초록 ▼

A dynamic random access memory solves long-existing tight pitch layout problems using a multiple-dimensional bit line structure. Improvement in decoder design further reduces total area of this memory. A novel memory access procedure provides the capability to make internal memory refresh complete

A dynamic random access memory solves long-existing tight pitch layout problems using a multiple-dimensional bit line structure. Improvement in decoder design further reduces total area of this memory. A novel memory access procedure provides the capability to make internal memory refresh completely invisible to external users. By use of such memory architecture, higher performance DRAM can be realized without degrading memory density. The requirements for system support are also simplified significantly.

대표청구항 ▼

I claim: 1. An integrated circuit (IC) on a semiconductor substrate comprising: a high performance logic-circuit including a plurality of sub-micron logic transistors, at least a portion of said sub-micron logic transistors having a gate terminal with a gate oxide; and a plurality of embedded DRAM

I claim: 1. An integrated circuit (IC) on a semiconductor substrate comprising: a high performance logic-circuit including a plurality of sub-micron logic transistors, at least a portion of said sub-micron logic transistors having a gate terminal with a gate oxide; and a plurality of embedded DRAM cells and peripheral DRAM circuits separate from said logic-circuit, wherein said DRAM cells include a select transistor having a select-transistor gate oxide having substantially the same thickness as said gate oxide of said portion of said sub-micron logic transistors; said DRAM cells further including a storage transistor having only a gate terminal and a drain terminal without a source terminal, wherein said drain terminal of said storage transistor is connected to a source terminal of said select-transistor, the gate oxide of the gate terminal of said storage transistors having substantially the same thickness as said gate oxide of said portion of said sub-micron logic transistors. 2. The integrated circuit (IC) of claim 1 wherein: said embedded DRAM select transistor and said sub-micron logic-transistor have substantially the same threshold voltage. 3. The integrated circuit (IC) of claim 1 further comprising: an error code correction (ECC) circuit on the substrate for checking and correcting said embedded DRAM cells. 4. The integrated circuit (IC) of claim 1 wherein: said portion of said sub-micron logic transistors comprise transistors of the same polarity. 5. The integrated circuit (IC) of claim 1 wherein: said portion of sub-micron logic transistors and said select transistors are formed using the same process steps. 6. An method for manufacturing an integrated circuit comprising: manufacturing a high performance logic-circuit including a plurality of sub-micron logic transistors, at least a portion of said sub-micron logic transistors having a gate terminal with a gate oxide; manufacturing a plurality of embedded DRAM cells and peripheral DRAM circuits separate from said logic-circuit, by forming DRAM select transistors including a select-transistor gate oxide having substantially the same thickness as said gate oxide of said portion of said sub-micron logic transistors; and manufacturing said DRAM cells by further forming storage transistors each providing only a gate terminal and a drain terminal without a source terminal and connecting said drain terminal of said storage transistor to a source terminal of said select-transistor, and forming the gate oxide of the gate terminal of said storage transistor having substantially the same thickness as said gate oxide of sub-micron logic transistors. 7. The method of claim 6 further comprising the: forming said embedded DRAM select transistor having a select-transistor gate threshold voltage and forming said sub-micron logic-transistor having a logic-transistor gate threshold voltage substantially the same as said select-transistor gate threshold voltage. 8. The method of claim 6 further comprising: manufacturing an error code correction (ECC) circuit for checking and correcting an error occurred in accessing said embedded DRAM cells. 9. The method of claim 6 further comprising: manufacturing said sub-micron logic-transistors and manufacturing said embedded DRAM select transistors using the same process steps.