$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Chip debugging using incremental recompilation 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-017/50
  • G06F-019/00
출원번호 US-0351017 (2003-01-24)
발명자 / 주소
  • Nixon,Gregor
  • Jervis,Mark
  • Pan,Zhengjun
  • Silva,Gihan De
  • Perry,Steven
출원인 / 주소
  • Altera Corporation
대리인 / 주소
    Beyer Weaver &
인용정보 피인용 횟수 : 22  인용 특허 : 53

초록

While debugging, a user chooses an incremental recompile. Internal signals of interest are selected and output pins are optionally reserved. An incremental recompile of the compiled design includes compiling a routing from each internal signal to an output pin. The technology-mapped netlist and pla

대표청구항

We claim: 1. A method of debugging an electronic design comprising: identifying a bug in a compiled electronic design; selecting an internal signal of said design to be viewed; identifying an output pin of said design to which it is desired to route said internal signal; performing an incremental

이 특허에 인용된 특허 (53)

  1. Gregory Brent ; Chatterjee Trinanjan ; Lin Jing C. ; Raghvendra Srinivas ; Girczyc Emil ; Estrada Paul ; Seawright Andrew, Architecture and methods for a hardware description language source level analysis and debugging system.
  2. Jamal Kamran (Sunnyvale CA), Built-in self test for integrated circuits having read/write memory.
  3. Easterday John L. (Portland OR), Data acquisition system for capturing and storing clustered test data occurring before and after an event of interest.
  4. Harwood Wallace B. (Austin TX) McDermott Mark W. (Austin TX) Verbeek Dennis K. (Round Rock TX), Data processor test architecture.
  5. Norman Kevin A. ; Patel Rakesh H. ; Sample Stephen P. ; Butts Michael R., Diagnostic interface system for programmable logic system development.
  6. Heile Francis B., Electronic design automation tool for display of design profile.
  7. Alan L. Herrmann ; Greg P. Nugent, Embedded logic analyzer for a programmable logic device.
  8. Herrmann Alan L. ; Nugent Greg P., Embedded logic analyzer for a programmable logic device.
  9. Sample Stephen P. ; Bershteyn Mikhail ; Butts Michael R. ; Bauer Jerry R., Emulation system with time-multiplexed interconnect.
  10. Bellay Jeffrey D. (Houston TX), Emulator device including a semiconductor substrate having the emulated device embodied in the same semiconductor substr.
  11. Beenstra Kerry ; Rangasayee Krishna ; Herrmann Alan L., Enhanced embedded logic analyzer.
  12. Kerry Veenstra ; Krishna Rangasayee ; Alan L. Herrmann, Enhanced embedded logic analyzer.
  13. Veenstra Kerry ; Rangasayee Krishna ; Herrmann Alan L., Enhanced embedded logic analyzer.
  14. Veenstra, Kerry; Rangasayee, Krishna; Herrmann, Alan L., Enhanced embedded logic analyzer.
  15. Hoyer, Bryan H.; Fairman, Michael C., Gaining access to internal nodes in a PLD.
  16. Bruce Pedersen ; Francis B. Heile ; Marwan Adel Khalaf ; David Wolk Mendel, Generation of sub-netlists for use in incremental compilation.
  17. Brebner, Gordon J., Gigabit router on a single programmable logic device.
  18. Butts Michael R. (Portland OR) Batcheller Jon A. (Newberg OR), Hierarchically connected reconfigurable logic assembly.
  19. Guccione Steven A., Interactive dubug tool for programmable circuits.
  20. Heile Francis B. ; Rawls Tamlyn V., Interface for compiling project variations in electronic design environments.
  21. Stewart Kem ; Selvidge Charles W. ; Crouch Kenneth ; Wong Marina ; Seneski Mark, Logic analysis system for logic emulation systems.
  22. Nakajima Takayuki (Gyoda JPX) Aoki Tetsuo (Kohnosu JPX) Kobayashi Katsumi (Gyoda JPX) Akiyama Noboru (Kumagaya JPX), Logic analyzer.
  23. Schubert Wolfgang (Munich DEX), Logic analyzer.
  24. Leaver Andrew ; Heile Francis B., Mapping heterogeneous logic elements in a programmable logic device.
  25. Haag George A. ; Byrne Patrick J., Method and apparatus for accessing internal integrated circuit signals.
