초록 ▼

The present invention provides systems and methods for testing and storage of information related to a component. A data collection device having a memory is fixedly connected to the component. A test device communicates with the data collection device to store test data concerning the component in

The present invention provides systems and methods for testing and storage of information related to a component. A data collection device having a memory is fixedly connected to the component. A test device communicates with the data collection device to store test data concerning the component in the data collection device. The test device also performs analysis of the test data and provides information concerning the health and maintenance history of the component. The present invention also provides systems and methods for determining the current drawn or supplied by electrical components connected in parallel in an electrical system. A current sensor located between the electrical components determines the current supply or draw of one of the electrical components, while a current sensor between the electrical components and the remainder of the electrical system determine a cumulative current draw or supply by both the electrical components.

대표청구항 ▼

That which is claimed: 1. A system for testing and data storage of information related to at least one component of an electrical system, said system comprising: a data collection device fixedly connected to the electrical component, wherein said data collection device includes a memory, wherein sa

That which is claimed: 1. A system for testing and data storage of information related to at least one component of an electrical system, said system comprising: a data collection device fixedly connected to the electrical component, wherein said data collection device includes a memory, wherein said data collection device is encased in a housing for protecting said data collection device, wherein said housing is independent of any housing of the electrical system, such that said data collective device is a self-contained device; and a test device capable of performing at least a test operation on the electric component, wherein said test device stores information concerning the test operation in the memory of said data collection device, such that information concerning the test operation are resident with the electrical component. 2. A system according to claim 1, wherein said electrical component is a battery. 3. A system according to claim 1, wherein said electrical component is an alternator. 4. A system according to claim 1, wherein said test device is a tester. 5. A system according to claim 1, wherein said test device is a charger. 6. A system according to claim 1, wherein both said data collection device and test device further include a transceiver for communicating information between said collection and test devices. 7. A system according to claim 6, wherein said transceivers are RF transceivers. 8. A system according to claim 6, wherein said transceivers are IR transceivers. 9. A system according to claim 1, wherein said electrical component is a battery and wherein said test device tests a parameter of the electrical component selected from the group consisting of cold cranking amps, reserve charge level, and state of charge. 10. A system according to claim 1, wherein said electrical component is an alternator and wherein said test device tests a parameter of the electrical component selected from the group consisting of output voltage versus current, waveform shape of the voltage output, and temperature of the alternator. 11. A system according to claim 1, wherein said data collection device is an RF-chip. 12. A system according to claim 1, wherein the housing of said data collection device has an adhesive surface connecting said data collection device to the electrical component. 13. A system according to claim 1, wherein said housing is cylindrical in shape defined by a body extending between circular ends. 14. A system for testing and data storage of information related to at least one component of an electrical system, said system comprising: a data collection device fixedly connected to the electrical component, wherein said data collection device includes a memory, wherein said data collection device is encased in a housing for protecting said data collection device, and wherein said housing is positioned on a surface of the electrical component and a lamination is applied over the housing and at least a portion of the surface of the electrical component to thereby secure said housing to said electrical component; and a test device capable of performing at least a test operation on the electric component, wherein said test device stores information concerning the test operation in the memory of said data collection device, such that information concerning the test operation are resident with the electrical component. 15. A system for testing and data storage of information related to at least one component of an electrical system, wherein said system comprises: a memory device for storing information related to tests performed on said electrical component; a transceiver in electrical communication with said memory device, wherein said transceiver transmits data stored in said memory device to a test device used to test the said electrical component and for receiving data from the test device for storage in said memory device; and a housing surrounding said memory device and said transceiver, wherein said housing is fixedly connected to the component, such that information stored in said memory device concerning the component is resident on the component, wherein said housing is independent of any housing of the electrical system, such that said data collective device is a self-contained device. 16. A system according to claim 15, wherein said housing is cylindrical in shape defined by a body extending between circular ends.