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Method and computer program product for producing a pattern recognition training set 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-017/50
  • G06F-015/18
  • G06K-009/46
출원번호 US-0105714 (2002-03-25)
발명자 / 주소
  • Ii,David L.
  • Reitz, II,Elliott D.
  • Tillotson,Dennis A.
출원인 / 주소
  • Lockheed Martin Corporation
대리인 / 주소
    Tarolli, Sundheim, Covell&
인용정보 피인용 횟수 : 5  인용 특허 : 24

초록

The present invention recites a method and computer program product for generating a set of training samples from a single ideal pattern for each output class of a pattern recognition classifier. A system equivalent pattern is generated for each of a plurality of classes from a corresponding ideal p

대표청구항

Having described the invention, we claim: 1. A method for generating a set of X training samples from a single ideal pattern for each output class of a pattern recognition classifier, comprising: generating a system equivalent pattern for each of a plurality of classes from a corresponding ideal pa

이 특허에 인용된 특허 (24)

  1. Weideman William E. (Arlington TX), Adaptive neural network image processing system.
  2. Yaeger Larry S. ; Lyon Richard F., Adaptive statistical classifier which provides reliable estimates or output classes having low probabilities.
  3. Baggenstoss, Paul M., Class specific classifier.
  4. Fujisaki Tetsunosuke ; Mao Jianchang ; Mohiuddin Kottappuram Mohamedali, Concurrent two-stage multi-network optical character recognition system.
  5. Alkon Daniel L. ; Vogl Thomas P. ; Blackwell Kim T. ; Barbour Garth S., Dynamically stable associative learning neural network system.
  6. Iwahashi, Naoto; Bao, Hongchang; Honda, Hitoshi, Feature extraction apparatus and method and pattern recognition apparatus and method.
  7. Droppo, James G.; Acero, Alejandro; Deng, Li, Including the category of environmental noise when processing speech signals.
  8. Vachtesvanos, George J.; Dorrity, Lewis J.; Wang, Peng; Echauz, Javier; Mufti, Muid, Method and apparatus for analyzing an image to detect and identify patterns.
  9. Chen Kaihu (Shirley MA), Method and apparatus for learning in a neural network.
  10. Wood David C. (Woodbridge), Method and apparatus for training a neural network depending on average mismatch.
  11. Tatsuoka Curtis M., Method for interacting with a test subject with respect to knowledge and functionality.
  12. Lyon Richard F. ; Stafford William, Method for training a statistical classifier with reduced tendency for overfitting.
  13. Yaeger Larry S., Method for training an adaptive statistical classifier to discriminate against inproper patterns.
  14. Yaeger Larry S. ; Lyon Richard F., Method for training an adaptive statistical classifier with improved learning of difficult samples.
  15. Ornstein Leonard (White Plains NY), Method for unsupervised neural network classification with back propagation.
  16. Tong David W. (Scotia NY) Delano Paul A. (Schenectady NY), Method for using a feed forward neural network to perform classification with highly biased data.
  17. Togawa Fumio (Hillsboro OR) Ueda Toru (Nara OR JPX) Aramaki Takashi (Hillsboro OR) Ishizuka Yasushi (Yamatokoriyama JPX), Neural network apparatus.
  18. Bryant Steven M. ; Loewenthal Kenneth H., Neural network solder paste inspection system.
  19. Alspector Joshua (Westfield NJ), Neuromorphic learning networks.
  20. Deng, Li; Huang, Xuedong; Plumpe, Michael D., Pattern recognition training method and apparatus using inserted noise followed by noise reduction.
  21. Watanabe Hideyuki,JPX ; Yamaguchi Tsuyoshi,JPX ; Katagiri Shigeru,JPX, Signal pattern recognition apparatus comprising parameter training controller for training feature conversion parameter.
  22. Obata Kenzo (Okazaki JPX) Uchikawa Yoshiki (Nagoya JPX) Furuhashi Takeshi (Nagoya JPX) Watanabe Shigeru (Nagoya JPX), Signature recognition apparatus which can be trained with a reduced amount of sample data.
  23. Adams James L. (6600 East Bluebird La. Paradise Valley AZ 85253), System for spatial and temporal pattern learning and recognition.
  24. Ornstein Leonard (White Plains NY), Unsupervised neural network classification with back propagation.

이 특허를 인용한 특허 (5)

  1. Min, Kyung-sun; Park, Bo-gun; Song, Byung-cheol, Image processing apparatus and method which generates reference data according to learning images.
  2. Luo, Yun; Wallace, Jon K., Method and apparatus for producing classifier training images via construction and manipulation of a three-dimensional image model.
  3. Takahashi, Fuminori, Signal processing apparatus.
  4. Kohli, Pushmeet; Shotton, Jamie; el-Saban, Motaz, Synthesizing training samples for object recognition.
  5. Alcocer Ochoa, Alberto; Tinsley, Keith Raynard, Systems, methods, apparatus and computer readable mediums for use in association with systems having interference.
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