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Sorting/storage device for wafers and method for handling thereof 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/677
  • H01L-021/67
  • B65H-001/00
출원번호 US-0807580 (1999-09-21)
우선권정보 NL-1010317(1998-10-14)
국제출원번호 PCT/NL99/000583 (1999-09-21)
§371/§102 date 20010413 (20010413)
국제공개번호 WO00/022653 (2000-04-20)
발명자 / 주소
  • Hasper,Albert
  • Nooten,Sebastiaan Eliza
  • Hendriks,Menso
출원인 / 주소
  • ASM International N.V.
대리인 / 주소
    Knobbe, Martens, Olson &
인용정보 피인용 횟수 : 34  인용 특허 : 24

초록

Sorting/storage device for wafers. A sorting device is provided in which at least two cassettes containing wafers may be present and the wafers are moved from one cassette to the other cassette or vice versa. If appropriate, a measuring station may be present in the sorting device. In the immediate

대표청구항

What is claimed is: 1. A device for sorting wafers stored in cassettes comprising: a housing; a wafer handling device arranged in a chamber configured to be sealed off with respect to the housing, wherein the wafer-handling device accesses a measuring station configured to carry out measurements di

이 특허에 인용된 특허 (24)

  1. Prentakis Antonios E. (Cambridge MA), Apparatus and method for loading and unloading wafers.
  2. Perlov Ilya ; Gantvarg Evgueni ; Belitsky Victor, Apparatus for storing and moving a cassette.
  3. Muka Richard S., Automated wafer buffer for use with wafer processing equipment.
  4. Jacoby Hans-Dieter (Werdorf DEX) Schmidt Peter (Huettenberg DEX), Device for automatically transporting disk shaped objects.
  5. Zinger Yan (Dwingeloo NLX), Device for treating micro-circuit wafers.
  6. Iwasawa Yoshiyuki (Tokyo JPX) Ishida Tsutomu (Tokyo JPX) Harada Hiroshi (Tokyo JPX) Okamoto Kenji (Tokyo JPX) Kobayashi Shintaro (Tokyo JPX) Matsumoto Takashi (Ise JPX) Shinya Tsutomu (Ise JPX) Tanak, Dusttight storage cabinet apparatus for use in clean rooms.
  7. Garric George (Perthes FRX) Lafond Andr (Nemours FRX), Fully automated and computerized conveyor based manufacturing line architectures adapted to pressurized sealable transpo.
  8. Ushikawa Harunori (Kofu JPX), Heat treatment apparatus having a wafer boat.
  9. Cheng David, Method and apparatus for integrated wafer handling and testing.
  10. Hugues Jean B. (Tempe AZ) Weber Lynn (Saratoga CA) Herlinger James E. (Palo Alto CA) Nishikawa Katsuhito (San Jose CA) Schuman Donald L. (Saratoga CA) Yee Gary W. (Santa Clara CA), Method and apparatus for transferring wafers between cassettes and a boat.
  11. Bonora Anthony C. ; Neads Michael A. ; Oen Joshua T., Method and apparatus for vertical transfer of a semiconductor wafer cassette.
  12. Boitnott Charles A. ; Caughran James W. ; Egbert Steve, Modular process system.
  13. Rubin Richard H. (Fairfield NJ) Petrone Benjamin J. (Netcong NJ) Heim Richard C. (Mountain View CA) Pawenski Scott M. (Wappingers Falls NY), Modular processing apparatus for processing semiconductor wafers.
  14. Stark Lawrence R. (San Jose CA) Turner Frederick (Sunnyvale CA), Modular wafer transport and processing system.
  15. Ozawa Masahito (Yamanashi JPX) Mizukami Masami (Yamanashi JPX) Kanazashi Masanobu (Kofu JPX) Takasoe Toshihiko (Yamanashi JPX) Narushima Masaki (Yamanashi JPX) Kubodera Masao (Yamanashi JPX), Multi-chamber system provided with carrier units.
  16. Hasebe Keizo,JPX ; Nagashima Shinji,JPX ; Semba Norio,JPX ; Akimoto Masami,JPX ; Kimura Yoshio,JPX ; Iida Naruaki,JPX ; Harada Kouji,JPX ; Ueda Issei,JPX ; Konishi Nobuo,JPX, Substrate processing system.
  17. Allen Sam H., System for sorting multiple semiconductor wafers.
  18. Snijders Gert-Jan,NLX, System for transferring wafers from cassettes to furnaces and method.
  19. Stonestreet Paul (Cowfold GB2) Allum Clive (Crawley GB2) Webber Bert (Crawley GB2) Cooke Richard (West Worthing GB2) Robinson Frederick J. L. (Crawley GB2) Wauk ; II Michael T. (Haywards Heath GB2), Systems and methods for wafer handling in semiconductor process equipment.
  20. Masayuki Toda JP; Tadahiro Ohmi JP; Yoshio Ishihara JP, Transportation method for substrate wafers and transportation apparatus.
  21. Iwai Hiroyuki (Sagamihara JPX) Tanifuji Tamotsu (Yamato JPX) Asano Takanobu (Yokohama JPX) Okura Ryoichi (Kanagawa-ken JPX), Treatment apparatus.
  22. Nishi Hironobu (Sagamihara JPX), Vertical heat-treating apparatus.
  23. Chen Fu-Liang (Hsinchu Hsien TWX), Wafer container.
  24. Rush John M. (Mountain View) Ulander Torben (Sunnyvale) Verdon Michael T. (San Jose CA), Wafer transfer machine.

이 특허를 인용한 특허 (34)

  1. Yu, Yeh-Hsin; Chen, Jian-Hung; Chuang, Chia Ho; Wu, Hsueh Cheng, Apparatus and method for semiconductor wafer transfer.
  2. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  3. Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
  4. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  5. Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
  6. Martino, Peter, Damping vibrations within storage device testing systems.
  7. Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
  8. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  9. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  10. Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
  11. Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
  12. Merrow, Brian S., Enclosed operating area for disk drive testing systems.
  13. Merrow, Brian S., Enclosed operating area for storage device testing systems.
  14. Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
  15. Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
  16. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  17. Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
  18. Merrow, Brian S., Storage device testing system cooling.
  19. Merrow, Brian S., Storage device testing system cooling.
  20. Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
  21. Aburatani, Yukinori, Substrate processing apparatus and semiconductor device manufacturing method.
  22. Ikehata, Yoshiteru, Substrate storage facility and substrate processing facility, and method for operating substrate storage.
  23. Merrow, Brian S., Temperature control within disk drive testing systems.
  24. Merrow, Brian S., Temperature control within disk drive testing systems.
  25. Merrow, Brian S., Temperature control within storage device testing systems.
  26. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  27. Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
  28. Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
  29. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  30. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
  31. Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  32. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  33. Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
  34. Merrow, Brian S., Vibration isolation within disk drive testing systems.
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