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Apparatus and process for sensing fluoro species in semiconductor processing systems 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-009/00
출원번호 US-0273036 (2002-10-17)
발명자 / 주소
  • Dimeo, Jr.,Frank
  • Chen,Philip S. H.
  • Neuner,Jeffrey W.
  • Welch,James
  • Stawasz,Michele
  • Baum,Thomas H.
  • King,Mackenzie E.
  • Chen,Ing Shin
  • Roeder,Jeffrey F.
출원인 / 주소
  • Advanced Technology Materials, Inc.
대리인 / 주소
    Intellectual Property/Technology Law
인용정보 피인용 횟수 : 16  인용 특허 : 22

초록

A gas detector and process for detecting a fluorine-containing species in a gas containing same, e.g., an effluent of a semiconductor processing tool undergoing etch cleaning with HF, NF 3, etc. The detector in a preferred structural arrangement employs a microelectromechanical system (MEMS)-based d

대표청구항

What is claimed is: 1. A gas sensor assembly for sensing fluoro species, the assembly comprising a gas sensing element coupled to a substrate defining a recess, wherein the gas sensing element is fabricated directly on the substrate, and spans across the recess and bounds a portion of the recess to

이 특허에 인용된 특허 (22)

  1. Cavicchi Richard (Washington Grove MD) Semancik Stephen (Mt. Airy MD) Suehle John S. (Westminster MD) Gaitan Michael (Gaithersburg MD), Application of microsubstrates for materials processing.
  2. Murakami Yuetsu,JPX ; Masumoto Katashi,JPX ; Nakamura Naoji,JPX, Electrical resistant alloy having a high temperature coefficient of resistance.
  3. Ragsdale Daniel J. (Quakertown PA) Smudde ; Jr. George H. (Macungie PA) Zatko David A. (Lansdale PA), Enhanced sensitivity for oxygen and other interactive gases in sample gases using gas chromatography.
  4. Donald J. Bray ; Chandra Venkatraman ; Craig A. Outten ; Christopher Halter ; Arvind Goel, Fluorine-doped diamond-like coatings.
  5. Weckstrom, Kurt; Hietala, Mika, Gas analyzer using thermal detectors.
  6. Kawai Toshikazu (Tsurugashima JPX) Yoshimura Takaaki (Ube JPX) Watanabe Mineo (Kawagoe JPX) Kamakura Manami (Miyoshi JPX), Gas chromatographic analysis of fluoromethyl-1,1,1,3,3,3-hexafluoroisopropyl ether.
  7. Ralf Moos DE; Thomas Birkhofer DE; Aleksandar Knezevic DE; Ralf Mueller DE; Carsten Plog DE, Gas sensor.
  8. Wezurek Horst,DEX ; Bahs Hans-Jurgen,DEX, Gas sensor with flashback barrier.
  9. Sugaya, Satoshi; Yamada, Tetsuo; Ishida, Noboru, Humidity sensor.
  10. Dean, Frank William Houlton; Ling, Alan Edward, Hydrogen collection and detection.
  11. John Carl Christenson ; Steven Edward Staller ; John Emmett Freeman ; Troy Allan Chase ; Robert Lawrence Healton ; David Boyd Rich, MEMS sensor structure and microfabrication process therefor.
  12. Noguchi Yasuo (Yokohama JPX) Idemoto Morito (Tokyo JPX) Matsunaga Fumiaki (Yokohama JPX), Measuring instrument for concentration of gas.
  13. Huang, Jim-Jey; Hu, Tain-Chen; Chuang, Jui-Ping, Method and apparatus for determining end-point in a chamber cleaning process.
  14. Mansure Arthur J. ; Spates James J. ; Martin Stephen J., Method of and apparatus for determining deposition-point temperature.
  15. Hausner, Christopher Karl; Golec, Daniel Peter; Bruce, Stephen Frederick, Method of probabilistically modeling variables.
  16. Nader Najafi ; Sonbol Massoud-Ansari ; Srinivas Tadigadapa ; Yafan Zhang, Methods for prevention, reduction, and elimination of outgassing and trapped gases in micromachined devices.
  17. DiMeo ; Jr. Frank ; Bhandari Gautam, Micro-machined thin film hydrogen gas sensor, and method of making and using the same.
  18. Eastman, Jeffrey A.; Thompson, Loren J., Nanocrystalline films for gas-reactive applications.
  19. Baraket Mourad,CHX ; Feltre Mauro,CHX ; Forster Martin,CHX ; Lenggenhager Rene,CHX ; Portmann Andreas,CHX ; Tenchio Georges,CHX, Photo-acoustic gas sensor.
  20. Laush Curtis T., Solid state fluorine sensor system and method.
  21. Adler-Golden Steven (Newtonville MA) Bernstein Lawrence S. (Bedford MA) Bien Fritz (Concord MA), Spark spectroscopic high-pressure gas analyzer.
  22. Bernstein Jonathan J., Tunneling sensor with linear force rebalance and method for fabricating the same.

