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Multivariate control of semiconductor processes 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-019/00
출원번호 US-0229153 (2005-09-16)
발명자 / 주소
  • Lin,Kuo Chin
출원인 / 주소
  • MKS Instruments, Inc.
대리인 / 주소
    Proskauer Rose LLP
인용정보 피인용 횟수 : 48  인용 특허 : 10

초록

A method for detecting a fault condition of a manufacturing process involving acquiring data and developing a model based on a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process. The method also involves identifying which of the manufacturing related v

대표청구항

What is claimed is: 1. A method for detecting a fault condition of a manufacturing process, comprising: a) acquiring data associated with a plurality of manufacturing related variables for a plurality of outputs of a manufacturing process; b) developing a model based on the data for detecting fault

이 특허에 인용된 특허 (10)

  1. Mack, Chris; Jones, Robert; Byers, Jeffrey, Computer-implemented method and carrier medium configured to generate a set of process parameters for a lithography process.
  2. Bode, Christopher A.; Toprac, Anthony J., Method for identifying and controlling impact of ambient conditions on photolithography processes.
  3. Christopher A. Bode ; Anthony J. Toprac, Method for identifying and controlling impact of ambient conditions on photolithography processes.
  4. Bode, Christopher Allen; Toprac, Anthony J., Method for relating photolithography overlay target damage and chemical mechanical planarization (CMP) fault detection to CMP tool indentification.
  5. Le Minh ; Chen Kuang Han ; Smith Taber H. ; Boning Duane S. ; Sawin Herbert H., Monitor of plasma processes with multivariate statistical analysis of plasma emission spectra.
  6. Mozumder Purnendu K. (Plano TX) Saxena Sharad (Dallas TX) Pu William W. (Plano TX), Multi-variable statistical process controller for discrete manufacturing.
  7. Fox Edward P. (Austin TX) Kappuswamy Chandru (Austin TX), Real time control of plasma etch utilizing multivariate statistical analysis.
  8. Harvey, Kenneth C.; Hosch, Jimmy W.; Gallagher, Neal B.; Wise, Barry M., System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectra.
  9. Firth, Stacy; Campbell, W. Jarrett, System and method for estimating error in a manufacturing process.
  10. Raymond J. Bunkofske ; John Z. Colt, Jr. ; James J. McGill ; Nancy T. Pascoe ; Maheswaran Surendra ; Marc A. Taubenblatt ; Asif Ghias, User configurable multivariate time series reduction tool control method.

이 특허를 인용한 특허 (48)