  26. Liu Dick L. (Saratoga CA) Li Jeong-Tyng (Cupertino CA) Huang Thomas B. (San Jose CA) Choi Kenneth S. K. (San Jose CA), Method and apparatus for debugging reconfigurable emulation systems.
  27. Chen Benjamin ; Macliesh Peter ; Wang Albert, Method and apparatus for entry of timing constraints.
  28. Jamal Kamran (Sunnyvale CA), Method and apparatus for making integrated circuits with built-in self-test.
  29. Patel Rakesh H. ; Costello John ; Wong Myron, Method and apparatus for monitoring or forcing an internal node in a programmable device.
  30. Brebner, Gordon J., Method and apparatus for multithreading.
  31. Fleisher Evgeny G., Method and apparatus for testing a logic design of a programmable logic device.
  32. Butts Michael R. ; Batcheller Jon A., Method for performing simulation using a hardware emulation system.
  33. Butts, Michael R.; Batcheller, Jon A., Method of using electronically reconfigurable logic circuits.
  34. Uhling Thomas F. (Monument CO) Dascher David J. (Colorado Springs CO) Rush Kenneth (Colorado Springs CO) Griggs Keith C. (Colorado Springs CO), Multiplexing electronic test probe.
  35. Whitsel Ronald J. (Beaverton OR) Hobbs William A. (Beaverton OR), On-chip in-circuit-emulator memory mapping and breakpoint register modules.
  36. Kelem Steven H. ; Lawman Gary R., On-chip logic analysis and method for using the same.
  37. Manela Philip R. ; Birch Peter R. ; Lin John C. ; Ullum Daniel R., Output pin for selectively outputting one of a plurality of signals internal to a semiconductor chip according to a prog.
  38. Patel Rakesh H. ; Norman Kevin A., Partially reconfigurable programmable logic device.
  39. Kuboki Shigeo (Nakaminato JPX) Sugimoto Norihiko (Katsuta JPX) Inada Syunji (Hitachi JPX) Ueno Masahiro (Hitachi JPX) Harakawa Takeshi (Hadano JPX) Inada Kazuhisa (Hitachi JPX) Tominaga Toshihiko (Ka, Program control apparatus incorporating a trace function.
  40. Baltus Peter G. (Dommelen CA NLX) Ligthart Michael M. (Sunnyvale CA), Programmable combinational logic circuit.
  41. El Gamal Abbas A. (Palo Alto CA) El-Ayat Khaled A. (Cupertino CA) Greene Jonathan W. (Palo Alto CA) Guo Ta-Pen R. (Cupertino CA) Reyneri Justin M. (Los Altos CA), Programmable interconnect architecture.
  42. Kaplinsky Cecil H. (Palo Alto CA), Programmable logic device.
  43. Ketan Zaveri ; Christopher F. Lane ; Srinivas T. Reddy ; Andy L. Lee ; Cameron R. McClintock ; Bruce B. Pedersen, Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits.
  44. Zaveri Ketan ; Lane Christopher F. ; Reddy Srinivas T. ; Lee Andy L. ; McClintock Cameron R. ; Pedersen Bruce B., Programmable logic device with circuitry for observing programmable logic circuit signals and for preloading programmable logic circuits.
  45. Lee, Chong H.; Asayesh, Reza, Programmable logic device with high speed serial interface circuitry.
  46. Yang Yang-Sei,KRX, Prototyping system and a method of operating the same.
  47. Sample Stephen P. (Mountain View CA) D\Amour Michael R. (Los Altos Hills CA) Payne Thomas S. (Union City CA), Reconfigurable hardware emulation system.
  48. Patel Rakesh H. ; Norman Kevin A., Sample and load scheme for observability of internal nodes in a PLD.
  49. Patel Rakesh H. ; Norman Kevin A., Sample and load scheme for observability of internal nodes in a PLD.
  50. Butts Michael R. (Portland OR) Batcheller Jon A. (Newberg OR), Structures and methods for adding stimulus and response functions to a circuit design undergoing emulation.
  51. Alfke Peter H., System for preventing radiation failures in programmable logic devices.
  52. El-Ayat Khaled A. (Cupertino CA) Chang Jia-Hwang (Cupertino CA), Testability architecture and techniques for programmable interconnect architecture.
  53. Heile Francis B. ; Fairbanks Brent A., Work group computing for electronic design automation.

