IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0294608
(2002-11-15)
|
등록번호 |
US-7283165
(2007-10-16)
|
발명자
/ 주소 |
- Alderson,Timothy
- Tener,Gene D.
- Davis,Jeffrey M.
|
출원인 / 주소 |
- Lockheed Martin Corporation
|
대리인 / 주소 |
Buchanan Ingersoll & Rooney PC
|
인용정보 |
피인용 횟수 :
15 인용 특허 :
10 |
초록
▼
A method of processing image data comprises obtaining a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, obtaining
A method of processing image data comprises obtaining a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, obtaining information identifying one or more defective sensing elements of the detector array, receiving image data from the detector array, calculating a weighted average of pixel values from sensing elements adjacent to a first defective sensing element of the detector array using at least some of the weighting coefficients, and assigning the weighted average to be a replacement pixel value for the first defective sensing element. An apparatus for processing image data according to the method is also described.
대표청구항
▼
What is claimed is: 1. An apparatus for processing image data, comprising: a memory; and a processing unit coupled to the memory, the processing unit being configured to obtain a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing eleme
What is claimed is: 1. An apparatus for processing image data, comprising: a memory; and a processing unit coupled to the memory, the processing unit being configured to obtain a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, wherein the set of weighting coefficients is configured as a two-dimensional array of (N쨌M)-1 weighting coefficients, N and M being integers, and values for N and M are chosen based upon a size of a blur spot in a plane of the detector array, the blur spot being associated with the detector array and a corresponding optical system, obtain information identifying one or more defective sensing elements of the detector array, receive image data of an image from the detector array, calculate a weighted average of pixel values from sensing elements adjacent to a first defective sensing element of the detector array using at least some of the weighting coefficients, and assign the weighted average to be a replacement pixel value for the first defective sensing element. 2. The apparatus of claim 1, wherein the sensing elements adjacent to the first defective sensing element are located within 짹3 units of the first defective pixel in at least one of two directions, wherein a size of one unit in a given direction is equivalent to size of one sensing element of the detector array in that direction. 3. The apparatus of claim 1, wherein the blur spot encompasses an area at least of N쨌M units in the plane of the detector array, and wherein a size of one unit in a given direction is equivalent to size of one sensing element of the detector array in that direction. 4. The apparatus of claim 3, wherein M=3 and N=5. 5. The apparatus of claim 1, wherein the set of weighting coefficients is generated using an empirical calculation and using calibration data of a calibration image, the calibration image data obtained with the detector array and the corresponding optical system. 6. The apparatus of claim 5, wherein the empirical calculation for generating the weighting coefficients comprises: assigning starting values to the weighting coefficients; calculating test replacement data from the calibration data using existing values of the weighting coefficients; calculating difference data from the test replacement data and the calibration data; calculating an assessment parameter for the difference data; determining whether the assessment parameter satisfies a predetermined condition; and updating the weighting coefficients based upon the assessment parameter if the assessment does not satisfy the predetermined condition. 7. The apparatus of claim 6, wherein calculating test replacement data comprises: selecting a pixel of the calibration data of the calibration image; summing weighted contributions of pixel values in an area of the calibration image surrounding the selected pixel using existing values of the weighting coefficients to generate a sum; assigning the sum to be a test replacement value for the selected pixel; and repeating the three immediately preceding steps for each pixel of the calibration data of the calibration image. 8. The apparatus of claim 1, wherein the processing unit is configured to: determine whether the area surrounding the first defective sensing element includes at least one additional defective sensing element of the detector array; select a set of mask values based upon the determination of whether the area surrounding the first defective sensing element includes at least one additional defective sensing element; and apply the mask values in the calculation of the replacement pixel value, wherein the mask values determine which ones of pixel values of non-defective sensing elements adjacent to the first defective sensing element contribute to the calculation of the replacement pixel value. 9. The apparatus of claim 8, wherein applying the mask values prevents a pixel value of a first non-defective sensing element adjacent to the first defective sensing element from contributing to the calculation of the replacement pixel value. 10. The apparatus of claim 9, wherein the set of mask values is configured such that a position of the first non-defective sensing element whose pixel value is excluded is based upon a position of the at least one additional defective sensing element. 11. The apparatus of claim 1, wherein the processing unit is configured to: determine whether the area surrounding the first defective sensing element includes at least one additional defective sensing element of the detector array; and select pixel values of particular non-defective sensing elements adjacent to the first defective sensing element for use in calculating the replacement pixel value, wherein the selection of pixel values of particular non-defective sensing elements is based upon the determination of whether the area surrounding the first defective sensing element includes at least one additional defective sensing element. 12. The apparatus of claim 11, wherein the processing unit is configured to prevent a pixel value of a first non-defective sensing element adjacent to the first defective sensing element from contributing to the calculation of the replacement pixel value. 13. The apparatus of claim 12, wherein a position of the first non-defective sensing element whose pixel value is excluded is based upon a position of the at least one additional defective sensing element. 14. A method of processing image data, comprising: obtaining a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, wherein the set of weighting coefficients is configured as a two-dimensional array of (N쨌M)-1 weighting coefficients. N and M being integers, and values for N and M are chosen based upon a size of a blur spot in a plane of the detector array, the blur spot being associated with the detector array and a corresponding optical system; obtaining information identifying one or more defective sensing elements of the detector array; receiving image data from the detector array; calculating a weighted average of pixel values from sensing elements adjacent to a first defective sensing element of the detector array using at least some of the weighting coefficients; and assigning the weighted average to be a replacement pixel value for the first defective sensing element. 15. The method of claim 14, wherein the sensing elements adjacent to the first defective sensing element are located within 짹3 units of the first defective pixel in at least one of two directions, and wherein a size of one unit in a given direction is equivalent to size of one sensing element of the detector array in that direction. 16. The method of claim 15, wherein the blur spot encompasses an area at least of N쨌M units in the plane of the detector array, and wherein a size of one unit is equivalent to size of one sensing element of the detector array. 