Gas specie electron-jump chemical energy converter
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01L-031/00
B01J-019/08
출원번호
US-0625801
(2003-07-23)
발명자
/ 주소
Zuppero,Anthony C.
Gidwani,Jawahar M.
출원인 / 주소
Neokismet, L.L.C.
대리인 / 주소
Orrick, Herrington &
인용정보
피인용 횟수 :
7인용 특허 :
65
초록▼
An apparatus and method for extracting energy is provided. In one aspect the method includes using chemical reactions to generate vibrationally excited molecules, such as high-quantum-number-vibrationally-excited gas molecules in a region. The vibration energy in the vibrationally excited molecules
An apparatus and method for extracting energy is provided. In one aspect the method includes using chemical reactions to generate vibrationally excited molecules, such as high-quantum-number-vibrationally-excited gas molecules in a region. The vibration energy in the vibrationally excited molecules is converted into hot electrons when the excited molecules contact a conductor. A geometry is provided so that the excited molecules may travel, diffuse or wander into a conductor before loosing a useful fraction of the vibrational energy. Optionally, the generating and the converting process may be thermally separated, at least in part. The short lived hot electrons are converted into longer lived entities such as carriers and potentials in a semiconductor, where the energy is converted into a useful form.
대표청구항▼
We claim: 1. A method of producing electrical energy, comprising: forming a thin electrically conducting surface on one or more semiconductor elements, the thin electrically conducting surface and the one or more semiconductor elements forming a semiconductor diode; forming a region for chemical re
We claim: 1. A method of producing electrical energy, comprising: forming a thin electrically conducting surface on one or more semiconductor elements, the thin electrically conducting surface and the one or more semiconductor elements forming a semiconductor diode; forming a region for chemical reactions, the region including at least the thin electrically conducting surface; conveying reactants into the region; initiating one or more chemical reactions in the region, the chemical reactions producing one or more highly vibrationally excited reaction products; and removing exhaust and one or more products of the chemical reactions from the region by gas convection, wherein the one or more highly vibrationally excited reaction products transfer reaction product energy to electrons in the thin electrically conducting surface, which electrons become energetic, travel into the one or more semiconductor elements and produce electrical energy. 2. The method of claim 1, wherein the semiconductor diode comprises at least a Schottky diode; and the method further includes tailoring barrier width of the Schottky diode for enhancing tunneling of the electrons from the thin electrically conducting surface to the one or more semiconductor elements. 3. The method of claim 2, wherein the tailoring barrier width comprises choosing a semiconductor doping between high limit of degenerative doping and lower limit of light doping. 4. The method of claim 1, wherein the semiconductor diode comprises a pn junction diode; and the forming a thin electrically conducting surface comprises forming a thin electrically conducting surface on a highly doped or degeneratively doped p-type semiconductor and a junction between the thin electrically conducting surface and the highly doped or degeneratively doped p-type semiconductor forms an ohmic or almost ohmic contact; and the method further includes tailoring bandgap of the pn junction diode to create a barrier profile. 5. The method of claim 4, wherein the tailoring bandgap comprises varying composition of the one or more semiconductor elements as a function of distance from the junction between the thin electrically conducting surface and the highly doped or degeneratively doped p-type semiconductor. 6. The method of claim 5, wherein the semiconductor elements comprise germanium and silicon. 7. The method of claim 1, further comprising: cooling the one or more semiconductor elements by convective flow, heat of vaporization, or combination thereof. 8. The method of claim 1, wherein the electrons cause a forward bias across the semiconductor diode. 9. The method of claim 7, wherein the heat of vaporization comprises heat of vaporization of fuels. 10. The method of claim 7, further comprising integrating the semiconductor diode as a part of a system that performs the conveying step. 11. The method of claim 7, further comprising integrating the semiconductor diode as apart of a system that performs the removing step. 12. The method of claim 7, further comprising integrating the semiconductor diode as a part of a system that performs the conveying step and the removing step. 13. The method of claim 7, wherein the initiating comprises stimulating one or more reactions in the region by using a catalyst, injecting a stimulant, injecting an autocatalyst, injecting hot carrier, using electrical stimulant, using optical stimulant, or using a plurality of reactants, or combination thereof. 