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Strained silicon structure 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-029/06
  • H01L-029/02
출원번호 US-0114981 (2005-04-26)
발명자 / 주소
  • Ge,Chung Hu
  • Lee,Wen Chin
  • Hu,Chenming
출원인 / 주소
  • Taiwan Semiconductor Manufacturing Company, Ltd.
대리인 / 주소
    Slater & Matsil, L.L.P.
인용정보 피인용 횟수 : 2  인용 특허 : 42

초록

초록이 없습니다.

대표청구항

대표청구항이 없습니다.

이 특허에 인용된 특허 (42)

  1. Ismail Khaled E. (Cairo NY EGX) Stern Frank (Pleasantville NY), Complementary metal-oxide semiconductor transistor logic using strained SI/SIGE heterostructure layers.
  2. Fitzgerald Eugene A., Controlling threading dislocation densities in Ge on Si using graded GeSi layers and planarization.
  3. Fitzgerald, Eugene A., Low threading dislocation density relaxed mismatched epilayers without high temperature growth.
  4. Tien-Hsi Lee TW, Manufacturing method of a thin film on a substrate.
  5. Rajgopal Rajan,INX ; Taylor Kelly J. ; Seha Thomas R. ; Joyner Keith A., Mesa isolation Refill Process for Silicon on Insulator Technology Using Flowage Oxides as the Refill Material.
  6. Miyazawa Yoshihiro,JPX ; Ohkubo Yasunori,JPX, Method and apparatus for wafer bonding.
  7. Louis L. Hsu ; Li-Kong Wang, Method for increasing a very-large-scale-integrated (VLSI) capacitor size on bulk silicon and silicon-on-insulator (SOI) wafers and structure formed thereby.
  8. Orin Wayne Holland ; Darrell Keith Thomas ; Richard Bayne Gregory ; Syd Robert Wilson ; Thomas Allen Wetteroth, Method for transfer of thin-film of silicon carbide via implantation and wafer bonding.
  9. Shunpei Yamazaki JP; Hisashi Ohtani JP, Method of fabricating a high reliable SOI substrate.
  10. Hunter William R. (Garland TX) Slawinski Christopher (Austin TX) Teng Clarence W. (Plano TX), Method of fabricating defect free trench isolation devices.
  11. Bin Yu ; William G. En ; Judy Xilin An ; Concetta E. Riccobene, Method of fabrication of semiconductor-on-insulator (SOI) wafer having a Si/SiGe/Si active layer.
  12. Goesele Ulrich M. (3008 Eubanks Rd. Durham NC 27707) Lehmann Volker E. (Zweitorstr. 91 D-406 Viersen 1 DEX), Method of producing a thin silicon on insulator layer by wafer bonding and chemical thinning.
  13. Godbey David J. (Bethesda MD) Hughes Harold L. (West River MD) Kub Francis J. (Severna Park MD), Method of producing a thin silicon-on-insulator layer.
  14. Kern Rim, Method to fabricate a strained Si CMOS structure using selective epitaxial deposition of Si after device isolation formation.
  15. Andres Bryant ; William F. Clark, Jr. ; Edward J. Nowak ; Minh H. Tong, Methods for forming decoupling capacitors.
  16. Reinberg Alan R., Methods of forming silicon-comprising materials having roughened outer surfaces, and methods of forming capacitor constructions.
  17. Hsu Sheng T. (Camas WA), Nitridation of SIMOX buried oxide.
  18. Pinker Ronald D. (Peekskill NY) Merchant Steven L. (Yorktown Heights NY) Arnold ; Emil (Chappaqua NY), Process for making thin film silicon-on-insulator wafers employing wafer bonding and wafer thinning.
  19. Alexander Yuri Usenko, Process for manufacturing a silicon-on-insulator substrate and semiconductor devices on said substrate.
  20. Bruel Michel,FRX ; Poumeyrol Thierry,FRX, Process for the production of a structure having a thin semiconductor film on a substrate.
  21. Bruel Michel (Veurey FRX), Process for the production of thin semiconductor material films.
