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Exposure method, exposure apparatus, and method for producing device 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/00
  • G01B-011/14
  • G03B-027/32
  • G03B-027/42
  • G03F-009/00
  • G01B-011/02
출원번호 US-0782062 (2001-02-14)
우선권정보 JP-2000-041435(2000-02-15); JP-2001-027940(2001-02-05)
발명자 / 주소
  • Nishi,Kenji
출원인 / 주소
  • Nikon Corporation
대리인 / 주소
    Oliff &
인용정보 피인용 횟수 : 13  인용 특허 : 29

초록

An exposure apparatus for exposing a substrate with an exposure light beam passing through a mask comprises a movable stage for moving the substrate, a stage chamber for accommodating the movable stage, a transport system for transporting the substrate into the stage chamber, and a first alignment s

대표청구항

What is claimed is: 1. An exposure method for exposing one of a first object and a second object with an exposure light beam passing through the other of the first object and the second object by using an exposure apparatus provided with an airtight stage chamber in which a movable stage is provide

이 특허에 인용된 특허 (29)

  1. McCoy John H. (San Carlos CA) Suwa Kyochi (San Mateo CA), Alignment system with large area search for wafer edge and global marks.
  2. Nakahara Kanefumi (Yokohama JPX), Apparatus for and method of carrying a substrate.
  3. Takahashi Tetsuo (Akita JPX) Miyauchi Eisaku (Akita JPX) Miyajima Toshihiko (Saku JPX) Watanabe Hideaki (Akita JPX), Apparatus for clean transfer of objects.
  4. Yui, Yoshikiyo; Muraki, Masato, Charged-particle beam exposure apparatus and device manufacturing method using the same.
  5. Masujima Sho,JPX ; Miyauchi Eisaku,JPX ; Miyajima Toshihiko,JPX ; Watanabe Hideaki,JPX, Clean transfer method and apparatus therefor.
  6. Miyai Tsuneo,JPX ; Imai Yuji,JPX, Exposure apparatus.
  7. Miyaji Akira (Tokyo JPX) Ikeda Masatoshi (Tokyo JPX), Exposure apparatus.
  8. Nakahara Kanefumi (Yokohama JPX) Nakajima Masao (Yokohama JPX) Tsuruya Toshinori (Kawasaki JPX), Exposure apparatus.
  9. Shiraishi, Naomasa, Exposure apparatus and exposure method, and device manufacturing method.
  10. McEachern Robert A. (Wellesley MA) Lucas Mark S. (Groton MA) Simpson Craig R. (Danville VT), Lithography System using dual substrate stages.
  11. Kendall Rodney A. (Fairfield County CT), Lithography tool with vibration isolation.
  12. Russel Shirley ; Michael R. Conboy ; Horace Paul Bowser, Jr., Mask identification database server.
  13. Kanefumi Nakahara JP, Method of manufacturing exposure apparatus and method for exposing a pattern on a mask onto a substrate.
  14. Hunter, Reginald, Optical signal routing method and apparatus providing multiple inspection collection points on semiconductor manufacturing systems.
  15. Yoshitake Shusuke,JPX ; Itoh Masamitsu,JPX ; Takigawa Tadahiro,JPX, Pattern transfer apparatus, an operation management system thereof, and an operation management system for a semiconduct.
  16. Baker David G. (Shrewsbury MA), Pin chuck for lithography system.
  17. Saeki Hiroaki,JPX, Positioning apparatus and process system having the same.
  18. Kamiya Saburo (Yokohama JPX), Projection exposure apparatus.
  19. Nishi, Kenji, Projection exposure apparatus.
  20. Kenji Nishi JP; Kazuya Ota JP, Projection exposure apparatus and method.
  21. Iizuka Kazuo (Yokohama JPX), Reticle conveying device.
  22. Kiyoshi Arakawa JP, Semiconductor production system with an in-line subsystem.
  23. Foley Michael S. (Beverly MA), Substrate handling system.
  24. Aoyama, Masaaki, Substrate processing apparatus for coating photoresist on a substrate and forming a predetermined pattern on a substrate by exposure.
  25. Fujie Nobuo (Kawasaki JPX) Obara Hitoshi (Kawasaki JPX) Kuroiwa Keiji (Kawasaki JPX) Nakamura Masaki (Kawasaki JPX) Watanabe Kazuya (Kawasaki JPX) Aruga Takashi (Kawasaki JPX) Horii Nobutaka (Kawasak, UV exposure with elongated service lifetime.
  26. Kato Shigekazu,JPX ; Nishihata Kouji,JPX ; Tsubone Tsunehiko,JPX ; Itou Atsushi,JPX, Vacuum processing apparatus for substate wafers.
  27. Masato Takahashi JP, Vibration cancellation apparatus and exposure apparatus.
  28. Takahashi Masato,JPX, Vibration-preventive apparatus and exposure apparatus.
  29. Forsyth James M. (Mecedon NY) Abate Joseph A. (Pittsford NY) Duft Thomas L. (Fishers NY) Drummond Malcolm M. (Henrietta NY) Gregorka Lisa (Rochester NY) Hoose John F. (Rochester NY) Zambelli Robert G, X-ray lithography system.

이 특허를 인용한 특허 (13)

  1. Tanaka, Yasuaki; Sanada, Satoro, Alignment apparatus, substrates stacking apparatus, stacked substrates manufacturing apparatus, exposure apparatus and alignment method.
  2. Van De Kerkhof, Marcus Adrianus; Vos, Harald Petrus Cornelis, Dedicated metrology stage for lithography applications.
  3. Ichinose, Go, Exposure apparatus and device manufacturing method.
  4. Loopstra, Erik Roelof; Eussen, Emiel Jozef Melanie; Koenen, Willem Herman Gertruda Anna; Van Der Pasch, Engelbertus Antonius Fransiscus; Van Der Wijst, Marc Wilhelmus Maria, Lithographic projection apparatus and method for controlling a support structure.
  5. Ichinose, Go, Manufacturing method of exposure apparatus and device manufacturing method.
  6. Hayashi,Nozomu; Yokota,Yukihiro, Mark position measuring method and apparatus.
  7. Hayashi,Nozomu; Yokota,Yukihiro, Mark position measuring method and apparatus.
  8. Kok, Haico Victor; Kivits, Koen; Van de Laak, Ron; Kuiper, Johannes Maria; Van der Zouw, Gerbrand; Tolsma, Hoite P Theodoor, Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus.
  9. Keim,Norbert; Ott,Christof; Bayha,Wulf Siegfried; Krohn,Martin; Huber,Bernd; Dorfschmid,Jens; Semler,Juergen, Method for controlling an electromagnetic valve, in particular for an automatic transmission of a motor vehicle.
  10. Fricke, Wolfgang; Gundal, Linda, Method for determining correction values for the measured values of positions of structures on a substrate.
  11. Adachi,Naoyasu; Suzuki,Katsuya; Noguchi,Masayuki, Method of manufacturing semiconductor device and apparatus of automatically adjusting semiconductor pattern.
  12. Kwak, Hidong; Krishnan, Shankar, Purge gas flow control for high-precision film measurements using ellipsometry and reflectometry.
  13. Suzuki, Taku; Yamauchi, Yasushi, Spin polarized ion beam generation apparatus and scattering spectroscopy apparatus using the spin polarized ion beam and specimen processing apparatus.
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