  1. Miller, John Philip, Abnormal situation prevention in a heat exchanger.
  2. Harvey, Jr., Jerry Lynn; Schwarm, Alexander T., Adaptive multivariate fault detection.
  3. Purdy, Matthew A., Adjusting weighting of a parameter relating to fault detection based on a detected fault.
  4. Kettaneh, Nouna; Wold, Svante Bjarne, Automated model building and batch model building for a manufacturing process, process monitoring, and fault detection.
  5. Hendler, Lawrence; Lazarovich, Stela Diamant; Hadar, Ron; Kettaneh, Nouna; Levami, Uzi; Perlroizen, Dmitry, Automated model building and model updating.
  6. Ko, Francis; Lai, Chih-Wei; Zuo, Kewei; Lo, Henry; Wang, Jean; Chen, Ping-Hsu; Lim, Chun-Hsien; Yu, Chen-Hua, Automatic virtual metrology for semiconductor wafer result prediction.
  7. Johnson, Christopher S.; Geiger, Jason S.; Graef, John T., Collection, monitoring, analyzing and reporting decay rate of traffic speed data via vehicle sensor devices placed at multiple remote locations.
  8. Johnson, Christopher S.; Geiger, Jason S.; Graef, John T., Collection, monitoring, analyzing and reporting of traffic data via vehicle sensor devices placed at multiple remote locations.
  9. Johnson, Christopher S.; Geiger, Jason S.; Graef, John T., Collection, monitoring, analyzing and reporting of traffic data via vehicle sensor devices placed at multiple remote locations.
  10. Johnson, Christopher S.; Geiger, Jason S.; Graef, John T., Collection, monitoring, analyzing and reporting of traffic data via vehicle sensor devices placed at multiple remote locations.
  11. Johnson, Christopher S.; Geiger, Jason S.; Graef, John T., Collection, monitoring, analyzing and reporting of traffic data via vehicle sensor devices placed at multiple remote locations to create traffic priority enforcement reports.
  12. Fuxman, Adrian Matias; Pachner, Daniel, Condition-based powertrain control system.
  13. Stewart, Greg; Borrelli, Francesco; Pekar, Jaroslav, Configurable automotive controller.
  14. Hazen, Daniel Robert; Ambrozic, Christopher Paul; McCready, Christopher Peter, Controlling a discrete-type manufacturing process with a multivariate model.
  15. McCready, Christopher Peter; Wold, Svante Bjarne, Controlling a manufacturing process with a multivariate model.
  16. Stewart, Greg; Pekar, Jaroslav; Pachner, Daniel, Coordinated engine and emissions control system.
  17. Smith, Donville; Suero, Marcos; More, Eduardo J.; Moncrief, Jr., Gary; Chaney, Jennifer D., Data analysis applications.
  18. Otts, Daniel W., Designating corridors to provide estimates of structures.
  19. Pachner, Daniel; Pekar, Jaroslav, Engine and aftertreatment optimization system.
  20. Stewart, Gregory E.; Rhodes, Michael L., Engine controller.
  21. Otts, Daniel W., Fusing multi-sensor data sets according to relative geometrical relationships.
  22. Howe, Benjamin M.; Otts, Daniel W.; Smith, Winthrop W., Fusing multi-sensor data to provide estimates of structures.
  23. Otts, Daniel W., Fusing structures from multi-sensor data.
  24. Lin, Y. Sean; Schwarm, Alexander T., Graphical user interface for presenting multivariate fault contributions.
  25. Lin, Y. Sean; Schwarm, Alexander T., Graphical user interface for presenting multivariate fault contributions.
  26. Pachner, Daniel, Identification approach for internal combustion engine mean value models.
  27. Matsushita, Hiroshi; Sugamoto, Junji; Asano, Masafumi, Management system of semiconductor fabrication apparatus, abnormality factor extraction method of semiconductor fabrication apparatus, and management method of the same.
  28. Assaf, Shay; Babu, Venkatesh; Flores, Robert D.; Hickey, Brendan; Kuttannair, Krishna; Park, Song J.; Rhee, Adrian; Wang, Chongyang Chris, Method and system for managing process jobs in a semiconductor fabrication facility.
  29. Kihas, Dejan, Method and system for updating tuning parameters of a controller.
  30. Kihas, Dejan, Method and system for updating tuning parameters of a controller.
  31. Pekar, Jaroslav; Borralli, Francesco; Stewart, Gregory, Methods and systems for the design and implementation of optimal multivariable model predictive controllers for fast-sampling constrained dynamic systems.
  32. Pekar, Jaroslav; Borrelli, Francesco; Stewart, Gregory, Methods and systems for the design and implementation of optimal multivariable model predictive controllers for fast-sampling constrained dynamic systems.
  33. Lin, Y. Sean; Clements, III, William R.; Schwarm, Alexander T., Metrics independent and recipe independent fault classes.
  34. Liu, Ru-Gun; Lai, Chih-Ming; Huang, Wen-Chun; Luo, Boren; Shin, I-Chang; Ku, Yao-Ching; Hou, Cliff, Model import for electronic design automation.
  35. Liu, Ru-Gun; Lai, Chih-Ming; Huang, Wen-Chun; Luo, Boren; Shin, I-Chang; Ku, Yao-Ching; Hou, Cliff, Model import for electronic design automation.
  36. McCready, Christopher Peter, Multivariate monitoring of a batch manufacturing process.
  37. McCready, Chris Peter, Multivariate prediction of a batch manufacturing process.
  38. Stewart, Gregory; Shahed, Syed M.; Borrelli, Francesco; Hampson, Gregory J., Pedal position and/or pedal change rate for use in control of an engine.
  39. Harvey, Jr., Jerry Lynn; Schwarm, Alexander T., Ranged fault signatures for fault diagnosis.
  40. Chang, Yi Chun; Pao, Chan An; Tsai, Cheng Tso, Real-time fault detection and classification system in use with a semiconductor fabrication process.
  41. Lev-Ami, Uzi Josef; Hendler, Lawrence, Self-correcting multivariate analysis for use in monitoring dynamic parameters in process environments.
  42. Shimshi, Rinat, Software application to analyze event log and chart tool fail rate as function of chamber and recipe.
  43. Baseman, Robert J.; Dhurandhar, Amit; Tipu, Fateh A., System and method for identifying significant and consumable-insensitive trace features.
  44. Esmaili, Ali; Mehta, Sanjay; Neogi, Debashis; Valenzuela, Carlos A., System and method for process monitoring.
  45. Hou, Yung-Chin; Cheng, Ying-Chou; Liu, Ru-Gun; Lai, Chih-Ming; Cheng, Yi-Kan; Lin, Chung-Kai; Chao, Hsiao-Shu; Yeh, Ping-Heng; Wu, Min-Hong; Ku, Yao-Ching; Ou, Tsong-Hua, Table-based DFM for accurate post-layout analysis.
  46. Stafford, Richard; Norman, David E., Use of prediction data in monitoring actual production targets.
  47. Pekar, Jaroslav; Stewart, Gregory E., Using model predictive control to optimize variable trajectories and system control.
  48. Markham, Thomas R., Vehicle security module system.
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