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Indentation hardness test system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0170694 (2005-06-29)
발명자 / 주소
  • Hauck,John Michael
  • Barfoot,David Andrew
출원인 / 주소
  • Leco Corporation
대리인 / 주소
    Price, Heneveld, Cooper, DeWitt &
인용정보 피인용 횟수 : 13  인용 특허 : 37

초록

An indentation hardness test system includes a frame including an attached indenter, a movable stage for receiving a part attached to the frame, a camera, a display, a processor and a memory subsystem. The camera captures images of the part, which can then be provided on the display. The processor i

대표청구항

The invention claimed is: 1. An indentation hardness test system, comprising: a frame including an attached indenter; a movable stage for receiving a part attached to the frame; a camera for capturing images of the part; a display; a processor electrically coupled to the movable stage, the camera

이 특허에 인용된 특허 (37)

  1. Silver Robert B., Analytical imaging system and process.
  2. Aloni Meir (Herzliya ILX) Alon Amir (Yahud ILX) Eran Yair (Rehovot ILX) Katz Itzhak (Givat Shmuel ILX) Katzir Yigal (Holon ILX) Rosenfeld Gideon (Tel Aviv ILX), Apparatus and method for inspection of a patterned object by comparison thereof to a reference.
  3. Aloni Meir (Herzliya ILX) Alon Amir (Yahud ILX) Eran Yair (Rehovot ILX) Katz Itzhak (Givat Shmuel ILX) Katzir Yigal (Holon ILX) Rosenfeld Gideon (Tel Aviv ILX), Apparatus and method for inspection of a patterned object by comparison thereof to a reference.
  4. Meir Aloni IL; Amir Alon IL; Yair Eran IL; Itzhak Katz IL; Yigal Katzir IL; Gideon Rosenfeld IL, Apparatus and method for microscopic inspection of articles.
  5. Dailey David C. (West Trenton NJ) Mott Richard B. (Ringoes NJ), Apparatus and method for processing digital images.
  6. Ohtombe Ko (Kanagawa JPX) Nishikawa Masamitu (Yokosuka JPX), Apparatus for inspecting the surface of a material.
  7. Tsukada Kouki (Kawasaki JPX), Apparatus for positioning a semiconductor wafer.
  8. Khalaj Babak H. (Stanford CA) Aghajan Hamid K. (Stanford CA) Kailath Thomas (Stanford CA), Automated direct patterned wafer inspection.
  9. Uga Masanori (Hachioji JPX), Automatic accurate alignment system.
  10. Csipkes Andrei ; Palmquist John Mark, Balanced focus system and method for achieving optimal focus of different areas of an object that are concurrently image.
  11. Biddle ; Jr. Ernest L. (1028 Great Springs Rd. Bryn Mawr PA 19010) Laessig John D. (833 Malin Rd. Newtown Square PA 19073) Oehrle John B. (803 Newtown Rd. Villanova PA 19085), Brinell hardness indicator with digital readout.
  12. Mitsumune Toshifumi,JPX ; Tanaka Kengo,JPX ; Tanaka Toshiaki,JPX, Checking apparatus for flat type display panels.
  13. Pettersson Magnus,SEX ; Rosenqvist Anders,SEX ; Heyden Anders,SEX ; Almers Martin,SEX, Feature-free registration of dissimilar images using a robust similarity metric.
  14. Nakao, Toshiyasu; Kashitani, Atsushi, Image input method, image input apparatus, and recording medium.
  15. Zahavi Dov (12 Eilat Street Haifa ILX), Imaging of 3-dimensional objects.
  16. Brown Douglas,GBX, Imaging system.
  17. Sugimoto Takao (Sagamihara JPX) Nishimura Takehiro (Muroran JPX) Fujikake Yohichi (Kimitsu JPX) Yamaguchi Akiomi (Kimitsu JPX), Indentation hardness tester.
  18. Bacus James V. ; Bacus James W., Method and apparatus for acquiring and reconstructing magnified specimen images from a computer-controlled microscope.
  19. Bacus James V. ; Bacus James W., Method and apparatus for acquiring and reconstructing magnified specimen images from a computer-controlled microscope.
  20. Sandland Paul (Gilroy CA) Chadwick Curt H. (Los Altos CA) Singleton Russell M. (Sunnyvale CA) Dwyer Howard (Mountain View CA), Method and apparatus for automatic wafer inspection.
  21. Bacus James V. ; Bacus James W., Method and apparatus for creating a virtual microscope slide.
  22. Bergen James R., Method and apparatus for extended depth of field imaging.
  23. Wilson Monti R. (7906 W. 99th St. Overland Park KS 66212), Method and apparatus for fast registration using crosshair register marks.
  24. Wasserman Harold (Belle Mead NJ), Method and apparatus for inspecting printed circuit boards at different magnifications.
  25. Lacey Christopher (San Diego CA), Method and apparatus for measurement of roughness and hardness of a surface.
  26. Baldur Roman,CAX, Method and apparatus for obtaining a signature from a fired bullet.
  27. Bacus James W. ; Bacus James V., Method and apparatus for testing a progression of neoplasia including cancer chemoprevention testing.
  28. Takashi Hiroi JP; Maki Tanaka JP; Masahiro Watanabe JP; Asahiro Kuni JP; Hiroyuki Shinada JP; Mari Nozoe JP; Aritoshi Sugimoto JP; Chie Shishido JP, Method and system for inspecting a pattern.
  29. Todd J. Stephan ; David A. Noblett ; Jun Yang, Method and system for overlaying at least three microarray images to obtain a multicolor composite image.
  30. Bishop Robert (Brookline MA) Schwenke Derek (Lexington MA), Method of and apparatus for real-time high-speed inspection of objects for identifying or recognizing known and unknown.
  31. Schmucker Mark A. ; Becker Brian W., Method of combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composit.
  32. Vogt Robert C. ; Trenkle John M., Mosaic construction, processing, and review of very large electronic micrograph composites.
  33. Dobschal Hans-Juergen,DEX ; Fuchs Werner,DEX ; Graefe Dieter,DEX ; Gauglitz Guenter,DEX ; Brecht Andreas,DEX, Process and apparatus for detecting structural changes of specimens.
  34. Schoeppe, Guenter, Process and apparatus for determining surface information using a projected structure with a periodically changing brightness curve.
  35. Kley Vic B., Scanning probe microscope assembly and method for making confocal, spectrophotometric, Near-Field, and Scanning probe measurements and associated images.
  36. Schmucker Mark A. ; Schmit Joanna, Selection process for sequentially combining multiple sets of overlapping surface-profile interferometric data to produ.
  37. Oren Aharon IL, Wide-field scanning tv.

