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Systems to view and analyze the results from diffraction-based diagnostics 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/55
  • G01N-033/00
  • G01N-033/566
  • G01J-003/00
  • G01J-003/04
출원번호 US-0013973 (2001-12-11)
발명자 / 주소
  • Kaylor,Rosann Marie
  • Yang,Difei
  • Atanassov,Zdravko Savov
  • Knotts,Michael Eugene
출원인 / 주소
  • Kimberly Clark Worldwide, Inc.
대리인 / 주소
    Dority &
인용정보 피인용 횟수 : 18  인용 특허 : 118

초록

An analyzer useful in determining the presence of an analyte using a diffraction based sensing device and methods and systems using this device. The present invention may be used with a variety of different diffraction-based diagnostic methods and systems. The analyzer enhances the accuracy and/or u

대표청구항

We claim: 1. A system for detecting an analyte in a sample comprising: a diffraction-based sensing device comprising a substrate, wherein the substrate comprises a polymer film; and an analyzer comprising: a light source for supplying light to the diffraction-based device, wherein the diffraction-

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