Detection assembly and measuring arrangement for multigas analyzers
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01J-005/02
A61B-005/08
출원번호
US-0857631
(2004-05-28)
우선권정보
EP-03396052(2003-05-30)
발명자
/ 주소
Weckstr철m,Kurt
Karlsson,Kai
출원인 / 주소
Instrumentarium Corp.
대리인 / 주소
Andrus, Sceales, Starke &
인용정보
피인용 횟수 :
6인용 특허 :
6
초록▼
A non-dispersive infrared measuring arrangement for a multigas analyzer is described having a radiation source (10), a measuring chamber (20), a beam splitter (3), at least a first and a second detector unit (21, 22) both with at least two detectors (1a, 1b; 2a, 2 b); and optical filters in radiatio
A non-dispersive infrared measuring arrangement for a multigas analyzer is described having a radiation source (10), a measuring chamber (20), a beam splitter (3), at least a first and a second detector unit (21, 22) both with at least two detectors (1a, 1b; 2a, 2 b); and optical filters in radiation beam portions ending in said detectors. The detector units receive the reflected beam portions (R R) and the transmitted beam portion (RT). Both the first and second detector units (21, 22) have: at least one measuring detectors (1a, 1b) provided with an optical measurement filter (5a, 5b); and at least one reference detectors (2a, 2b) provided with an optical reference filter (6a, 6b). Alternatively, the first detector unit (21) has at least two measuring detectors (1a, 1b) each provided with an optical measurement filter (5a, 5b), and the second detector unit (22) has at least two reference detectors (2a, 2b) each provided with an optical reference filter (6a, 6b). The first detector in said first detector unit and said second detector in said second detector unit are positioned to constitute a first independent single path analyzer channel (11), and said second detector in said first detector unit and said first detector in said second detector unit are positioned to constitute a second independent single path analyzer channel (12).
대표청구항▼
The invention claimed is: 1. A detection assembly for a non-dispersive infrared multigas analyzer, comprising: a beam splitter for dividing an IR-radiation beam into at least one reflected beam portion and at least one transmitted beam portion, at least a first and a second detector unit both with
The invention claimed is: 1. A detection assembly for a non-dispersive infrared multigas analyzer, comprising: a beam splitter for dividing an IR-radiation beam into at least one reflected beam portion and at least one transmitted beam portion, at least a first and a second detector unit both with at least two separate detectors respectively, and optical filters in front of said detectors; said detector units being positioned to receive said at least one reflected beam portion and said at least one transmitted beam portion respectively, wherein: said first detector unit and said second detector unit both have at least one first detector, said first detectors being measuring detectors each provided with an optical measurement filter, which has a transmission wavelength band in the range of the absorption band of a gas component, so as to affect that portion of the IR-radiation ending into said first detector; and said first detector unit and said second detector unit both have at least one second detector, said second detectors being reference detectors each provided with an optical reference filter, which has a transmission wavelength range, within which said gas component does not have a substantial absorption, so as to affect that portion of the IR-radiation ending into said second detector; and that said first detector in said first detector unit and said second detector in said second detector unit are positioned to constitute a first independent single path analyzer channel, and said second detector in said first detector unit and said first detector in said second detector unit are positioned to constitute a second independent single path analyzer channel. 2. A detection assembly according to claim 1, wherein a first detector and a second detector constituting an independent single path analyzer channel are detector pairs. 3. A detection assembly according to claim 1, comprising a number of independent single path analyzer channels, and said number is at least equal to the number of those gas components to be analyzed. 4. A detection assembly according to claim 1, wherein said optical measurement filters are passband interference filters positioned: between said beam splitter and said first detectors; or to form said beam splitter. 5. A detection assembly according to claim 1, wherein said optical reference filters are selected from a group of filters including bandpass interference filters, and highpass interference filters, and lowpass interference filters, and gaseous filters providing attenuation of at least those wavelengths utilized for analysis. 6. A detection assembly according to claim 1, wherein said beam splitter is a physical beam splitter. 7. A detection assembly according to claim 6, wherein said physical beam splitter is a semi-transparent mirror proving a substantially even wavelength distribution both to said reflected beam portion and to said transmitted beam portion. 8. A detection assembly according to claim 6, wherein said physical beam splitter is an interference filter having bandpass or highpass or lowpass or bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 9. A detection assembly according to claim 6, wherein said beam splitter comprises at least two splitter segments side by side, or on top of each other, one splitter segment for one or more independent single path analyzer channel. 10. A detection assembly according to claim 9, wherein said at least two splitter segments have different transmission characteristics. 11. A detection assembly according to claim 10, wherein each of said at least two splitter segments is a semi-transparent mirror providing a substantially even wavelength distribution both to said reflected beam portion and to said transmitted beam portion. 