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Apparatus for fabricating a III-V nitride film and a method for fabricating the same 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C30B-025/08
출원번호 US-0928523 (2001-08-13)
우선권정보 JP-2000-264934(2000-09-01); JP-2000-293596(2000-09-27); JP-2001-207785(2001-07-09)
발명자 / 주소
  • Shibata,Tomohiko
  • Asai,Keiichiro
  • Tanaka,Mitsuhiro
출원인 / 주소
  • NGK Insulators, Ltd.
대리인 / 주소
    Burr &
인용정보 피인용 횟수 : 13  인용 특허 : 13

초록

A hydrogen chloride gas and an ammonia gas are introduced with a carrier gas into a reactor in which a substrate and at least an aluminum metallic material through conduits. Then, the hydrogen gas and the ammonia gas are heated by heaters, and thus, a III-V nitride film including at least Al element

대표청구항

What is claimed is: 1. An apparatus for fabricating a III-V nitride film including at least Al on a given substrate using a Hydride Vapor Phase Epitaxy method using a chloride-based gas, comprising a double reactor structure constructed of an inner reactor to hold a substrate and at least an alumin

이 특허에 인용된 특허 (13)

  1. Razeghi Manijeh ; Kung Patrick, Fabrication of defect free III-nitride materials.
  2. Vaudo, Robert P.; Redwing, Joan M.; Tischler, Michael A.; Brown, Duncan W.; Flynn, Jeffrey S., GaN-based devices using thick (Ga, Al, In)N base layers.
  3. Vaudo, Robert P.; Flynn, Jeffrey S.; Brandes, George R.; Redwing, Joan M.; Tischler, Michael A., III-V nitride substrate boule and method of making and using the same.
  4. Mayeda Mark I. (Las Vegas NV), Leak detection system for a gas manifold of a chemical vapor deposition apparatus.
  5. Kim Dae-woo,KRX ; Lee Jae-kyung,KRX ; Koo Bon-rip,KRX ; Kim Sang-woon,KRX, Leakage gas detector for semiconductor device and leakage gas detecting method using the same.
  6. Radhakrishnan Gouri (Culver City CA), Low temperature photolytic deposition of aluminum nitride thin films.
  7. Razeghi Manijeh (Wilmette IL), Method for growing III-V semiconductor films using a coated reaction chamber.
  8. Dentai Andrew G. (Atlantic Highlands NJ) Joyner ; Jr. Charles H. (Middletown NJ) Weidman Timothy W. (Westfield NJ) Zilko John L. (Fanwood NJ), Method of forming III-V semi-insulating films using organo-metallic titanium dopant precursors.
  9. Kang Sang-bom,KRX ; Park Chang-soo,KRX ; Chae Yun-sook,KRX ; Lee Sang-in,KRX, Method of forming metal nitride film by chemical vapor deposition and method of forming metal contact of semiconductor device using the same.
  10. Nakamura Shuji (Anan JPX), Method of vapor-growing semiconductor crystal and apparatus for vapor-growing the same.
  11. Ueda Tetsuzo ; Solomon Glenn S. ; Miller David J., Particle trap apparatus and methods.
  12. Molnar Richard J., Process for producing high-quality III-V nitride substrates.
  13. Kawase, Nobuo; Aigo, Masayoshi, Quartz tube for thermal processing of semiconductor substrates.

이 특허를 인용한 특허 (13)

  1. Hashimoto, Tadao; Letts, Edward, Growth reactor for gallium-nitride crystals using ammonia and hydrogen chloride.
  2. Hashimoto, Tadao; Letts, Edward, Growth reactor for gallium-nitride crystals using ammonia and hydrogen chloride.
  3. Hashimoto, Tadao; Letts, Edward; Ikari, Masanori, High-pressure vessel for growing group III nitride crystals and method of growing group III nitride crystals using high-pressure vessel and group III nitride crystal.
  4. Hashimoto, Tadao; Letts, Edward; Ikari, Masanori, High-pressure vessel for growing group III nitride crystals and method of growing group III nitride crystals using high-pressure vessel and group III nitride crystal.
  5. Hashimoto, Tadao; Letts, Edward; Ikari, Masanori, Method for producing group III-nitride wafers and group III-nitride wafers.
  6. Hashimoto, Tadao; Ikari, Masanori; Letts, Edward, Method for testing group III-nitride wafers and group III-nitride wafers with test data.
  7. Hashimoto, Tadao; Ikari, Masanori; Letts, Edward, Method for testing group III-nitride wafers and group III-nitride wafers with test data.
  8. Hashimoto, Tadao; Ikari, Masanori; Letts, Edward, Method for testing group III-nitride wafers and group III-nitride wafers with test data.
  9. Vispute,Ratnakar D.; Jones,Evan Bertrue, Method of growing insulating, semiconducting, and conducting group III-nitride thin films and coatings, and use as radiation hard coatings for electronics and optoelectronic devices.
  10. Letts, Edward; Hashimoto, Tadao; Ikari, Masanori, Methods for producing GaN nutrient for ammonothermal growth.
  11. Letts, Edward; Hashimoto, Tadao; Ikari, Masanori, Methods for producing improved crystallinity group III-nitride crystals from initial group III-nitride seed by ammonothermal growth.
  12. Letts, Edward; Hashimoto, Tadao; Ikari, Masanori, Methods for producing improved crystallinity group III-nitride crystals from initial group III-nitride seed by ammonothermal growth.
  13. Asano, Hideki, Semiconductor layer, process for forming the same, and semiconductor light emitting device.
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