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LED junction temperature tester

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01K-015/00
  • G01K-007/01
  • G01J-005/20
출원번호 US-0337246 (2003-01-06)
발명자 / 주소
  • Shih,Kelvin
출원인 / 주소
  • Shih,Kelvin
대리인 / 주소
    Carlson, Gaskey &
인용정보 피인용 횟수 : 13  인용 특허 : 20

초록

An instrument measures the LED junction temperature directly by taking advantage of the linear relationship between the forward current driven through the LED, the forward drop of the LED, and the junction temperature to determine the LED junction temperature. Calibration is conducted by placing two

대표청구항

What is claimed is: 1. A test instrument for measuring a junction temperature of an LED, comprising: an interface that holds a test LED and a reference LED; a first current source that sends a fixed current through the test LED and the reference LED during a calibration mode; a second current sour

이 특허에 인용된 특허 (20)

  1. Simpson Hugh Walter (2 Kirklee Terrace Glasgow SC) Green Douglas (1 Kingsmill Drive Kennoway SC), Apparatus for making surface temperature measurements on the human body.
  2. Davidson William A. (Evanston IL), Combination absolute and differential temperature system.
  3. Aslan Mehmet ; Can Sumer, Direct temperature sensing of a semiconductor device semiconductor device.
  4. Thomson, David; Blake, John; Manus, Lorcan Mac, Four current transistor temperature sensor and method.
  5. Okumura Fujio,JPX, Image sensors and driving method thereof.
  6. Hammond Thomas J., LED printbar aging compensation using I-V slope characteristics.
  7. Bushell, Timothy George; Worgan, Michael Christopher, Led drive circuit and method.
  8. Park Kyung T. (Upper Darby PA) Klafter Richard D. (Wyncote PA), Method and apparatus for measuring stimuli applied to a piezoelectric transducer.
  9. Sheehan, Gary E.; Wan, Jun, Method for synchronized delta-VBE measurement for calculating die temperature.
  10. Nishizawa Hideaki (Yokohama JPX) Nishiguchi Masanori (Yokohama JPX) Miki Atsushi (Yokohama JPX) Fujihira Mitsuaki (Yokohama JPX), Method of measuring junction temperature.
  11. Blau David ; Jadushlever Elia, Methods and apparatus for calibrating temperature measurements and measuring currents.
  12. Lucas Charles H. (Newport Beach CA) Lewyn Lanny L. (Palo Alto CA), Sample and hold circuit with improved offset compensation.
  13. Flynn Denis M. (San Jose CA) Ippolito Peter M. (Fishkill NY), Sense circuit for on-chip thermal shutdown.
  14. Fiset, Peter D., Skin tanning and light therapy incorporating light emitting diodes.
  15. Kunst David J., Solid state temperature measurement.
  16. Breinlinger, Richard H., Solid state temperature measuring device and method.
  17. Tuthill Michael G.,IEX, Switched current temperature sensor circuit with compounded .DELTA.V.sub.BE.
  18. Mizuta, Masaru, Temperature sensor circuit having trimming function.
  19. Wingate Steven L. (420 E. 57th St. #80 Loveland CO 80537), Temperature sensor/controller system.
  20. Miles David John,GBX ; Goldman Richard,GBX, Timing circuit.

이 특허를 인용한 특허 (13)

  1. Dai, Ming-Ji; Liu, Chun-Kai; Chien, Heng-Chieh; Yu, Chih-Kuang; Li, Sheng-Liang, Apparatus and method for measuring characteristic and chip temperature of LED.
  2. Vollertsen, Rolf-Peter, Apparatus and method for measuring local surface temperature of semiconductor device.
  3. Fiennes, Hugo; Cox, Keith Alan, Calibration of temperature sensing circuitry in an electronic device.
  4. Strong, Jasmine, Method and system for thermal testing of computing system components.
  5. Lin, Ming-Te; Tai, Kuang-Yu; Chen, Jyh-Chen; Hwu, Farn-Shiun, Method for measuring PN-junction temperature of light-emitting diode (LED).
  6. Franch, Robert L.; Jenkins, Keith A., On chip temperature measuring and monitoring circuit and method.
  7. Franch,Robert L.; Jenkins,Keith A., On chip temperature measuring and monitoring circuit and method.
  8. St. Pierre, Robert; McLeod, Scott C., Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current.
  9. Nguyen Hoang, Viet; Bancken, Pascal; Surdeanu, Radu; Bataillou, Benoit; Steenwinckel, David van, Self-calibration circuit and method for junction temperature estimation.
  10. Schnaitter, William N., System for on-chip temperature measurement in integrated circuits.
  11. Ooe, Takatoshi; Saitou, Ryuu; Iwamizu, Morio, Temperature sensor circuit.
  12. Löcklin, Eberhard; Rudolph, Georg; Stooss, Jörg, Wavelength referencing by monitoring a voltage across a laser diode.
  13. Löcklin, Eberhard; Rudolph, Georg; Stooss, Jörg, Wavelength referencing by monitoring a voltage across a laser diode.
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