Method of encapsulating packaged microelectronic devices with a barrier
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01L-021/48
H01L-021/02
H01L-023/48
H05K-003/30
출원번호
US-0516455
(2006-09-05)
등록번호
US-7332376
(2008-02-19)
발명자
/ 주소
Cobbley,Chad A.
출원인 / 주소
Micron Technology, Inc.
대리인 / 주소
Perkins Coie LLP
인용정보
피인용 횟수 :
0인용 특허 :
157
초록▼
Methods and apparatuses for encapsulating a microelectronic die or other components in the fabrication of packaged microelectronic devices. In one aspect of the invention, a packaged microelectronic device assembly includes a microelectronic die, a substrate attached to the die, a protective casing
Methods and apparatuses for encapsulating a microelectronic die or other components in the fabrication of packaged microelectronic devices. In one aspect of the invention, a packaged microelectronic device assembly includes a microelectronic die, a substrate attached to the die, a protective casing covering a portion of the substrate, and a barrier projecting away from the surface of the substrate. The microelectronic die can have an integrated circuit and a plurality of bond-pads operatively coupled to the integrated circuit. The substrate can have a cap-zone defined by an area that is to be covered by the protective casing, a plurality of contact elements arranged in the cap-zone, a plurality of ball-pads arranged in a ball-pad array outside of the cap-zone, and a plurality of conductive lines coupling the contact elements to the ball-pads. The contact elements are electrically coupled to corresponding bond-pads on the microelectronic die, and the protective casing covers the cap-zone. The barrier on the surface of the substrate is configured so that at least a portion of the barrier is outside of the cap-zone and adjacent to at least a portion of the molded section. The barrier is a seal that inhibits the thermosetting material of the protective casing from covering a portion of the substrate outside of the cap-zone. As such, the barrier prevents thermosetting material from leaking between the substrate and a mold outside of the cap-zone during a molding process.
대표청구항▼
The invention claimed is: 1. A method of partially encapsulating a microelectronic device, comprising: coupling a die to a substrate, wherein the substrate comprises an encapsulation area; disposing a seal on a first side of the substrate, wherein at least a portion of the seal is positioned adjace
The invention claimed is: 1. A method of partially encapsulating a microelectronic device, comprising: coupling a die to a substrate, wherein the substrate comprises an encapsulation area; disposing a seal on a first side of the substrate, wherein at least a portion of the seal is positioned adjacent to the encapsulation area; engaging the seal with one or more mold units after disposing the seal on the first side of the substrate; introducing a molding compound into the one or more mold units; and removing the seal from the substrate after introducing the molding compound into the one or more mold units. 2. The method of claim 1 wherein: the seal comprises a tape, and engaging the seal with one or more mold units comprises contacting a first surface of a first mold unit with the seal and contacting a second surface of a second mold unit with a second side of the substrate; and introducing the molding compound into the one or more mold units comprises injecting the molding compound into at least the second mold unit. 3. The method of claim 1 wherein: the substrate further comprises a second side attached to the die, a slot in the substrate defining a slot area that is smaller than the encapsulation area and positioned inside the encapsulation area, a contact positioned on the first side of the substrate and located inside the encapsulation area adjacent to an edge of the slot, the contact being in electrical communication with a pad positioned on the first side of the substrate outside of the encapsulation area; and the encapsulation area further comprises a perimeter on the first side of the substrate between the contact and the pad. 4. The method of claim 3 wherein disposing the seal on the substrate further comprises covering the pad with the seal and the molding compound is introduced while the seal covers the pad. 5. The method of claim 1, further comprising: positioning the first side of the substrate in a first cavity of a first mold unit; positioning the die in a second cavity of a second mold unit; and injecting the molding compound into the second cavity through a portion of the substrate and into the first cavity, wherein the molding compound forms a protective casing over the encapsulation area and the die. 6. The method of claim 1 wherein disposing the seal on the first side of the substrate comprises applying a removable seal to the first side of the substrate. 7. The method of claim 1, wherein the seal has an opening and the method further comprises inhibiting the molding material from leaking out beyond a perimeter of the opening with the seal. 8. A method of disposing a flowable material on a microelectronic device, the method comprising: positioning a die proximate to a substrate, wherein the die and substrate are in electrical communication with each other, and wherein the substrate comprises a contact and a pad spaced apart from the contact; attaching a barrier to the surface of the substrate, wherein the barrier comprises an opening defining a cap-zone, wherein the barrier at least partially covers the pad, and wherein the contact is positioned inside the cap-zone; disposing the flowable material on at least a portion of the cap-zone; and removing the barrier from the substrate after disposing the flowable material on at least a portion of the cap-zone. 9. The method of claim 8 wherein positioning the die proximate to the substrate comprises attaching the die proximate to an opening in the substrate, the opening being at least as small as the cap-zone. 10. The method of claim 8 wherein attaching the barrier to the surface of the substrate comprises forming a raised surface of the substrate. 11. The method of claim 8, further comprising: positioning the substrate and the die in a mold unit; contacting a first mold surface with the barrier on a first side of the substrate and contacting a second mold surface with a second side of the substrate; and injecting the flowable material into the mold unit. 12. The method of claim 8 wherein attaching the barrier to the surface of the substrate comprises disposing a releasable barrier on the surface of the substrate. 13. The method of claim 8, further comprising inhibiting the flowable material from leaking out of the cap-zone with the barrier. 14. A method for constructing a microelectronic device, the method comprising: electrically coupling a die to a substrate, wherein the substrate comprises a plurality of contacts and a pad on a first side of the substrate, wherein the contacts define a cap-zone, wherein the pad is spaced apart from the cap-zone, and wherein the die is positioned on a second side of the substrate proximate to a slot in the substrate; disposing a first gasket on the first side of the substrate, wherein the gasket is positioned at least partially adjacent to the cap-zone; positioning the die and substrate in a mold assembly after disposing the first gasket on the first side of the substrate; injecting a molding compound into the mold assembly; and removing the first gasket from the first side of the substrate after injecting the molding compound into the mold assembly. 15. The method of claim 14 wherein: positioning the die and substrate in the mold assembly comprises placing the substrate in a first cavity of the mold assembly and placing the die in a second cavity of the mold assembly; and injecting the molding compound into the mold assembly comprises (a) flowing the molding compound into the second cavity through the slot in the substrate, and (b) forming a first protective casing over the contacts of the substrate and a second protective casing over the die on the second side of the substrate. 16. The method of claim 14, further comprising inhibiting the molding compound from leaking out of the cap-zone with the first gasket. 17. The method of claim 16 wherein inhibiting the molding compound from leaking comprises engaging the first gasket with a bearing surface of the mold assembly. 18. The method of claim 14, further comprising disposing a second gasket on the second surface of the substrate, wherein the second gasket at least partially surrounds the die. 19. The method of claim 18, further comprising engaging the first gasket with a first bearing surface of the mold assembly and engaging the second gasket with a second bearing surface of the mold assembly. 20. The method of claim 14 wherein disposing the first gasket on the first side of the substrate comprises attaching a gasket having an aperture generally aligned with the pad of the substrate. 21. The method of claim 14 wherein disposing the first gasket on the first side of the substrate comprises applying a removable gasket to the first side of the substrate. 22. The method of claim 14 wherein disposing the first gasket on the first side of the substrate comprises applying at least one of a pliable thin tape, thin film, or polymeric coating to the first side of the substrate.
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