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Reflectometry system with compensation for specimen holder topography and with lock-rejection of system noise 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0606010 (2003-06-24)
발명자 / 주소
  • Lawless,John L.
  • Chu,Albert E.
출원인 / 주소
  • E Y Laboratories, Inc.
대리인 / 주소
    Dorsey &
인용정보 피인용 횟수 : 6  인용 특허 : 80

초록

A self-contained system uses light reflectivity to examine intensity of a dyed spot on a device membrane surrounded by background area to discern information about the specimen that produced the spot. In a preferred embodiment, a master clock alternatively drives one LED focussed upon the spot cente

대표청구항

What is claimed is: 1. A method of quantifying data to determine possible presence of a target analyte in a specimen in which a sample of said target analyte is placed upon a membrane having a spot region that, in the presence of said target analyte, changes at least one optical characteristic rela

이 특허에 인용된 특허 (80)

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  4. Nolte, David D.; Peng, Leilei; Regnier, Fred E.; Zhao, Ming, Method and apparatus for phase contrast quadrature interferometric detection of an immunoassay.
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  6. Wang, Xuefeng; Nolte, David D.; Varma, Manoj; Weichel, Brian; Norwood, Timothy; Sayegh, Fouad; Zhao, Ming, System with extended range of molecular sensing through integrated multi-modal data acquisition.
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