Powder metallurgy sputtering targets and methods of producing same
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
B22F-001/02
B22F-007/04
B22F-007/02
출원번호
US-0752270
(2004-01-06)
발명자
/ 주소
Michaluk,Christopher A.
Yuan,Shi
Maguire,James
출원인 / 주소
Cabot Corporation
인용정보
피인용 횟수 :
27인용 특허 :
12
초록▼
A method of forming a sputtering target and other metal articles having controlled oxygen and nitrogen content levels and the articles so formed are described. The method includes surface-nitriding a deoxidized metal powder and further includes consolidating the powder by a powder metallurgy techniq
A method of forming a sputtering target and other metal articles having controlled oxygen and nitrogen content levels and the articles so formed are described. The method includes surface-nitriding a deoxidized metal powder and further includes consolidating the powder by a powder metallurgy technique. Preferred metal powders include, but are not limited to, valve metals, including tantalum, niobium, and alloys thereof.
대표청구항▼
What is claimed is: 1. A sputtering target assembly comprising a consolidated surface-nitrided metal powder sputter target and a backing plate. 2. The sputtering target assembly of claim 1, wherein said metal powder comprises tantalum, niobium, an alloy of tantalum, an alloy of niobium, or combin
What is claimed is: 1. A sputtering target assembly comprising a consolidated surface-nitrided metal powder sputter target and a backing plate. 2. The sputtering target assembly of claim 1, wherein said metal powder comprises tantalum, niobium, an alloy of tantalum, an alloy of niobium, or combinations thereof. 3. The sputtering target assembly of claim 1, wherein said metal powder comprises tantalum. 4. The sputtering target assembly of claim 3, wherein said metal powder has a tantalum nitride shell. 5. The sputtering target assembly of claim 1, wherein said metal powder comprises niobium. 6. The sputtering target assembly of claim 5, wherein said metal powder has a niobium nitride shell. 7. The sputtering target assembly of claim 1, wherein said metal powder has an oxygen content of about 100 ppm or less and has a nitrogen content of at least about 40 ppm. 8. The sputtering target assembly of claim 1, wherein said metal powder has an oxygen content from about 1 ppm to about 100 ppm. 9. The sputtering target assembly of claim 1, wherein said metal powder has a nitrogen content from about 1,000 ppm to about 10,000 ppm. 10. The sputtering target assembly of claim 1, wherein said metal powder is consolidated at a temperature not exceeding 0.7 TH of said metal powder. 11. The sputtering target assembly of claim 1, wherein said metal powder is consolidated at a temperature of about 0.7 TH or more of said metal powder. 12. The sputtering target assembly of claim 1, wherein said metal powder is consolidated by a powder metallurgy technique. 13. The sputtering target assembly of claim 1, wherein said metal powder is consolidated by hot isostatic pressing. 14. The sputtering target assembly of claim 13, wherein said sputter target has a yield strength of from about 18,000 to about 40,000 psi and an elongation to failure of about 20% or more. 15. The sputtering target assembly of claim 1, wherein said metal powder is consolidated by extrusion. 16. The sputtering target assembly of claim 1, wherein said sputter target has an oxygen content of about 300 ppm or less and has a nitrogen content of at least about 10 ppm. 17. The sputtering target assembly of claim 1, wherein said sputter target has an oxygen content of about 100 ppm or less and has a nitrogen content of at least about 40 ppm. 18. The sputtering target assembly of claim 1, wherein said sputter target has an oxygen content from about 1 ppm to about 100 ppm. 19. The sputtering target assembly of claim 1, wherein said sputter target has a nitrogen content from about 1,000 ppm to about 10, 000 ppm. 20. The sputtering target assembly of claim 1, wherein said sputter target has a purity of about 99.5% or greater. 21. The sputtering target assembly of claim 1, wherein said sputter target has an average grain size of about 300 microns or less. 22. The sputtering target assembly of claim 1, wherein said sputter target has an average grain size of 100 microns or less. 23. The sputtering target assembly of claim 1, wherein said sputter target has an average grain size of about 50 microns or less. 24. The sputtering target assembly of claim 1, wherein said sputter target has an average grain size of about 10 microns or less. 25. The sputtering target assembly of claim 1, wherein said sputter target has a random texture on the surface or throughout the entire thickness of said metal. 26. The sputtering target assembly of claim 1, wherein said sputter target has a uniform primary texture of (111) on the surface or throughout the entire thickness of said metal. 27. The sputtering target assembly of claim 1, wherein said sputter target has a uniform primary texture of (100) on the surface or throughout the entire thickness of said metal. 28. The sputtering target assembly of claim 1, wherein said sputter target has a uniform mixed (100):(111) texture on the surface or throughout the entire thickness of said metal. 29. The sputtering target assembly of claim 1, wherein said sputter target has a uniform texture that lies along or near the (111)-(100) symmetry line on the surface or throughout the entire thickness of said metal. 30. The sputtering target assembly of claim 24, wherein said sputter target has a uniform primary texture of (111) on the surface or throughout the entire thickness of said metal. 31. The sputtering target assembly of claim 24, wherein said sputter target has a random texture on the surface or throughout the entire thickness of said metal. 32. The sputtering target assembly of claim 24, wherein said sputter target has a uniform primary texture of (110) on the surface or throughout the entire thickness of said metal. 