to the embedded fixed logic device. 10. The method of claim 9 wherein the embedded fixed logic device is an embedded core device. 11. The method of claim 9 wherein the embedded fixed logic device is a formed within the gasket. 12. The method of claim 9 wherein the step of configuring the FPGA for test includes receiving an FPGA scan chain with test vectors. 13. The method of claim 9 further including, if the embedded fixed logic device is an embedded core device, receiving and conducting at least one device scan chain to the device under test. 14. A method for testing an FPGA, comprising: configuring the FPGA for test and forming a scan chain internal to the FPGA to test a fixed logic embedded device within the FPGA; configuring a multiplexer to receive and forward an output test signal; transmitting the output test signal from the fixed logic embedded device to a multiplexer formed within a gasket; and transmitting the output test signal from the multiplexer to an FPGA fabric portion. 15. The method of claim 14 wherein the fixed logic embedded device is an embedded core device. 16. The method of claim 14 wherein the fixed logic embedded device is a formed within the gasket. 17. The method of claim 14 wherein the step of configuring the FPGA for test includes outputting an FPGA scan chain with test vectors to an external tester. 18. The method of claim 14 further including, if the fixed logic embedded device is an embedded core device, receiving at least one device scan chain from the device under test and conducting the at least one device scan chain through an FPGA fabric portion to an external tester for evaluation. 19. A method for testing an embedded fixed logic core device, comprising: receiving, at a multiplexer, one of a device ID signal from an ID storage module or a test signal from a test circuit; receiving, at the multiplexer, a control signal; and responsive to the control signal, transmitting either the device ID signal or the test signal to the embedded fixed logic core device. 20. An FPGA, comprising: an FPGA fabric portion; a gasket formed at least partially within the FPGA fabric portion, the gasket forming interfacing logic between an embedded core device and the fabric portion; and at least one multiplexer coupled serially between the FPGA fabric portion and the embedded core device. 21. The FPGA of claim 20 wherein the multiplexer is coupled to receive outputs from a fixed logic device formed within the gasket. 22. The FPGA of claim 21 wherein the multiplexer is coupled to receive test signals from the FPGA fabric portion by way of communication paths formed within the gasket, which communication paths are accessible while the FPGA is configured for testing the embedded device. 23. The FPGA of claim 22 wherein the multiplexer couples the test signals received from the FPGA fabric portion to the embedded core device whenever the FPGA is configured for testing the embedded device. 24. The FPGA of claim 20 wherein the multiplexer is coupled to receive outputs from the embedded core device. 25. The FPGA of claim 20 wherein the multiplexer is coupled to produce received outputs to the FPGA fabric portion by way of communication paths formed within the portion gasket, which communication paths are accessible while the FPGA is configured for testing the embedded device. 26. The FPGA of claim 20 wherein the multiplexer is coupled to produce received outputs from the embedded core device to fixed logic circuit formed within the gasket whenever the FPGA is not configured for testing.