12. A detection assembly according to claim 10, wherein each of said at least two splitter segments is an interference filter having bandpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 13. A detection assembly according to claim 10, wherein each of said at least two splitter segments is an interference filter having highpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 14. A detection assembly according to claim 10, wherein each of said at least two splitter segments is an interference filter having lowpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 15. A detection assembly according to claim 10, wherein each of said at least two splitter segments is an interference filter having bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 16. A detection assembly according to claim 10, wherein at least one of said splitter segments has characteristics of said optical measurement filter to said transmitted beam portion, or inverse characteristics of said optical measurement filter to said reflected beam portion. 17. A detection assembly according to claim 1, wherein said beam splitter is a geometrical beam splitter having a plurality of radiation transparent areas and/or a plurality of radiation reflective areas within each beam splitter area common to said transmitted beam portion and said reflected beam portion. 18. A detection assembly for a non-dispersive infrared multigas analyzer, comprising: a beam splitter for dividing an IR-radiation beam into at least one reflected beam portion and at least one transmitted beam portion, at least a first and a second detector unit both with at least two separate detectors respectively, and optical filters in front of said detectors; said detector units being positioned to receive said at least one reflected beam portion and said at least one transmitted beam portion respectively, wherein: said first detector unit has at least two first detectors, said first detectors being measuring detectors each provided with an optical measurement filter, which has a transmission wavelength band in the range of the absorption band of a gas component, so as to affect that portion of the IR-radiation ending into said first detector; and said second detector unit has at least two second detectors, said second detectors being reference detectors each provided with an optical reference filter, which has a transmission wavelength range, within which said gas component does not have a substantial absorption, so as to affect that portion of the IR-radiation ending into said second detector; and that said first detector in said first detector unit and said second detector in said second detector unit are positioned to constitute a first independent single path analyzer channel, and said second detector in said first detector unit and said first detector in said second detector unit are positioned to constitute a second independent single path analyzer channel. 19. A detection assembly according to claim 18, wherein a first detector and a second detector constituting an independent single path analyzer channel are detector pairs. 20. A detection assembly according to claim 18, comprising a number of independent single path analyzer channels, and said number is at least equal to the number of those gas components to be analyzed. 21. A detection assembly according to claim 18, wherein said optical measurement filters are passband interference filters positioned: between said beam splitter and said first detectors; or to form said beam splitter. 22. A detection assembly according to claim 18, wherein said optical reference filters are selected from a group of filters including bandpass interference filters, and highpass interference filters, and lowpass interference filters, and gaseous filters providing attenuation of at least those wavelengths utilized for analysis. 23. A detection assembly according to claim 18, wherein said beam splitter is a physical beam splitter. 24. A detection assembly according to claim 23, wherein said physical beam splitter is a semi-transparent mirror proving a substantially even wavelength distribution both to said reflected beam portion and to said transmitted beam portion. 25. A detection assembly according to claim 23, wherein said physical beam splitter is an interference filter having bandpass or highpass or lowpass or bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 26. A detection assembly according to claim 23, wherein said beam splitter comprises at least two splitter segments side by side, or on top of each other, one splitter segment for one or more independent single path analyzer channel. 27. A detection assembly according to claim 26, wherein said at least two splitter segments have different transmission characteristics. 28. A detection assembly according to claim 27, wherein each of said at least two splitter segments is a semi-transparent mirror providing a substantially even wavelength distribution both to said reflected beam portion and to said transmitted beam portion. 29. A detection assembly according to claim 27, wherein each of said at least two splitter segments is an interference filter having bandpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 30. A detection assembly according to claim 27, wherein each of said at least two splitter segments is an interference filter having highpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 31. A detection assembly according to claim 27, wherein each of said at least two splitter segments is an interference filter having lowpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 32. A detection assembly according to claim 27, wherein each of said at least two splitter segments is an interference filter having bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 33. A detection assembly according to claim 27, wherein at least one of said splitter segments has characteristics of said optical measurement filter to said transmitted beam portion, or inverse characteristics of said optical measurement filter to said reflected beam portion. 