33. The sputtering target assembly of claim 24, wherein said sputter target has a uniform mixed (111):(100) texture on the surface or throughout the entire thickness of said metal. 34. The sputtering target assembly of claim 24, wherein said sputter target has a uniform texture that lies along or near the (111)-(100) symmetry line on the surface or throughout the entire thickness of said metal. 35. The sputtering target assembly of claim 2, wherein said metal powder has an oxygen content of about 100 ppm or less and has a nitrogen content of at least about 40 ppm. 36. The sputtering target assembly of claim 2, wherein said metal powder has an oxygen content from about 1 ppm to about 100 ppm. 37. The sputtering target assembly of claim 2, wherein said metal powder has a nitrogen content from about 1,000 ppm to about 10,000 ppm. 38. The sputtering target assembly of claim 2, wherein said metal powder is consolidated at a temperature not exceeding 0.7 TH of said metal powder. 39. The sputtering target assembly of claim 2, wherein said metal powder is consolidated at a temperature of about 0.7 TH or more of said metal powder. 40. The sputtering target assembly of claim 2, wherein said metal powder is consolidated by a powder metallurgy technique. 41. The sputtering target assembly of claim 2, wherein said metal powder is consolidated by hot isostatic pressing. 42. The sputtering target assembly of claim 41, wherein said sputter target has a yield strength of from about 18,000 to about 40,000 psi and an elongation to failure of about 20% or more. 43. The sputtering target assembly of claim 2, wherein said metal powder is consolidated by extrusion. 44. The sputtering target assembly of claim 2, wherein said sputter target has an oxygen content of about 300 ppm or less and has a nitrogen content of at least about 10 ppm. 45. The sputtering target assembly of claim 2, wherein said sputter target has an oxygen content of about 100 ppm or less and has a nitrogen content of at least about 1,000 ppm. 46. The sputtering target assembly of claim 2, wherein said sputter target has a nitrogen content from about 1,000 ppm to about 10, 000 ppm. 47. The sputtering target assembly of claim 2, wherein said sputter target has a purity of about 99.5% or greater. 48. The sputtering target assembly of claim 2, wherein said sputter target has an average grain size of about 300 microns or less. 49. The sputtering target assembly of claim 2, wherein said sputter target has an average grain size of about 50 microns or less. 50. The sputtering target assembly of claim 2, wherein said sputter target has an average grain size of about 10 microns or less. 51. The sputtering target assembly of claim 2, wherein said sputter target has a random texture on the surface or throughout the entire thickness of said metal. 52. The sputtering target assembly of claim 2, wherein said sputter target has a uniform primary texture of (111) on the surface or throughout the entire thickness of said metal. 53. The sputtering target assembly of claim 2, wherein said sputter target has a uniform primary texture of (100) on the surface or throughout the entire thickness of said metal. 54. The sputtering target assembly of claim 2, wherein said sputter target has a uniform mixed (100):(111) texture on the surface or throughout the entire thickness of said metal. 55. The sputtering target assembly of claim 2, wherein said sputter target has a uniform texture that lies along or near the (111)-(100) symmetry line on the surface or throughout the entire thickness of said metal. 56. The sputtering target assembly of claim 49, wherein said spatter target has a uniform primary texture of (111) on the surface or throughout the entire thickness of said metal. 57. The sputtering target assembly of claim 49, wherein said sputter target has a random texture on the surface or throughout the entire thickness of said metal. 58. The sputtering target assembly of claim 49, wherein said sputter target has a uniform primary texture of (110) on the surface or throughout the entire thickness of said metal. 59. The sputtering target assembly of claim 49, wherein said sputter target has a uniform mixed (111):(100) texture on the surface or throughout the entire thickness of said metal. 60. The puttering target assembly of claim 49, wherein said sputter target has a uniform texture that lies along or near the (111)-(100) symmetry line on the surface or throughout the entire thickness of said metal. 61. The sputtering target of claim 1, wherein said metal powder has a BET surface area of from about 0.1 m2/g to about 10 m2/g.
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이 특허에 인용된 특허 (12)
Christopher A. Michaluk ; Louis E. Huber ; Mark N. Kawchak ; James D. Maguire, High purity tantalum, products containing the same, and methods of making the same.
Kumar, Prabhat; Aimone, Paul; Balliett, Robert W.; Parise, Anthony V.; Ramlow, Thomas M.; Uhlenhut, Henning, Low oxygen refractory metal powder for powder metallurgy.
Gerard Chris D'Couto ; George Tkach ; Jeff Dewayne Lyons ; Max Biberger ; Kwok Fai Lai ; Jean Lu ; Kaihan Ashtiani, PVD deposition of titanium and titanium nitride layers in the same chamber without use of a collimator or a shutter.
Miller, Steven A.; Kumar, Prabhat; Wu, Richard; Sun, Shuwei; Zimmermann, Stefan; Schmidt-Park, Olaf, Fine grained, non banded, refractory metal sputtering targets with a uniformly random crystallographic orientation, method for making such film, and thin film based devices and products made therefrom.
Volchko, Scott Jeffrey; Zimmermann, Stefan; Miller, Steven A.; Stawovy, Michael Thomas, Methods of manufacturing high-strength large-area sputtering targets.
Shekhter, Leonid N.; Miller, Steven A.; Haywiser, Leah F.; Wu, Rong-Chein Richard, Process for preparing metal powders having low oxygen content, powders so-produced and uses thereof.
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