초록 ▼

A mask programmable integrated circuit includes a read only memory (ROM), a random access memory (RAM), and a controller. The controller couples to the ROM and RAM. The controller senses a reset condition and, in response, directs a clear of the RAM or a preload of contents of the ROM to the RAM. Th

A mask programmable integrated circuit includes a read only memory (ROM), a random access memory (RAM), and a controller. The controller couples to the ROM and RAM. The controller senses a reset condition and, in response, directs a clear of the RAM or a preload of contents of the ROM to the RAM. The preload can be performed after a successful self-test of the RAM is achieved. The RAM has a variable word length and depth size and can be configured to operate in one of many modes. The integrated circuit further includes a first and a second multiplexer (MUX). The first MUX is interposed between the RAM and the ROM, and selectively couples either the ROM data or the built-in self-test (BIST) data to the first MUX output. The second MUX is interposed between the first MUX and the RAM, and selectively couples either the output of the first MUX or a (synchronous or asynchronous) data input to the RAM. With the preload feature, the invention can emulate a ROM, a preloaded RAM, or look-up table logic functions as well as conventional RAM. Further, BIST allows for testing of the RAM without the needs for external support.

대표청구항 ▼

What is claimed is: 1. A method of forming a mask programmable integrated circuit comprising: selecting configurable memory blocks, each configurable memory block including ROM and RAM; replacing embedded array blocks in a PLD design with the configurable memory blocks to convert the PLD design to

What is claimed is: 1. A method of forming a mask programmable integrated circuit comprising: selecting configurable memory blocks, each configurable memory block including ROM and RAM; replacing embedded array blocks in a PLD design with the configurable memory blocks to convert the PLD design to a mask programmable integrated circuit, the embedded array blocks including memory; and forming the mask programmable integrated circuit using a mask that defines the configurable memory blocks and customized contents of the ROMs. 2. The method of claim 1 further comprising: performing a self-test of the RAM in the mask programmable integrated circuit using a built in self-test circuit in one of the configurable memory blocks. 3. The method of claim 2 wherein the performing the test of the RAM comprises: writing a sequence of predetermined values to the RAM; reading a sequence of values from the RAM; and comparing the sequence of values read from the RAM against the sequence of values written to the RAM. 4. The method of claim 2 wherein the performing the test of the RAM comprises: performing a cyclic redundancy check (CRC) on values read from the RAM. 5. The method of claim 2 wherein the performing the test of the RAM comprises: verifying an integrity of every memory locations of the RAM. 6. The method of claim 2 wherein the performing the test of the RAM comprises: making multiple passes through memory locations of the RAM. 7. The method of claim 2 wherein the self-test is initiated by a reset signal that indicates a successful powering up of the mask programmable integrated circuit. 8. The method of claim 1 wherein the RAM is preloaded with values for a lookup table. 9. The method of claim 8 wherein the values of the lookup table define a user specified function. 10. A method for configuring a mask programmable logic circuit, the method comprising: re-synthesizing a design synthesized for a PLD into a design for the mask programmable logic circuit by substituting each memory block in the design with a configurable memory block; generating customized contents of read only memory (ROM) in the configurable memory blocks, the configurable memory blocks including random access memory (RAM); forming the design for the mask programmable logic circuit using a mask that defines the configurable memory blocks with the customized contents of the ROM; and loading the customized contents of the ROM into the RAM. 11. The method of claim 10 further comprising: performing a user function using the customized contents stored in the RAM, wherein the customized contents are values for a look-up table. 12. The method of claim 10 wherein performing the built-in self test further comprises: writing a sequence of predetermined values to the RAM; reading a sequence of values from the RAM; and comparing the sequence of values read from the RAM against the sequence of values written to the RAM. 13. The method of claim 10 wherein: the RAM emulates a read only memory such that data contents of the RAM are not changed. 14. The method of claim 10 further comprising: performing a built-in self test (BIST) to verify integrity of the RAM in response to a reset signal that indicates a successful power up of the mask programmable logic circuit. 15. The method of claim 10 wherein: the RAM is used as a conventional RAM. 16. A method for converting a programmable logic circuit into a mask programmable logic circuit, the method comprising: re-synthesizing a design onto the mask programmable logic circuit by substituting configurable memory blocks for embedded memory blocks in the design, wherein each of the configurable memory blocks includes a read only memory (ROM); generating customized memory contents for the ROMs in the configurable memory blocks; and forming the mask programmable logic circuit using a mask that defines the customized memory contents of the ROMs. 17. The method of claim 16 further comprising: for each of the configurable memory blocks, performing built-in self tests using a controller to verify integrity of a RAM, wherein the controller and the RAM are located in the configurable memory block. 18. The method of claim 17 further comprising: in each of the configurable memory blocks, loading the customized memory contents of the ROM into the RAM. 19. The method of claim 18 further comprising: providing a reset signal to each of the configurable memory blocks that indicates a successful power up of the mask programmable logic circuit, wherein the built-in self tests are performed by the controllers in response to the reset signal. 20. The method of claim 18 further comprising: performing a user function using the customized memory contents stored in at least one of the RAMs.