34. A detection assembly according to claim 18, wherein said beam splitter is a geometrical beam splitter having a plurality of radiation transparent areas and/or a plurality of radiation reflective areas within each beam splitter area common to said transmitted beam portion and said reflected beam portion. 35. A non-dispersive infrared measuring arrangement in a multigas analyzer, comprising: a radiation source providing an IR-radiation beam; a measuring chamber for receiving a gas mixture to be analyzed, and adapted to transmission of said radiation beam; a beam splitter dividing said beam into at least one reflected beam portion and at least one transmitted beam portion; at least a first and a second detector unit both with at least two detectors; and optical filters positioned in said beam or beam portions ending in said detectors, said detector units being directed to receive said at least one reflected beam portion and said at least one transmitted beam portion respectively, wherein: said first detector unit and said second detector unit both have at least one first detector, said first detectors being measuring detectors each provided with an optical measurement filter, said filters having transmission wavelength bands adapted to detection of the concentration of a gas component in said gas mixture; and said first detector unit and said second detector unit both have at least one second detector, said second detectors being reference detectors each provided with an optical reference filter, said filters having transmission wavelength ranges, within which said gas component does not have substantial absorption; and said first detector in said first detector unit and said second detector in said second detector unit are positioned to constitute a first independent single path analyzer channel, and said second detector in said first detector unit and said first detector in said second detector unit are positioned to constitute a second independent single path analyzer channel. 36. A measuring arrangement according to claim 35, wherein said multigas analyzer is a mainstream analyzer. 37. A measuring arrangement according to claim 35, wherein said first detector and said second detector constituting an independent single path analyzer channel are positioned and directed towards a common beam splitter area, which divides said radiation beam or a section thereof transmitted through said measuring chamber into said first and second detector. 38. A measuring arrangement according to claim 35, wherein said measuring arrangement comprises a number of independent single path analyzer channels, and said number is at least equal to the number of those gas components to be analyzed in said gas mixture. 39. A measuring arrangement according to claim 35, wherein said optical measurement filters are interference filters selected from a group of optical filters including bandpass interference filters, and highpass interference filters, and lowpass interference filters, and gaseous filters providing attenuation of at least those wavelengths utilized for analysis. 40. A measuring arrangement according to claim 35, wherein said beam splitter is a physical beam splitter. 41. A measuring arrangement according to claim 40, wherein said physical beam splitter is a semi-transparent mirror proving a substantially even wavelength distribution both to said reflected and transmitted beam portions. 42. A measuring arrangement according to claim 40, wherein said physical beam splitter is an interference filter having bandpass or highpass or lowpass or bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 43. A measuring arrangement according to claim 40, wherein said beam splitter comprises at least two splitter segments side by side, or on top of each other, one splitter segment for one or more independent single path analyzer channel. 44. A measuring arrangement according to claim 43, wherein said at least two splitter segments have different transmission characteristics. 45. A measuring arrangement according to claim 44, wherein each of said at least two splitter segments is a semi-transparent mirror providing a substantially even wavelength distribution both to said reflected beam portion and to said transmitted beam portion. 46. A measuring arrangement according to claim 44, wherein each of said at least two splitter segments is an interference filter having bandpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 47. A measuring arrangement according to claim 44, wherein each of said at least two splitter segments is an interference filter having highpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 48. A measuring arrangement according to claim 44, wherein each of said at least two splitter segments is an interference filter having lowpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 49. A measuring arrangement according to claim 44, wherein each of said at least two splitter segments is an interference filter having bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 50. A measuring arrangement according to claim 44, wherein at least one of said splitter segments has characteristics of said optical measurement filter to said transmitted beam portion, or inverse characteristics of said optical measurement filter to said reflected beam portion. 51. A measuring arrangement according to claim 35, further comprising electronic processing units each of which being connected to said first detector and said second detector of each independent single path analyzer channel. 52. A measuring arrangement according to claim 35, further comprising radiation-conducting tubes in at least a measuring partial channel or a reference partial channel of one independent single path analyzer channel. 53. A measuring arrangement according to claim 35, wherein said beam splitter is a geometrical beam splitter having a plurality of radiation transparent areas and/or a plurality of radiation reflective areas within each beam splitter area common to said transmitted beam portion and said reflected beam portion. 