  22. Ek Bruce A. ; Iyer Subramanian Srikanteswara ; Pitner Philip Michael ; Powell Adrian R. ; Tejwani Manu Jamndas, Production of substrate for tensilely strained semiconductor.
  23. Fitzgerald, Eugene A., Relaxed silicon germanium platform for high speed CMOS electronics and high speed analog circuits.
  24. Nakamura Kazuyo,JPX, SOI semiconductor device with low concentration of electric field around the mesa type silicon.
  25. Sarma Kalluri R. (Mesa AZ) Liu Michael S. (Bloomington MN), SOI substrate fabrication.
  26. Belleville, Marc; Bruel, Michel, SOI type integrated circuit with a decoupling capacity and process for embodiment of such a circuit.
  27. Tsutomu Tezuka JP, Semiconductor device and method of manufacturing the same.
  28. Suzuki Megumi (Toyota JPX) Tsuruta Kazuhiro (Toyoake JPX) Asai Akiyoshi (Aichi-gun JPX), Semiconductor device having an SOI structure of mesa isolation type and manufacturing method therefor.
  29. Yamamichi, Shintaro; Mori, Toru; Shibuya, Akinobu; Yamazaki, Takao; Shimada, Yuzo, Semiconductor device, and thin film capacitor.
  30. Hause Fred N. ; Dawson Robert ; May Charles E. ; Gardner Mark I. ; Chang Kuang-Yeh, Semiconductor trench isolation process resulting in a silicon mesa having enhanced mechanical and electrical properties.
  31. Qi Xiang, Semiconductor-on-insulator device with nitrided buried oxide and method of fabricating.
  32. Benedict John Preston ; Dobuzinsky David Mark ; Flaitz Philip Lee ; Hammerl Erwin N.,DEX ; Ho Herbert ; Moseman James F. ; Palm Herbert,DEX ; Yoshida Seiko,JPX ; Takato Hiroshi, Shallow trench isolation with oxide-nitride/oxynitride liner.
  33. Benedict John Preston ; Dobuzinsky David Mark ; Flaitz Philip Lee ; Hammerl Erwin N.,DEX ; Ho Herbert ; Moseman James F. ; Palm Herbert,DEX ; Yoshida Seiko,JPX ; Takato Hiroshi, Shallow trench isolation with oxide-nitride/oxynitride liner.
  34. Fahey Paul M. (Saratoga CA) Hammerl Erwin (Stormville NY) Ho Herbert L. (Washingtonville NY) Morikado Mutsuo (Fishkill NY), Shallow trench isolation with thin nitride liner.
  35. Ismail Khalid EzzEldin ; Meyerson Bernard S., Si/SiGe vertical junction field effect transistor.
  36. Burghartz Joachim N. (Shrub Oak NY) Meyerson Bernard S. (Yorktown Heights NY) Sun Yuan-Chen (Katonah NY), SiGe thin film or SOI MOSFET and method for making the same.
  37. Helmut Puchner, Silicon carbide CMOS channel.
  38. Ipri ; Alfred C., Silicon resistive device for integrated circuits.
  39. Bliss David F. ; Demczyk Brian G. ; Bailey John, Silicon-germanium bulk alloy growth by liquid encapsulated zone melting.
  40. Henley Francois J. ; Cheung Nathan W., Silicon-on-silicon wafer bonding process using a thin film blister-separation method.
  41. Chu Jack Oon ; Ismail Khalid EzzEldin, Strained Si/SiGe layers on insulator.
  42. Hommei Takao (Hitachinaka JPX) Takuma Yutaka (Tokyo JPX) Takeshima Hirotaka (Ryugasaki JPX) Takeuchi Hiroyuki (Kashiwa JPX) Miyamoto Yoshiyuki (Abiko JPX) Fukutomi Kiyoshi (Tokyo JPX) Kawano Hajime (, Superconducting magnet apparatus using superconducting multilayer composite member, method of magnetizing the same and m.

이 특허를 인용한 특허 (2)

  1. Lutz, Robert C., Methods of forming semiconductor devices by forming semiconductor channel region materials prior to forming isolation structures.
  2. Dove, Barry, Structure and method for making a strained silicon transistor.
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