이 특허를 인용한 특허 (16)

  1. Dimeo, Jr., Frank; Chen, Philip S. H.; Neuner, Jeffrey W.; Welch, James; Stawasz, Michele; Baum, Thomas H.; King, Mackenzie E.; Chen, Ing-Shin; Roeder, Jeffrey F., Apparatus and process for sensing fluoro species in semiconductor processing systems.
  2. Dimeo, Jr.,Frank; Chen,Philip S. H.; Neuner,Jeffrey W.; Welch,James; Stawasz,Michele; Baum,Thomas H.; King,Mackenzie E.; Chen,Ing Shin; Roeder,Jeffrey F., Apparatus and process for sensing fluoro species in semiconductor processing systems.
  3. den Hartog Besselink, Edwin; Garssen, Adriaan; Dirkmaat, Marco, Cassette holder assembly for a substrate cassette and holding member for use in such assembly.
  4. Dimeo, Frank; Dietz, James; Olander, W. Karl; Kaim, Robert; Bishop, Steven; Neuner, Jeffrey W.; Arno, Jose; Marganski, Paul J.; Sweeney, Joseph D.; Eldridge, David; Yedave, Sharad; Byl, Oleg; Stauf, Gregory T., Cleaning of semiconductor processing systems.
  5. Christensen, Dale Larry; Kuczynski, Joseph Paul; Poleschuk, Jr., Nicholas Alexander, Conformal coating enhanced to provide heat detection.
  6. Dass, Ronald I.; Novak, James, Etch resistant gas sensor.
  7. Chen, Ing-Shin; Neuner, Jeffrey W.; Kramer, Richard, Feedback control system and method for maintaining constant resistance operation of electrically heated elements.
  8. Oishi, Hidetoshi; Sasaki, Takashi; Suzuki, Akihiro; Eguchi, Tsuyoshi, Gas sensor.
  9. Sweeney, Joseph D.; Yedave, Sharad N.; Byl, Oleg; Kaim, Robert; Eldridge, David; Feng, Lin; Bishop, Steven E.; Olander, W. Karl; Tang, Ying, Ion source cleaning in semiconductor processing systems.
  10. Fukazawa, Atsuki; Fukuda, Hideaki; Takamure, Noboru; Zaitsu, Masaru, Method for forming dielectric film in trenches by PEALD using H-containing gas.
  11. Lee, Choong Man; Yoo, Yong Min; Kim, Young Jae; Chun, Seung Ju; Kim, Sun Ja, Method of forming metal interconnection and method of fabricating semiconductor apparatus using the method.
  12. DiMeo, Jr., Frank; Dietz, James; Olander, W. Karl; Kaim, Robert; Bishop, Steven E.; Neuner, Jeffrey W.; Arno, Jose I., Methods for cleaning ion implanter components.
  13. Raisanen, Petri; Givens, Michael Eugene, Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures.
  14. Dimeo, Jr.,Frank; Chen,Philip S. H.; Chen,Ing Shin; Neuner,Jeffrey W.; Welch,James, Nickel-coated free-standing silicon carbide structure for sensing fluoro or halogen species in semiconductor processing systems, and processes of making and using same.
  15. Fisher, Kathryn C.; Huang, Qiang; Papa Rao, Satyavolu S.; Yeh, Ming-Ling, Photovoltaic device with aluminum plated back surface field and method of forming same.
  16. Margetis, Joe; Tolle, John; Bartlett, Gregory; Bhargava, Nupur, Process for forming a film on a substrate using multi-port injection assemblies.
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