Pad assembly for electrochemical mechanical processing
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
B24D-011/02
C25F-003/00
C25D-017/00
C25C-007/04
C25C-007/00
출원번호
US-0369065
(2006-03-06)
발명자
/ 주소
Chang,Shou Sung
Tsai,Stan D.
Olgado,Donald J. K.
Chen,Liang Yuh
Duboust,Alain
Wadensweiler,Ralph M.
출원인 / 주소
Applied Materials, Inc.
대리인 / 주소
Patterson and Sheridan
인용정보
피인용 횟수 :
9인용 특허 :
155
초록▼
Embodiments of a pad assembly for processing a substrate are provided. The pad assembly includes a processing layer having a working surface adapted to process a substrate, a lower layer coupled to and disposed below the processing layer, and an electrode having an upper surface disposed above the l
Embodiments of a pad assembly for processing a substrate are provided. The pad assembly includes a processing layer having a working surface adapted to process a substrate, a lower layer coupled to and disposed below the processing layer, and an electrode having an upper surface disposed above the lower layer and below the working surface of the processing layer. The upper surface of the electrode is at least partially exposed to the working surface to provide an electrolyte pathway between the upper surface of the electrode and the working surface.
대표청구항▼
The invention claimed is: 1. A pad assembly for processing a substrate, comprising: a processing layer having a working surface to contact the substrate; a compressible layer coupled to and disposed below the processing layer; and an electrode having an upper surface and a lower surface, the upper
The invention claimed is: 1. A pad assembly for processing a substrate, comprising: a processing layer having a working surface to contact the substrate; a compressible layer coupled to and disposed below the processing layer; and an electrode having an upper surface and a lower surface, the upper surface disposed above the compressible layer and below the working surface of the processing layer, wherein the upper surface of the electrode is at least partially exposed to the processing surface. 2. The pad assembly of claim 1, wherein at least one aperture is formed through the compressible layer, the processing layer, and the electrode, and each of the at least one apertures is sized to allow at least one conductive contact element to pass therethrough. 3. The pad assembly of claim 2, wherein the at least one aperture is a single aperture formed through the center of the compressible layer, the processing layer, and the electrode. 4. The pad assembly of claim 1, wherein the processing layer is made of a dielectric material. 5. The pad assembly of claim 1, wherein the upper surface of the electrode is exposed to the working surface through a plurality of holes formed through the processing layer. 6. The pad assembly of claim 5, wherein the plurality of holes are formed in a rectangular pattern. 7. The pad assembly of claim 5, wherein the plurality of holes are formed in a triangular pattern. 8. The pad assembly of claim 5, wherein the plurality of holes defines an open area of between about 10 to about 90 percent. 9. The pad assembly of claim 5, wherein the plurality of holes further comprises: at least two groups of holes formed in a concentric pattern. 10. The pad assembly of claim 1, wherein the compressible layer, electrode, and processing layer are coupled together by an adhesive. 11. The pad assembly of claim 10, further comprising: an adhesive layer formed on a bottom of the compressible layer; and a removable liner covering the adhesive layer. 12. The pad assembly of claim 1, wherein the electrode is made of one of copper, titanium, tin, nickel, or stainless steel. 13. The pad assembly of claim 1, wherein the electrode is made of a metal foil. 14. The pad assembly of claim 1, wherein the electrode is a mesh comprised of metal wire or metal-coated wire. 15. The pad assembly of claim 1, wherein the electrode is a laminate of a metal foil on top of a polyimide, polyester, flouroethylene, polypropylene, or polyethylene film. 16. The pad assembly of claim 1, wherein the electrode further comprises a plurality of holes formed therethrough and wherein the processing layer protrudes through the plurality of holes. 17. The pad assembly of claim 16, wherein at least one aperture is formed through the compressible layer, the processing layer, and the electrode, and the at least one aperture is sized to allow at least one conductive contact element to pass therethrough. 18. The pad assembly of claim 16, wherein the working surface is dielectric. 19. A pad assembly for processing a substrate, comprising: an upper layer having a dielectric working surface and a lower surface, the dielectric working surface adapted to contact the substrate and having at least one groove and a plurality of holes formed through the upper layer within the at least one groove, the plurality of holes extending to the lower surface; a conductive material coupled to the lower surface of the upper layer; and at least one conductive contact element disposed through the pad assembly to contact the substrate when the substrate is disposed on the working surface, wherein the at least one conductive contact element is electrically insulated from the conductive material. 20. The pad assembly of claim 19, wherein a single aperture is formed through the center of the upper layer and the electrode, and the at least one contact element is disposed through the single aperture. 21. The pad assembly of claim 19, wherein the at least one groove is two or more sets of parallel grooves. 22. The pad assembly of claim 21, wherein the two or more sets of parallel grooves are two sets of parallel grooves orthogonally arranged to form a grid. 23. The pad assembly of claim 21, wherein the plurality of holes in the upper layer are further located at intersections of the grooves. 24. The pad assembly of claim 19, wherein the conductive material is one of copper, titanium, tin, nickel, or stainless steel. 25. The pad assembly of claim 19, further comprising: a subpad disposed below the conductive material. 26. A replaceable pad assembly for electro-mechanical processing a substrate, comprising: an upper layer having a dielectric working surface adapted to contact the substrate, the dielectric working surface having at least one groove; a conductive layer coupled to the working surface; and a compressible layer disposed below the conductive layer; wherein a plurality of holes are formed through the upper layer within the at least one groove and extending from the groove to the conductive layer. 27. The pad assembly of claim 26, wherein the plurality of holes define an open area of about 10% to about 90%. 28. The pad assembly of claim 26, wherein a single aperture is formed through the working surface, the conductive layer, and the compressible layer, and the single aperture is sized to allow at least one conductive contact element to pass therethrough. 29. The pad assembly of claim 26, wherein the plurality of holes are arranged in a uniformly distributed pattern. 30. The pad assembly of claim 26, wherein the conductive layer is one of copper, titanium, tin, nickel, or stainless steel. 31. The pad assembly of claim 26, further comprising: a terminal coupled to the conductive layer to provide electrical communication from a power source to the conductive layer. 32. The pad assembly of claim 26, wherein the upper layer further comprises: a plurality of raised portions extending through the conductive layer to form a plurality of decoupled islands defining the working surface.
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이 특허에 인용된 특허 (155)
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