이 특허를 인용한 특허 (22)

  1. Pritchard, Jeffrey Orion; Wayne, Todd, Automatic test component generation and inclusion into simulation testbench.
  2. Marti,Philippe; Jervis,Mark; Nixon,Gregor, Chip debugging using incremental recompilation and register insertion.
  3. Plofsky, Jordan, Embedded microprocessor for integrated circuit testing and debugging.
  4. Potemski, Andrew Stanley; Tyson, John Scott; Eustes, Steven Robert, Execution monitor for electronic design automation.
  5. Lindberg, Grant; Martin, Gregor J.; Asson, David; He, Ying Chun, I/O planning with lock and insertion features.
  6. Lindberg, Grant; Martin, Gregor J.; Asson, David; He, Ying Chun, I/O planning with lock and insertion features.
  7. Larouche, Mario, Incremental modification of instrumentation logic.
  8. Lam Leventis,Carolyn; Borer,Terry; Singh,Deshanand, Leveraging combinations of synthesis, placement and incremental optimizations.
  9. Neoh, Hong Shan, M and A for importing hardware description language into a system level design environment.
  10. Borer, Terry; Leaver, Andrew; Karchmer, David; Quan, Gabriel; Brown, Stephen D., M/A for performing incremental compilation using top-down and bottom-up design approaches.
  11. Neoh, Hong Shan, Method and apparatus for importing hardware description language into a system level design environment.
  12. Borer, Terry; Leaver, Andrew; Karchmer, David; Quan, Gabriel; Brown, Stephen D., Method and apparatus for performing compilation using multiple design flows.
  13. Padalia, Ketan; Fung, Ryan, Method and apparatus for performing efficient incremental compilation.
  14. Borer,Terry; Karchmer,David; Govig,Jason; Leaver,Andrew; Quan,Gabriel; Chan,Kevin; Betz,Vaughn; Brown,Stephen D., Method and apparatus for performing incremental compilation.
  15. Borer, Terry; Leaver, Andrew; Karchmer, David; Quan, Gabriel; Brown, Stephen D., Method and apparatus for performing incremental compilation using top-down and bottom-up design approaches.
  16. Borer, Terry; Leaver, Andrew; Karchmer, David; Quan, Gabriel; Brown, Stephen D., Method and apparatus for performing incremental compilation using top-down and bottom-up design approaches.
  17. Betz, Vaughn; Pantofaru, Caroline; Swartz, Jordan, Method and apparatus for utilizing constraints for the routing of a design on a programmable logic device.
  18. Betz, Vaughn; Pantofaru, Caroline; Swartz, Jordan, Method and apparatus for utilizing constraints for the routing of a design on a programmable logic device.
  19. Pang, Hung Hing Anthony; Vo, Binh; Ghosh, Souvik, Method and system for semiconductor device characterization pattern generation and analysis.
  20. Roesner,Wolfgang; Williams,Derek Edward, Method, system and program product for providing a configuration specification language supporting selective presentation of configuration entities.
  21. Roesner,Wolfgang; Williams,Derek Edward, Method, system and program product supporting presentation of a simulated or hardware system including configuration entities.
  22. Roesner,Wolfgang; Williams,Derek Edward, Method, system and program product supporting presentation of a simulated or hardware system including configuration entities.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로