54. A non-dispersive infrared measuring arrangement in a multigas analyzer, comprising: a radiation source providing an IR-radiation beam; a measuring chamber for receiving a gas mixture to be analyzed, and adapted to transmission of said radiation beam; a beam splitter dividing said beam into at least one reflected beam portion and at least one transmitted beam portion; at least a first and a second detector unit both with at least two detectors, and optical filters positioned in said beam or beam portions ending in said detectors, said detector units being directed to receive said at least one reflected beam portion and said at least one transmitted beam portion respectively, wherein: said first detector unit has at least two first detectors, said first detectors being measuring detectors each provided with an optical measurement filter, said filters having transmission wavelength bands adapted to detection of the concentration of a gas component in said gas mixture; and said second detector unit has at least two second detectors, said second detectors being reference detectors each provided with an optical reference filter, said filters having transmission wavelength ranges, within which said gas component does not have substantial absorption; and said first detector in said first detector unit and said second detector in said second detector unit are positioned to constitute a first independent single path analyzer channel, and said second detector in said first detector unit and said first detector in said second detector unit are positioned to constitute a second independent single path analyzer channel. 55. A measuring arrangement according to claim 54, wherein said multigas analyzer is a mainstream analyzer. 56. A measuring arrangement according to claim 54, wherein said first detector and said second detector constituting an independent single path analyzer channel are positioned and directed towards a common beam splitter area, which divides said radiation beam or a section thereof transmitted through said measuring chamber into said first and second detector. 57. A measuring arrangement according to claim 54, wherein said measuring arrangement comprises a number of independent single path analyzer channels, and said number is at least equal to the number of those gas components to be analyzed in said gas mixture. 58. A measuring arrangement according to claim 54, wherein said optical measurement filters are interference filters selected from a group of optical filters including bandpass interference filters, and highpass interference filters, and lowpass interference filters, and gaseous filters providing attenuation of at least those wavelengths utilized for analysis. 59. A measuring arrangement according to claim 54, wherein said beam splitter is a physical beam splitter. 60. A measuring arrangement according to claim 59, wherein said physical beam splitter is a semi-transparent mirror proving a substantially even wavelength distribution both to said reflected and transmitted beam portions. 61. A measuring arrangement according to claim 59, wherein said physical beam splitter is an interference filter having bandpass or highpass or lowpass or bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 62. A measuring arrangement according to claim 59, wherein said beam splitter comprises at least two splitter segments side by side, or on top of each other, one splitter segment for one or more independent single path analyzer channel. 63. A measuring arrangement according to claim 62, wherein said at least two splitter segments have different transmission characteristics. 64. A measuring arrangement according to claim 63, wherein each of said at least two splitter segments is a semi-transparent mirror providing a substantially even wavelength distribution both to said reflected beam portion and to said transmitted beam portion. 65. A measuring arrangement according to claim 63, wherein each of said at least two splitter segments is an interference filter having bandpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 66. A measuring arrangement according to claim 63, wherein each of said at least two splitter segments is an interference filter having highpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 67. A measuring arrangement according to claim 63, wherein each of said at least two splitter segments is an interference filter having lowpass characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 68. A measuring arrangement according to claim 63, wherein each of said at least two splitter segments is an interference filter having bandlimiting characteristics to said transmitted beam portion and inverse characteristics to said reflected beam portion respectively. 69. A measuring arrangement according to claim 63, wherein at least one of said splitter segments has characteristics of said optical measurement filter to said transmitted beam portion, or inverse characteristics of said optical measurement filter to said reflected beam portion. 70. A measuring arrangement according to any of claims 54, further comprising electronic processing units each of which being connected to said first detector and said second detector of each independent single path analyzer channel. 71. A measuring arrangement according to any of claims 54, further comprising radiation-conducting tubes in at least a measuring partial channel or a reference partial channel of one independent single path analyzer channel. 72. A measuring arrangement according to claim 54, wherein said beam splitter is a geometrical beam splitter having a plurality of radiation transparent areas and/or a plurality of radiation reflective areas within each beam splitter area common to said transmitted beam portion and said reflected beam portion.
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이 특허에 인용된 특허 (6)
Apperson Jerry R. (Seattle WA) Knodle Daniel W. (Seattle WA) Labuda Lawrence L. (Issaquah WA) Russell James T. (Bellevue WA) Bang Gary M. (Edmonds WA), Gas analysis transducers with electromagnetic energy detector units.
Drucker Steven (Oakland CA) Goder Alexey (El Cerrito CA) Khalili Davood (Santa Clara CA) Williams Kevin (Pinole CA) Christensen Ken (Livermore CA) Major Emery (Point Richmond CA), Respiratory gas analyzer.
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