초록 ▼

A test device for testing integrated circuits includes a lid and a base joined at a hinge and secured together with a latch. Within the base is some form of socket body that electrically connects the integrated circuit under test to the item the socket is mounted to (i. e. load board). Attached to

A test device for testing integrated circuits includes a lid and a base joined at a hinge and secured together with a latch. Within the base is some form of socket body that electrically connects the integrated circuit under test to the item the socket is mounted to (i. e. load board). Attached to the lid are cam ratcheting levers. A pressure plate is attached to cam ratcheting levers. The cam ratcheting levers provide a rotating means for lowering a pressure plate by the use of the cam groove within the cam ratcheting levers. The means for lowering a pressure plate may allow incremental lowering of a pressure plate through the ratcheting action of the cam ratcheting levers. The base may include a sight groove for examination of the integrated circuit and internal socket parts.

대표청구항 ▼

What is claimed is: 1. A device for testing integrated circuits comprising: a base; a socket body held in the base for contacting a plurality of terminals from an integrated circuit; a lid assembly including a pressure plate having a first and a second bearing assembly on opposing sides of said pre

What is claimed is: 1. A device for testing integrated circuits comprising: a base; a socket body held in the base for contacting a plurality of terminals from an integrated circuit; a lid assembly including a pressure plate having a first and a second bearing assembly on opposing sides of said pressure plate; a hinge joining said lid assembly to said base; a locking mechanism allowing locking of said lid to said base; a first and a second lever; a first and second ratchet head each at one end of said first and said second lever respectively; a plurality of teeth on an exterior circumference of each of said first and second ratchet head; an arc groove on each of said first and said second ratchet head, wherein said first and second bearing assembly are each respectively disposed within said first and said second arc groove such that rotation of said ratchet head causes vertical movement of said pressure plate; and a means for engaging said teeth, thereby preventing rotation of said first and said second ratchet head. 2. The device of claim 1, further including a sight groove on the base, said sight groove allowing a user to view the integrated circuit within said test socket. 3. The device of claim 1, wherein said first and second levers are joined by a linking bar. 4. The device of claim 1, wherein said means for engaging said teeth is spring biased. 5. The device of claim 1, wherein said pressure plate may include an open central area through which the integrated circuit may be viewed. 6. The device of claim 1, wherein said socket body includes pogo pins. 7. A device for testing integrated circuits comprising: a base; a socket body held in the base for contacting a plurality of terminals from an integrated circuit; a lid assembly including a pressure plate having a first and a second bearing assembly on opposing sides of said pressure plate; a hinge joining said lid assembly to said base; a locking mechanism allowing locking of said lid to said base; a first and a second levers; a first and a second ratchet head each at one end of said first and said second lever respectively; a plurality of teeth on an exterior circumference of each of said first and second ratchet head; an arc groove on each of said first and said second ratchet head, wherein said first and second bearing assembly are each respectively disposed within said first and said second arc groove such that rotation of said first and second ratchet head causes vertical movement of said pressure plate; a lock mechanism positioned to engage said teeth, thereby preventing rotation of said first and said second ratchet head; and a sight groove which extends through said base to allow for visual examination of the integrated circuit during test. 8. The device of claim 7, wherein said lock mechanism positioned to engage said teeth is spring biased. 9. The device of claim 7, wherein said pressure plate includes an open central area through which said integrated circuit may be viewed. 10. The device of claim 7, wherein said socket body includes pogo pins.