이 특허를 인용한 특허 (13)

  1. Barfoot, David A.; Maida, John L., Distributed acoustic sensing systems and methods employing under-filled multi-mode optical fiber.
  2. Barfoot, David A.; Maida, John L., Distributed acoustic sensing systems and methods employing under-filled multi-mode optical fiber.
  3. Muraoka, Hiroshi; Matsushita, Kazuhiro, Hardness tester.
  4. Meadow, William D.; Gordie, Jr., Randall A., Internet-accessible real estate marketing street view system and method.
  5. Meadow, William D.; Gordie, Jr., Randall A., Method and apparatus of providing street view data of a comparable real estate property.
  6. Meadow, William D.; Gordie, Jr., Randall A., Method and apparatus of providing street view data of a real estate property.
  7. Meadow, William D.; Gordie, Jr., Randall A., Method for using drive-by image data to generate a valuation report of a selected real estate property.
  8. Meadow, William D.; Gordie, Jr., Randall A., Method of providing street view data of a real estate property.
  9. Meadow, William D.; Gordie, Jr., Randall A.; Pavelle, Matthew, Methods and apparatus for generating three-dimensional image data models.
  10. Meadow, William D.; Gordie, Jr., Randall A.; Pavelle, Matthew, Methods for and apparatus for generating a continuum of three dimensional image data.
  11. Meadow, William D.; Gordie, Jr., Randall A., Methods for and apparatus for generating a continuum of three-dimensional image data.
  12. Meadow, William D.; Gordie, Jr., Randall A.; Pavelle, Matthew, Three dimensional image data models.
  13. Wu, Shaoming; Wu, Richard, Universal testing machine.
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