$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Catadioptric projection objective with adaptive mirror and projection exposure method 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-001/20
  • G01J-001/10
출원번호 US-0759964 (2004-01-17)
우선권정보 DE-198 24 030(1998-05-29)
발명자 / 주소
  • Wagner,Cristian
  • Gerhard,Michael
  • Richter,Gerald
출원인 / 주소
  • Carl Zeiss SMT AG
대리인 / 주소
    Fish &
인용정보 피인용 횟수 : 12  인용 특허 : 15

초록

A catadioptric projection objective for microlithography has at least one curved mirror that is deformable and adjusting elements that can deform the deformable mirror. The adjusting elements are matched to given image errors and their correction. The invention is suitable for astigmatism, fourfold

대표청구항

We claim: 1. A catadioptric projection objective for microlithography comprising: at least one curved mirror having an optical axis that is deformable, and adjusting elements that deform said curved mirror, in which said adjusting elements comprise at least one actuator, acting collectively upon at

이 특허에 인용된 특허 (15)

  1. MacDonald Bruce G. (San Diego CA) Hunter ; Jr. Robert O. (Rancho Santa Fe CA) Smith Adlai H. (San Diego CA), Adaptive optic wafer stepper illumination system.
  2. Sawicki Richard H. (Pleasanton CA) Sweatt William (Livermore CA), Apparatus for and method of correcting for astigmatism in a light beam reflected off of a light reflecting surface.
  3. Humphrey William E. (Orinda CA), Elastically compensated off-axis mirror.
  4. Gobeli Garth W. (Albuquerque NM), Fabrication of aspheric surfaces through controlled deformation of the figure of spherical reflective surfaces.
  5. Furter Gerd,DEX, High-resolution high-apertured objective.
  6. Spinhirne James M. (Jupiter FL), Intracavity phase front and power control.
  7. Endou Tetsuya,JPX ; Ikemi Atsushi,JPX, Laser beam collimation apparatus and laser processing machine using same.
  8. Schaffer ; Jr. William E. (Webster NY) Jacques Donald A. (Pittsford NY) Vandenberg Donald E. (Brockport NY), Method for correction of distortions of an imaging device.
  9. Lemaitre ; Gerard R., Mirrors with a variable focal distance.
  10. Singh Rama N. (Bethel CT) Wilczynski Janusz S. (Ossining NY), Optical system with two subsystems separately correcting odd aberrations and together correcting even aberrations.
  11. Unno Yasuyuki,JPX, Projection exposure apparatus and microdevice manufacturing method.
  12. Koyama Motoo,JPX ; Ichihara Yutaka,JPX, Projection optical apparatus for projecting a mask pattern onto the surface of a target projection object and projection.
  13. Asari Kouki,JPX ; Mori Hiromichi,JPX ; Sakai Eiichi,JPX, Shape control apparatus for reflecting mirrors.
  14. Argy Gilles (La Queue les Yvelynes FRX), Storage tank for cryogenic liquefied gases such in particular as hydrogen.
  15. Plante Roland L. (Hudson MA) McKenney Austin L. (Amherst NH), Variable thickness deformable mirror.

이 특허를 인용한 특허 (12)

  1. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; Von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Catadioptric projection objective.
  2. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  3. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  4. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  5. Dodoc, Aurelian; Ulrich, Wilhelm; Epple, Alexander, Catadioptric projection objective with intermediate images.
  6. Shafer, David; Ulrich, Wilhelm; Dodoc, Aurelian; von Buenau, Rudolf Murai; Mann, Hans-Juergen; Epple, Alexander, Catadioptric projection objective with parallel, offset optical axes.
  7. Bleidistel, Sascha; Maul, Manfred, Correction of optical elements by correction light irradiated in a flat manner.
  8. Bleidistel, Sascha; Maul, Manfred, Correction of optical elements by correction light irradiated in a flat manner.
  9. Uehara, Yusaku, Exposure method and apparatus, and device producing method using two light beams to correct non-rotationally symmetric aberration.
  10. Shafer, David R.; Ulrich, Wilhelm; Dodoc, Aurelian; von Buenau, Rudolf M.; Mann, Hans-Juergen; Epple, Alexander; Beder, Susanne; Singer, Wolfgang, Immersion catadioptric projection objective having two intermediate images.
  11. Holderer, Hubert; Hembd-Soellner, Christian; Von Buenau, Rudolf; Haag, Ulrich, Projection method including pupillary filtering and a projection lens therefor.
  12. Holderer,Hubert; Hembd Soellner,Christian; Von Buenau,Rudolf; Haag,Ulrich, Projection method including pupillary filtering and a projection lens therefor.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로