17. The method of claim 16, wherein M=3 and N=5. 18. The method of claim 14, wherein the set of weighting coefficients is generated using an empirical calculation and using calibration data of a calibration image, the calibration data being obtained with the detector array and the corresponding optical system. 19. The method of claim 18, wherein the empirical calculation for generating the weighting coefficients comprises: assigning starting values to the weighting coefficients; calculating test replacement data from the calibration data using existing values of the weighting coefficients; calculating difference data from the test replacement data and the calibration data; calculating an assessment parameter for the difference data; determining whether the assessment parameter satisfies a predetermined condition; and updating the weighting coefficients based upon the assessment parameter if the assessment does not satisfy the predetermined condition. 20. The method of claim 18, wherein calculating test replacement data comprises: selecting a pixel of the calibration data of the calibration image; summing weighted contributions of pixel values in an area of the calibration image surrounding the selected pixel using existing values of the weighting coefficients to generate a sum; assigning the sum to be a test replacement value for the selected pixel; and repeating the three immediately preceding steps for each pixel of the calibration data of the calibration image. 21. The method of claim 14, comprising: determining whether the area surrounding the first defective sensing element includes at least one additional defective sensing element of the detector array; selecting a set of mask values based upon the determination of whether the area surrounding the first defective sensing element includes at least one additional defective sensing element; and applying the mask values in the calculation of the replacement pixel value, wherein the mask values determine which ones of pixel values of non-defective sensing elements adjacent to the first defective sensing element contribute to the calculation of the replacement pixel value. 22. The method of claim 21, wherein applying the mask values prevents a pixel value of a first non-defective sensing element adjacent to the first defective sensing element from contributing to the calculation of the replacement pixel value. 23. The method of claim 22, wherein the set of mask values is configured such that a position of the first non-defective sensing element whose pixel value is excluded is based upon a position of the at least one additional defective sensing element. 24. The method of claim 14, comprising: determining whether the area surrounding the first defective sensing element includes at least one additional defective sensing elements of the detector array; and selecting pixel values of particular non-defective sensing elements adjacent to the first defective sensing element for use in calculating the replacement pixel value, wherein the selection of pixel values of particular non-defective sensing elements is based upon the determination of whether the area surrounding the first defective sensing element includes at least one additional defective sensing element. 25. The method of claim 24, comprising excluding a pixel value of a first non-defective sensing element adjacent to the first defective sensing element from contributing to the calculation of the replacement pixel value. 26. The method of claim 25, wherein a position of the first non-defective sensing element whose pixel value is excluded depends upon a position of the at least one additional defective sensing element. 27. An apparatus for processing image data, comprising: a memory; and a processing unit coupled to the memory, the processing unit being configured to: obtain a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, wherein the set of weighting coefficients is generated using an empirical calculation and using calibration data of a calibration image, the calibration image data obtained with the detector array and a corresponding optical system, obtain information identifying one or more defective sensing elements of the detector array, receive image data of an image from the detector array, calculate a weighted average of pixel values from sensing elements adjacent to a first defective sensing element of the detector array using at least some of the weighting coefficients, and assign the weighted average to be a replacement pixel value for the first defective sensing element. 28. The apparatus of claim 27, wherein the empirical calculation for generating the weighting coefficients comprises: assigning starting values to the weighting coefficients; calculating test replacement data from the calibration data using existing values of the weighting coefficients; calculating difference data from the test replacement data and the calibration data; calculating an assessment parameter for the difference data; determining whether the assessment parameter satisfies a predetermined condition; and updating the weighting coefficients based upon the assessment parameter if the assessment does not satisfy the predetermined condition. 29. The apparatus of claim 28, wherein calculating test replacement data comprises: selecting a pixel of the calibration data of the calibration image; summing weighted contributions of pixel values in an area of the calibration image surrounding the selected pixel using existing values of the weighting coefficients to generate a sum; assigning the sum to be a test replacement value for the selected pixel; and repeating the three immediately preceding steps for each pixel of the calibration data of the calibration image. 30. A method of processing image data, comprising: obtaining a set of weighting coefficients to be used in calculating replacement pixel values associated with defective sensing elements of a detector array, the set of weighting coefficients including at least one negative weighting coefficient, wherein the set of weighting coefficients is generated using an empirical calculation and using calibration data of a calibration image, the calibration data being obtained with the detector array and a corresponding optical system; obtaining information identifying one or more defective sensing elements of the detector array; receiving image data from the detector array; calculating a weighted average of pixel values from sensing elements adjacent to a first defective sensing element of the detector array using at least some of the weighting coefficients; and assigning the weighted average to be a replacement pixel value for the first defective sensing element. 31. The method of claim 30, wherein the empirical calculation for generating the weighting coefficients comprises: assigning starting values to the weighting coefficients; calculating test replacement data from the calibration data using existing values of the weighting coefficients; calculating difference data from the test replacement data and the calibration data; calculating an assessment parameter for the difference data; determining whether the assessment parameter satisfies a predetermined condition; and updating the weighting coefficients based upon the assessment parameter if the assessment does not satisfy the predetermined condition. 32. The method of claim 31, wherein calculating test replacement data comprises: selecting a pixel of the calibration data of the calibration image; summing weighted contributions of pixel values in an area of the calibration image surrounding the selected pixel using existing values of the weighting coefficients to generate a sum; assigning the sum to be a test replacement value for the selected pixel; and repeating the three immediately preceding steps for each pixel of the calibration data of the calibration image.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.