14. The method of claim 1, further comprising: preparing the reactants prior to producing the one or more highly vibrationally excited reaction products. 15. The method of claim 14, wherein the preparing comprises reforming, desorbing, adsorbing, reacting, modifying one or more chemical properties of the reactants, condensing, or vaporizing, or combination thereof. 16. The method of claim 14, wherein the preparing comprises using a catalyst and a reactant to provide energy for vaporization. 17. The method of claim 14, wherein the preparing is performed intermittently in pulses or periodically. 18. The method of claim 1, further comprising tailoring spent or unused reaction products for conveyance to an exhaust. 19. The method of claim 18, wherein the tailoring spent or unused reaction products comprises desorbing, adsorbing, reacting, modifying chemical properties of the spent or unused reaction products, condensing, or vaporizing, or combination thereof. 20. The method of claim 1, further comprising using a catalyst with a low affinity for reacted products, the catalyst being used to prepare for and enhance the producing of the one or more highly vibrationally excited reaction products and to tailor the reacted products for the removing. 21. The method of claim 20, wherein the catalyst with a low affinity for reacted products comprises platinum, palladium, or gold, or combination thereof. 22. The method of claim 1, wherein the removing exhaust and reacted products comprises: flowing gaseous reactants into the region for chemical reactions; and providing an exhaust path from the region. 23. The method of claim 1, wherein the removing exhaust and reacted products comprises: removing spent reactants from the thin electrically conducting surface. 24. The method of claim 23, wherein the removing spent reactants comprises using a catalyst as part of the thin electrically conducting surface. 25. The method of claim 23, further including applying heat, electrical, optical, mechanical, or hot carrier injection stimulation, or combination thereof. 26. The method of claim 1, wherein the conveying reactants comprises conveying reactants that produce highly vibrationally excited reaction products. 27. The method of claim 26, wherein the reactants comprises one or more of monopropeliants. 28. The method of claim 27, wherein the reactants comprise monomethylhydrazine. 29. The method of claim 1, wherein the thin electrically conducting surface is formed as having monolayer features. 30. The method of claim 1, wherein the thin electrically conducting surface is formed from platinum, palladium, gold, rhodium, or ruthenium, or combination thereof. 31. The method of claim 1, wherein the thin electrically conducting surface is formed on an intermediate surface. 32. The method of claim 31, wherein the intermediate surface comprises metal or oxide or combination thereof. 33. The method of claim 1, wherein the one or more semiconductor elements comprise photovoltaic energy converter devices, metal-insulator-metal devices, metal-oxide-metal devices, or quantum wells, or combination thereof. 34. The method of claim 1, wherein at least one of the one or more semiconductor elements are chosen from those with band gap greater than approximately 1.0 eV. 35. The method of claim 1, wherein the one or more semiconductor elements comprise a catalyst oxide, a high temperature wide band gap semiconductor, or combination thereof. 36. The method of claim 35, wherein the catalyst oxide comprises TiO2. 37. The method of claim 35, wherein the high temperature wide band gap semiconductor comprises SiC, GaN, GaP, diamond, or ZnO, or combination thereof. 38. The method of claim 35, wherein the one or more semiconductor elements comprise silicon or GaAs or combination thereof. 39. The method of claim 14, wherein the preparing includes at least using one or more catalysts. 40. The method of claim 14, wherein the preparing includes at least using separated catalysts. 41. The method of claim 14, wherein the preparing includes at least using reaction stimulators. 42. The method of claim 14, wherein the preparing includes at least using separated regions. 43. The method of claim 14, wherein the preparing includes at least using multiple regions. 44. The method of claim 18, wherein the tailoring includes at least using a catalyst. 45. The method of claim 44, wherein the catalyst comprises aluminum. 46. The method of claim 18, wherein the tailoring includes at least using separated catalysts. 47. The method of claim 18, wherein the tailoring includes at least using a reaction stimulator. 48. The method of claim 47, wherein the reaction stimulator comprises reactants that bum the spent or unused reaction products. 49. The method of claim 18, wherein the tailoring includes at least using separated regions. 50. The method of claim 18, wherein the tailoring includes at least using multiple regions.
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